{"id":"https://openalex.org/W1965621499","doi":"https://doi.org/10.1117/12.2030572","title":"Remote sensing image quality assessment based on fractal theory","display_name":"Remote sensing image quality assessment based on fractal theory","publication_year":2013,"publication_date":"2013-07-19","ids":{"openalex":"https://openalex.org/W1965621499","doi":"https://doi.org/10.1117/12.2030572","mag":"1965621499"},"language":"en","primary_location":{"id":"doi:10.1117/12.2030572","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2030572","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091137364","display_name":"Congli Li","orcid":"https://orcid.org/0009-0007-5017-0277"},"institutions":[{"id":"https://openalex.org/I4210110116","display_name":"Institute of Applied Technology","ror":"https://ror.org/01yy74248","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210110116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congli Li","raw_affiliation_strings":["New Star Research Institute of Applied Technology (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Star Research Institute of Applied Technology (China)","institution_ids":["https://openalex.org/I4210110116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104033698","display_name":"Wenjun Lu","orcid":"https://orcid.org/0009-0000-4123-2076"},"institutions":[{"id":"https://openalex.org/I4210110116","display_name":"Institute of Applied Technology","ror":"https://ror.org/01yy74248","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210110116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjun Lu","raw_affiliation_strings":["New Star Research Institute of Applied Technology (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Star Research Institute of Applied Technology (China)","institution_ids":["https://openalex.org/I4210110116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101430261","display_name":"Song Xue","orcid":"https://orcid.org/0000-0001-8910-7290"},"institutions":[{"id":"https://openalex.org/I4210110116","display_name":"Institute of Applied Technology","ror":"https://ror.org/01yy74248","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210110116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Song Xue","raw_affiliation_strings":["New Star Research Institute of Applied Technology (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Star Research Institute of Applied Technology (China)","institution_ids":["https://openalex.org/I4210110116"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003909922","display_name":"Yongchang Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110116","display_name":"Institute of Applied Technology","ror":"https://ror.org/01yy74248","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210110116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongchang Shi","raw_affiliation_strings":["New Star Research Institute of Applied Technology (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Star Research Institute of Applied Technology (China)","institution_ids":["https://openalex.org/I4210110116"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210110116"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"8878","issue":null,"first_page":"88780Z","last_page":"88780Z"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13771","display_name":"Advanced Research in Science and Engineering","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2611","display_name":"Modeling and Simulation"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13771","display_name":"Advanced Research in Science and Engineering","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2611","display_name":"Modeling and Simulation"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9581999778747559,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13890","display_name":"Remote Sensing and Land Use","score":0.9544000029563904,"subfield":{"id":"https://openalex.org/subfields/1902","display_name":"Atmospheric Science"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fractal-dimension","display_name":"Fractal dimension","score":0.7312062978744507},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.7283165454864502},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.7031745910644531},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6240856647491455},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6047347784042358},{"id":"https://openalex.org/keywords/fractal-analysis","display_name":"Fractal analysis","score":0.5804734826087952},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5776861310005188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5756786465644836},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5733513832092285},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5048378109931946},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.5001144409179688},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.4756838083267212},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.4355204999446869},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3878893554210663},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3540222942829132},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.34180089831352234},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3064194321632385}],"concepts":[{"id":"https://openalex.org/C26546657","wikidata":"https://www.wikidata.org/wiki/Q1412452","display_name":"Fractal dimension","level":3,"score":0.7312062978744507},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.7283165454864502},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.7031745910644531},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6240856647491455},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6047347784042358},{"id":"https://openalex.org/C162494671","wikidata":"https://www.wikidata.org/wiki/Q2845227","display_name":"Fractal analysis","level":4,"score":0.5804734826087952},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5776861310005188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5756786465644836},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5733513832092285},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5048378109931946},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.5001144409179688},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.4756838083267212},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.4355204999446869},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3878893554210663},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3540222942829132},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.34180089831352234},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3064194321632385},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2030572","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2030572","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2394117909","https://openalex.org/W2896054214","https://openalex.org/W2355197944","https://openalex.org/W2017118246","https://openalex.org/W2354661593","https://openalex.org/W2382240109","https://openalex.org/W2368475191","https://openalex.org/W2391311021","https://openalex.org/W2389188284","https://openalex.org/W1968412567"],"abstract_inverted_index":{"Consistency":[0],"by":[1],"means":[2],"of":[3,7,20,33,43,59,64,69],"image":[4,21,38,50,71],"fractal":[5,10,18],"dimension":[6,11],"the":[8,34,37,40,44,48,57,65],"surface":[9],"is":[12],"designed":[13],"and":[14,31,61],"implemented":[15],"based":[16,28],"on":[17,29],"theory":[19],"quality":[22,41,51],"assessment":[23],"method.":[24,53],"Classic":[25],"SSIM":[26],"algorithm":[27],"research":[30],"analysis":[32],"factors":[35],"affecting":[36],"quality,":[39],"factor":[42],"fractal,":[45],"built":[46],"for":[47],"blurred":[49],"evaluation":[52,63,68],"Experiments":[54],"show":[55],"that":[56],"method":[58],"subjective":[60],"objective":[62],"relevance,":[66],"scientific":[67],"fuzzy":[70],"quality.":[72]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}