{"id":"https://openalex.org/W2056854573","doi":"https://doi.org/10.1117/12.2049795","title":"A defects detection system for the surfaces of stampings","display_name":"A defects detection system for the surfaces of stampings","publication_year":2013,"publication_date":"2013-12-24","ids":{"openalex":"https://openalex.org/W2056854573","doi":"https://doi.org/10.1117/12.2049795","mag":"2056854573"},"language":"en","primary_location":{"id":"doi:10.1117/12.2049795","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2049795","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013892734","display_name":"Baowen Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Baowen Chen","raw_affiliation_strings":["Shenzhen Institute of Information Technology (China)"],"affiliations":[{"raw_affiliation_string":"Shenzhen Institute of Information Technology (China)","institution_ids":["https://openalex.org/I158809036"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011671643","display_name":"Jun Jiang","orcid":"https://orcid.org/0000-0003-1147-3666"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I4210145761","display_name":"Shenzhen Institutes of Advanced Technology","ror":"https://ror.org/04gh4er46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210145761"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Jiang","raw_affiliation_strings":["Shenzhen Institute of Advanced Technology (China)","The Chinese Univ. of Hong Kong (China)","The Shenzhen Key Lab. of Computer Vision and Pattern Recognition (China)"],"affiliations":[{"raw_affiliation_string":"Shenzhen Institute of Advanced Technology (China)","institution_ids":["https://openalex.org/I4210145761"]},{"raw_affiliation_string":"The Chinese Univ. of Hong Kong (China)","institution_ids":["https://openalex.org/I177725633"]},{"raw_affiliation_string":"The Shenzhen Key Lab. of Computer Vision and Pattern Recognition (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101705358","display_name":"Jun Cheng","orcid":"https://orcid.org/0000-0002-3131-3275"},"institutions":[{"id":"https://openalex.org/I4210145761","display_name":"Shenzhen Institutes of Advanced Technology","ror":"https://ror.org/04gh4er46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210145761"]},{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I4210142539","display_name":"Guangdong Institute of Intelligent Manufacturing","ror":"https://ror.org/049jpjz09","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210142539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Cheng","raw_affiliation_strings":["Guangdong Provincial Key Lab. of Robotics and Intelligent System (China)","Shenzhen Institute of Advanced Technology (China)","The Chinese Univ. of Hong Kong (China)"],"affiliations":[{"raw_affiliation_string":"Guangdong Provincial Key Lab. of Robotics and Intelligent System (China)","institution_ids":["https://openalex.org/I4210142539"]},{"raw_affiliation_string":"Shenzhen Institute of Advanced Technology (China)","institution_ids":["https://openalex.org/I4210145761"]},{"raw_affiliation_string":"The Chinese Univ. of Hong Kong (China)","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030667096","display_name":"Sanming Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I4210145761","display_name":"Shenzhen Institutes of Advanced Technology","ror":"https://ror.org/04gh4er46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210145761"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sanming Shen","raw_affiliation_strings":["Shenzhen Institutes of Advanced Technology (China)","The Chinese Univ. of Hong Kong (China)"],"affiliations":[{"raw_affiliation_string":"Shenzhen Institutes of Advanced Technology (China)","institution_ids":["https://openalex.org/I4210145761"]},{"raw_affiliation_string":"The Chinese Univ. of Hong Kong (China)","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5013892734"],"corresponding_institution_ids":["https://openalex.org/I158809036"],"apc_list":null,"apc_paid":null,"fwci":0.6896,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.76389941,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"9067","issue":null,"first_page":"906708","last_page":"906708"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/punching","display_name":"Punching","score":0.8234070539474487},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.744219958782196},{"id":"https://openalex.org/keywords/scratch","display_name":"Scratch","score":0.6811603307723999},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.6342104077339172},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5516847968101501},{"id":"https://openalex.org/keywords/orientation","display_name":"Orientation (vector space)","score":0.5229816436767578},{"id":"https://openalex.org/keywords/bar","display_name":"Bar (unit)","score":0.4601266086101532},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.453311949968338},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.42681753635406494},{"id":"https://openalex.org/keywords/stamping","display_name":"Stamping","score":0.4195689857006073},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39509087800979614},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3948878049850464},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32123059034347534},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.09152907133102417}],"concepts":[{"id":"https://openalex.org/C2778527123","wikidata":"https://www.wikidata.org/wiki/Q11750728","display_name":"Punching","level":2,"score":0.8234070539474487},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.744219958782196},{"id":"https://openalex.org/C2781235140","wikidata":"https://www.wikidata.org/wiki/Q275131","display_name":"Scratch","level":2,"score":0.6811603307723999},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.6342104077339172},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5516847968101501},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.5229816436767578},{"id":"https://openalex.org/C188721877","wikidata":"https://www.wikidata.org/wiki/Q103510","display_name":"Bar (unit)","level":2,"score":0.4601266086101532},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.453311949968338},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.42681753635406494},{"id":"https://openalex.org/C144444463","wikidata":"https://www.wikidata.org/wiki/Q9363879","display_name":"Stamping","level":2,"score":0.4195689857006073},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39509087800979614},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3948878049850464},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32123059034347534},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09152907133102417},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2049795","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2049795","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1935585162","https://openalex.org/W1977993828","https://openalex.org/W2039367092","https://openalex.org/W2151765289","https://openalex.org/W6640448425","https://openalex.org/W6644987901","https://openalex.org/W6682926373"],"related_works":["https://openalex.org/W1977513424","https://openalex.org/W2376869130","https://openalex.org/W2353512895","https://openalex.org/W4210929868","https://openalex.org/W2786443194","https://openalex.org/W2605747258","https://openalex.org/W2380340096","https://openalex.org/W2087758605","https://openalex.org/W2373566840","https://openalex.org/W4389230400"],"abstract_inverted_index":{"Detecting":[0],"defects":[1,25,52,95,112,127],"on":[2,26,53],"the":[3,12,54,68,72,79,85,91,94,100,104,108,111,119,122,126,144,151,154],"surfaces":[4,55],"of":[5,56,60,93,103,110,121,143,153],"stampings":[6],"plays":[7],"a":[8,46,141],"critical":[9],"role":[10],"in":[11,99],"manufacturing":[13],"process.":[14],"Many":[15],"methods":[16,30],"have":[17],"been":[18],"proposed":[19,138,155],"to":[20,66,84],"detect":[21],"and":[22,38,96,116,118,134],"identify":[23],"simple":[24,132],"stampings.":[27,57],"However,":[28],"these":[29],"suffer":[31],"from":[32,71],"large":[33],"system":[34,49,139],"size,":[35],"high":[36],"cost,":[37],"low":[39],"speed":[40],"for":[41,50],"inspection.":[42],"This":[43,75],"paper":[44],"proposes":[45],"new":[47],"visual":[48],"detecting":[51],"A":[58],"set":[59],"LED":[61],"bar":[62],"lights":[63],"are":[64,82],"used":[65],"illuminate":[67],"stamping":[69],"surface":[70],"four":[73],"sides.":[74],"can":[76,89,128],"ensure":[77],"that":[78],"irradiation":[80],"directions":[81],"parallel":[83],"surface.":[86],"Thus,":[87],"it":[88],"enhance":[90],"imaging":[92],"punching":[97,123],"edges":[98],"vertical":[101],"orientation":[102],"surface,":[105],"which":[106],"facilitates":[107],"location":[109],"such":[113],"as":[114],"scratch":[115],"pitting":[117],"measurement":[120],"sizes.":[124],"Thereby,":[125],"be":[129],"classified":[130],"using":[131],"shape":[133],"dimension":[135],"analysis.":[136],"The":[137],"is":[140],"part":[142],"automated":[145],"sorting":[146],"system.":[147,156],"Practical":[148],"operations":[149],"verify":[150],"effectiveness":[152]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}