{"id":"https://openalex.org/W2596144470","doi":"https://doi.org/10.1117/12.2268596","title":"The automated testing facility based on machine vision for optimizing grain quality control technology","display_name":"The automated testing facility based on machine vision for optimizing grain quality control technology","publication_year":2017,"publication_date":"2017-03-17","ids":{"openalex":"https://openalex.org/W2596144470","doi":"https://doi.org/10.1117/12.2268596","mag":"2596144470"},"language":"en","primary_location":{"id":"doi:10.1117/12.2268596","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2268596","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017779212","display_name":"A. Panchenko","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. V. Panchenko","raw_affiliation_strings":["JSC Cognitive (Russian Federation)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JSC Cognitive (Russian Federation)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065493299","display_name":"N. V. Reshetnyak","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. V. Reshetnyak","raw_affiliation_strings":["JSC Cognitive (Russian Federation)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JSC Cognitive (Russian Federation)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051988462","display_name":"A. M. Samohin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. M. Samohin","raw_affiliation_strings":["JSC Cognitive (Russian Federation)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JSC Cognitive (Russian Federation)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104753872","display_name":"V. V. Postnikov","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V. V. Postnikov","raw_affiliation_strings":["JSC Cognitive (Russian Federation)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JSC Cognitive (Russian Federation)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1462,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.48634851,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"10341","issue":null,"first_page":"103411Q","last_page":"103411Q"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13890","display_name":"Remote Sensing and Land Use","score":0.9769999980926514,"subfield":{"id":"https://openalex.org/subfields/1902","display_name":"Atmospheric Science"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.614065408706665},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.5990554690361023},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5949681997299194},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4784945845603943},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38752394914627075},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3790420889854431},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3465791344642639},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2021152675151825}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.614065408706665},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.5990554690361023},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5949681997299194},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4784945845603943},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38752394914627075},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3790420889854431},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3465791344642639},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2021152675151825},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2268596","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2268596","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1910657905","https://openalex.org/W1979073489","https://openalex.org/W2060585092","https://openalex.org/W2133388206","https://openalex.org/W2340897893","https://openalex.org/W2499135951","https://openalex.org/W6639780620"],"related_works":["https://openalex.org/W2384667405","https://openalex.org/W2389266787","https://openalex.org/W2363885542","https://openalex.org/W2387206255","https://openalex.org/W2355570285","https://openalex.org/W2364958354","https://openalex.org/W2352797113","https://openalex.org/W2372137583","https://openalex.org/W2374872591","https://openalex.org/W1548050717"],"abstract_inverted_index":{"The":[0,34],"article":[1],"provides":[2],"a":[3],"description":[4,35],"of":[5,13,28,36,42],"simulation":[6],"stand":[7],"construction":[8],"and":[9,45],"software":[10,32],"for":[11,40],"validation":[12],"grain":[14],"quality":[15,48],"analysis":[16],"technology":[17],"in":[18],"combine":[19],"harvest\u2019s":[20],"tank":[21],"while":[22],"harvesting":[23],"process":[24],"with":[25],"the":[26],"help":[27],"artificial":[29],"vision-based":[30],"hardware":[31],"complex.":[33],"training":[37],"sample":[38],"preparation":[39],"automation":[41],"sensors":[43],"development":[44],"testing":[46],"facility":[47],"control":[49],"are":[50],"provided.":[51]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}