{"id":"https://openalex.org/W2079440935","doi":"https://doi.org/10.1117/12.2012829","title":"Segmentation of materials images using 3D electron interaction modeling","display_name":"Segmentation of materials images using 3D electron interaction modeling","publication_year":2013,"publication_date":"2013-02-26","ids":{"openalex":"https://openalex.org/W2079440935","doi":"https://doi.org/10.1117/12.2012829","mag":"2079440935"},"language":"en","primary_location":{"id":"doi:10.1117/12.2012829","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2012829","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101661144","display_name":"Dae Woo Kim","orcid":"https://orcid.org/0009-0001-3084-8497"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dae Woo Kim","raw_affiliation_strings":["Purdue Univ. (United States)","#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#"],"affiliations":[{"raw_affiliation_string":"Purdue Univ. (United States)","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012730921","display_name":"Mary L. Comer","orcid":"https://orcid.org/0000-0001-8935-1365"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mary L. Comer","raw_affiliation_strings":["Purdue Univ. (United States)","#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#"],"affiliations":[{"raw_affiliation_string":"Purdue Univ. (United States)","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"#N##TAB##TAB##TAB##TAB# Purdue University, United States#N##TAB##TAB##TAB#","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101661144"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17676854,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8657","issue":null,"first_page":"86570G","last_page":"86570G"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.7872694730758667},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7700357437133789},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7589053511619568},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.7224377393722534},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7125221490859985},{"id":"https://openalex.org/keywords/deconvolution","display_name":"Deconvolution","score":0.7017691135406494},{"id":"https://openalex.org/keywords/scale-space-segmentation","display_name":"Scale-space segmentation","score":0.6941020488739014},{"id":"https://openalex.org/keywords/segmentation-based-object-categorization","display_name":"Segmentation-based object categorization","score":0.6708281636238098},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.45193302631378174},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11095064878463745}],"concepts":[{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.7872694730758667},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7700357437133789},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7589053511619568},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.7224377393722534},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7125221490859985},{"id":"https://openalex.org/C174576160","wikidata":"https://www.wikidata.org/wiki/Q1183700","display_name":"Deconvolution","level":2,"score":0.7017691135406494},{"id":"https://openalex.org/C65885262","wikidata":"https://www.wikidata.org/wiki/Q7429708","display_name":"Scale-space segmentation","level":4,"score":0.6941020488739014},{"id":"https://openalex.org/C25694479","wikidata":"https://www.wikidata.org/wiki/Q7446278","display_name":"Segmentation-based object categorization","level":5,"score":0.6708281636238098},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45193302631378174},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11095064878463745}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2012829","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2012829","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3144569342","https://openalex.org/W2945274617","https://openalex.org/W1986655823","https://openalex.org/W2185902295","https://openalex.org/W2103507220","https://openalex.org/W2055202857","https://openalex.org/W4205800335","https://openalex.org/W2371519352","https://openalex.org/W2386644571","https://openalex.org/W2372421320"],"abstract_inverted_index":{"In":[0,30],"this":[1,15,94],"paper,":[2],"we":[3,89],"propose":[4],"the":[5,18,31,64,98,110,118],"scanning":[6],"electron":[7,78],"microscope":[8,121],"(SEM)":[9],"image":[10,39],"blurring":[11,67,72,95],"model":[12,16],"and":[13,21,27,36,44],"apply":[14],"to":[17,76,107,116],"joint":[19],"deconvolution":[20,26],"segmentation":[22,28,40,61,84,101,119],"method":[23,112],"which":[24],"performs":[25],"simultaneously.":[29],"field":[32],"of":[33,93,120,123],"materials":[34],"science":[35],"engineering,":[37],"automated":[38],"techniques":[41],"are":[42,54,105],"critical":[43],"getting":[45,59],"exact":[46],"boundary":[47],"shape":[48],"is":[49],"especially":[50],"important.":[51],"However,":[52],"there":[53],"still":[55],"some":[56],"difficulty":[57],"in":[58,74],"good":[60],"results":[62,85,104],"when":[63],"images":[65,70,122],"have":[66,71],"degradation.":[68],"SEM":[69],"due":[73],"part":[75],"complex":[77],"interactions":[79],"during":[80],"acquisition.":[81],"To":[82],"improve":[83,117],"at":[86],"object":[87],"boundaries,":[88],"incorporate":[90],"prior":[91],"knowledge":[92],"degradation":[96],"into":[97],"existing":[99],"EM/MPM":[100],"algorithm.":[102],"Experimental":[103],"presented":[106],"demonstrate":[108],"that":[109],"proposed":[111],"can":[113],"be":[114],"used":[115],"materials.":[124]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}