{"id":"https://openalex.org/W2593226005","doi":"https://doi.org/10.1117/12.2254244","title":"View-interpolation of sparsely sampled sinogram using convolutional neural network","display_name":"View-interpolation of sparsely sampled sinogram using convolutional neural network","publication_year":2017,"publication_date":"2017-02-24","ids":{"openalex":"https://openalex.org/W2593226005","doi":"https://doi.org/10.1117/12.2254244","mag":"2593226005"},"language":"en","primary_location":{"id":"doi:10.1117/12.2254244","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2254244","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040581340","display_name":"Hoyeon Lee","orcid":"https://orcid.org/0000-0002-1165-1509"},"institutions":[{"id":"https://openalex.org/I58716616","display_name":"Korea Institute of Science and Technology","ror":"https://ror.org/05kzfa883","country_code":"KR","type":"facility","lineage":["https://openalex.org/I27494661","https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098","https://openalex.org/I58716616"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoyeon Lee","raw_affiliation_strings":["Korea Institute of Science and Technology (Korea, Republic of)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Science and Technology (Korea, Republic of)","institution_ids":["https://openalex.org/I58716616"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100724655","display_name":"Jongha Lee","orcid":"https://orcid.org/0000-0002-1568-6733"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I58716616","display_name":"Korea Institute of Science and Technology","ror":"https://ror.org/05kzfa883","country_code":"KR","type":"facility","lineage":["https://openalex.org/I27494661","https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098","https://openalex.org/I58716616"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongha Lee","raw_affiliation_strings":["Korea Institute of Science and Technology (Korea, Republic of)","SAMSUNG Electronics Co., Ltd. (Korea, Republic of)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Science and Technology (Korea, Republic of)","institution_ids":["https://openalex.org/I58716616"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050693134","display_name":"Suengryong Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I58716616","display_name":"Korea Institute of Science and Technology","ror":"https://ror.org/05kzfa883","country_code":"KR","type":"facility","lineage":["https://openalex.org/I27494661","https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098","https://openalex.org/I58716616"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Suengryong Cho","raw_affiliation_strings":["Korea Institute of Science and Technology (Korea, Republic of)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Science and Technology (Korea, Republic of)","institution_ids":["https://openalex.org/I58716616"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.4838,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.9613237,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"10133","issue":null,"first_page":"1013328","last_page":"1013328"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10378","display_name":"Advanced MRI Techniques and Applications","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.7763504981994629},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.7425726652145386},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7237679958343506},{"id":"https://openalex.org/keywords/streak","display_name":"Streak","score":0.7074003219604492},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6437551975250244},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6291922926902771},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.5569100379943848},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5436306595802307},{"id":"https://openalex.org/keywords/artifact","display_name":"Artifact (error)","score":0.4722140431404114},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4425325095653534},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.44003403186798096},{"id":"https://openalex.org/keywords/missing-data","display_name":"Missing data","score":0.4157339334487915},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3571082651615143},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.34988778829574585},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2942114472389221}],"concepts":[{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.7763504981994629},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.7425726652145386},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7237679958343506},{"id":"https://openalex.org/C65185188","wikidata":"https://www.wikidata.org/wiki/Q107775","display_name":"Streak","level":2,"score":0.7074003219604492},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6437551975250244},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6291922926902771},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5569100379943848},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5436306595802307},{"id":"https://openalex.org/C2779010991","wikidata":"https://www.wikidata.org/wiki/Q2720909","display_name":"Artifact (error)","level":2,"score":0.4722140431404114},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4425325095653534},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.44003403186798096},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.4157339334487915},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3571082651615143},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.34988778829574585},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2942114472389221},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/12.2254244","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2254244","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:hub.hku.hk:10722/345803","is_oa":false,"landing_page_url":"https://hub.hku.hk/handle/10722/345803","pdf_url":null,"source":{"id":"https://openalex.org/S4377196271","display_name":"The HKU Scholars Hub (University of Hong Kong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I889458895","host_organization_name":"University of Hong Kong","host_organization_lineage":["https://openalex.org/I889458895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference_Paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1538131130","https://openalex.org/W1632571000","https://openalex.org/W1985008727","https://openalex.org/W1997150272","https://openalex.org/W1999320095","https://openalex.org/W2056522932","https://openalex.org/W2102353889","https://openalex.org/W2143129785","https://openalex.org/W2144354855","https://openalex.org/W2157812230","https://openalex.org/W2159530892","https://openalex.org/W2214802144","https://openalex.org/W2242218935","https://openalex.org/W2950094539","https://openalex.org/W2963108253","https://openalex.org/W6632100814","https://openalex.org/W6636549106","https://openalex.org/W6650222471","https://openalex.org/W6676719534","https://openalex.org/W6683256255","https://openalex.org/W6688459880","https://openalex.org/W6690498163","https://openalex.org/W6764076272"],"related_works":["https://openalex.org/W2082818786","https://openalex.org/W2000740899","https://openalex.org/W2371834895","https://openalex.org/W2997637732","https://openalex.org/W2381571063","https://openalex.org/W2090450991","https://openalex.org/W213647845","https://openalex.org/W2047678803","https://openalex.org/W3192071649","https://openalex.org/W2896778670"],"abstract_inverted_index":{"Spare-view":[0],"sampling":[1],"and":[2,81,118],"its":[3,120],"associated":[4],"iterative":[5,32],"image":[6,33,39,85],"reconstruction":[7,89],"in":[8,25,48,55,76],"computed":[9],"tomography":[10],"have":[11],"actively":[12],"investigated.":[13],"Sparse-view":[14],"CT":[15,27,50,66],"technique":[16],"is":[17,51,105],"a":[18],"viable":[19],"option":[20],"to":[21,74,113],"low-dose":[22],"CT,":[23],"particularly":[24],"cone-beam":[26],"(CBCT)":[28],"applications,":[29],"with":[30,35,122],"advanced":[31],"reconstructions":[34],"varying":[36],"degrees":[37],"of":[38,42,70,107],"artifacts.":[40],"One":[41],"the":[43,52,56,71,77,84,108,123],"artifacts":[44],"that":[45,82],"may":[46],"occur":[47],"sparse-view":[49,65],"streak":[53],"artifact":[54],"reconstructed":[57],"images.":[58],"Another":[59],"approach":[60],"has":[61],"been":[62],"investigated":[63],"for":[64],"imaging":[67],"by":[68,86],"use":[69],"interpolation":[72,97,125],"methods":[73],"fill":[75],"missing":[78,115],"view":[79],"data":[80,117],"reconstructs":[83],"an":[87,96],"analytic":[88],"algorithm.":[90],"In":[91],"this":[92],"study,":[93],"we":[94],"developed":[95],"method":[98],"using":[99],"convolutional":[100],"neural":[101],"network":[102],"(CNN),":[103],"which":[104],"one":[106],"widely":[109],"used":[110],"deep-learning":[111],"methods,":[112],"find":[114],"projection":[116],"compared":[119],"performances":[121],"other":[124],"techniques.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}