{"id":"https://openalex.org/W2056694574","doi":"https://doi.org/10.1117/12.2083522","title":"MFP scanner motion characterization using self-printed target","display_name":"MFP scanner motion characterization using self-printed target","publication_year":2015,"publication_date":"2015-02-08","ids":{"openalex":"https://openalex.org/W2056694574","doi":"https://doi.org/10.1117/12.2083522","mag":"2056694574"},"language":"en","primary_location":{"id":"doi:10.1117/12.2083522","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2083522","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081315594","display_name":"Minwoong Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Minwoong Kim","raw_affiliation_strings":["Purdue Univ. (United States)","#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Purdue Univ. (United States)","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034794728","display_name":"P\u00e9ter Bauer","orcid":"https://orcid.org/0000-0002-1925-2270"},"institutions":[{"id":"https://openalex.org/I1324840837","display_name":"Hewlett-Packard (United States)","ror":"https://ror.org/059rn9488","country_code":"US","type":"company","lineage":["https://openalex.org/I1324840837"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Bauer","raw_affiliation_strings":["Hewlett-Packard Co. (United States)","Hewlett Packard Co. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hewlett-Packard Co. (United States)","institution_ids":["https://openalex.org/I1324840837"]},{"raw_affiliation_string":"Hewlett Packard Co. (United States)","institution_ids":["https://openalex.org/I1324840837"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008202403","display_name":"Jerry Wagner","orcid":null},"institutions":[{"id":"https://openalex.org/I1324840837","display_name":"Hewlett-Packard (United States)","ror":"https://ror.org/059rn9488","country_code":"US","type":"company","lineage":["https://openalex.org/I1324840837"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerry K. Wagner","raw_affiliation_strings":["Hewlett-Packard Co. (United States)","Hewlett Packard Co. (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hewlett-Packard Co. (United States)","institution_ids":["https://openalex.org/I1324840837"]},{"raw_affiliation_string":"Hewlett Packard Co. (United States)","institution_ids":["https://openalex.org/I1324840837"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043967979","display_name":"Jan P. Allebach","orcid":"https://orcid.org/0000-0001-5608-8249"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jan P. Allebach","raw_affiliation_strings":["Purdue Univ. (United States)","#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Purdue Univ. (United States)","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.07238958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9396","issue":null,"first_page":"93960E","last_page":"93960E"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.9355568289756775},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6871346235275269},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5943080186843872},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5519718527793884},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.47702810168266296},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.4471891522407532},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35028204321861267},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12165012955665588}],"concepts":[{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.9355568289756775},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6871346235275269},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5943080186843872},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5519718527793884},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47702810168266296},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.4471891522407532},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35028204321861267},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12165012955665588},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2083522","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2083522","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W11446212","https://openalex.org/W1480244204","https://openalex.org/W1518749440","https://openalex.org/W1523072706","https://openalex.org/W1544689225","https://openalex.org/W1573769812","https://openalex.org/W1644084797","https://openalex.org/W1667165204","https://openalex.org/W1766888123","https://openalex.org/W2033819227","https://openalex.org/W2064812869","https://openalex.org/W2124113125","https://openalex.org/W2133003941","https://openalex.org/W2315497980","https://openalex.org/W2557267102","https://openalex.org/W2574533260","https://openalex.org/W2764466240","https://openalex.org/W2942228371","https://openalex.org/W4285719527","https://openalex.org/W4377822677","https://openalex.org/W4377942888","https://openalex.org/W4378378649","https://openalex.org/W6606349802","https://openalex.org/W6631231991","https://openalex.org/W6634245652","https://openalex.org/W6666805981","https://openalex.org/W6721340203","https://openalex.org/W6721706321"],"related_works":["https://openalex.org/W4232857084","https://openalex.org/W4245233074","https://openalex.org/W2167384162","https://openalex.org/W4402492658","https://openalex.org/W1517555227","https://openalex.org/W2653993779","https://openalex.org/W2911295078","https://openalex.org/W762151464","https://openalex.org/W2001485867","https://openalex.org/W2389610024"],"abstract_inverted_index":{"Multifunctional":[0],"printers":[1],"(MFP)":[2],"are":[3,76,115],"products":[4,34],"that":[5],"combine":[6],"the":[7,43,49,63,88,100,104,108,119,132,139,146,150,153,158,170,173,184],"functions":[8],"of":[9,51,62,68,131,169,172],"a":[10,203],"printer,":[11],"scanner,":[12],"and":[13,72,95,111,121,162,175,196],"copier.":[14],"Our":[15],"goal":[16],"is":[17,85,126,134,142],"to":[18,21,24,59,86,99],"help":[19],"customers":[20],"be":[22,56],"able":[23],"easily":[25],"diagnose":[26],"scanner":[27,52,89,96,185],"or":[28,186],"print":[29,163,176],"quality":[30],"issues":[31],"with":[32],"their":[33,180],"by":[35,136,198],"developing":[36],"an":[37],"automated":[38],"diagnostic":[39,74,155],"system":[40],"embedded":[41],"in":[42,78,117,145,183],"product.":[44],"We":[45,190],"specifically":[46],"focus":[47],"on":[48],"characterization":[50],"motions,":[53],"which":[54],"may":[55],"defective":[57],"due":[58],"irregular":[60],"movements":[61],"scan-head.":[64],"The":[65,81],"novel":[66],"design":[67,195],"our":[69,192],"test":[70,193],"page":[71,194],"two-stage":[73],"algorithm":[75],"described":[77,154],"this":[79],"paper.":[80],"most":[82],"challenging":[83],"issue":[84],"evaluate":[87],"performance":[90],"properly":[91],"when":[92],"both":[93,118],"printer":[94,187],"units":[97],"contribute":[98],"motion":[101,113,188],"errors.":[102],"In":[103],"first":[105],"stage":[106,148],"called":[107,149],"uncorrected-print-error-stage,":[109],"aperiodic":[110],"periodic":[112],"behaviors":[114],"characterized":[116],"spatial":[120],"frequency":[122],"domains.":[123],"Since":[124],"it":[125],"not":[127],"clear":[128],"how":[129],"much":[130],"error":[133,161,164],"contributed":[135],"each":[137],"unit,":[138],"scanned":[140],"input":[141],"statistically":[143],"analyzed":[144],"second":[147],"corrected-print-error-stage.":[151],"Finally,":[152],"algorithms":[156],"output":[157],"estimated":[159],"scan":[160,174],"separately":[165],"as":[166],"RMS":[167],"values":[168],"displacement":[171],"lines,":[177],"respectively,":[178],"from":[179,202],"nominal":[181],"positions":[182],"direction.":[189],"validate":[191],"approaches":[197],"ground":[199],"truth":[200],"obtained":[201],"high-precision,":[204],"chrome-on-glass":[205],"reticle":[206],"manufactured":[207],"using":[208],"semiconductor":[209],"chip":[210],"fabrication":[211],"technologies.":[212]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}