{"id":"https://openalex.org/W2058810976","doi":"https://doi.org/10.1117/12.2003697","title":"A novel pixel design with hybrid type isolation scheme for low dark current in CMOS image sensor","display_name":"A novel pixel design with hybrid type isolation scheme for low dark current in CMOS image sensor","publication_year":2013,"publication_date":"2013-02-19","ids":{"openalex":"https://openalex.org/W2058810976","doi":"https://doi.org/10.1117/12.2003697","mag":"2058810976"},"language":"en","primary_location":{"id":"doi:10.1117/12.2003697","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2003697","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104083046","display_name":"Sung Ho Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]},{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sung Ho Choi","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","Sungkyunkwan Univ. (Korea, Republic of)","Samsung Electronics Co., Ltd. (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Sungkyunkwan Univ. (Korea, Republic of)","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"Samsung Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087661670","display_name":"Yi Tae Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yi Tae Kim","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101896486","display_name":"Min Seok Oh","orcid":"https://orcid.org/0000-0001-8828-4586"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min Seok Oh","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063935917","display_name":"Young Hwan Park","orcid":"https://orcid.org/0000-0001-9802-8017"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young Hwan Park","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020049230","display_name":"Jeong Jin Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong Jin Cho","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007377823","display_name":"Young Heub Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young Heub Jang","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032096057","display_name":"Hyung Jun Han","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung Jun Han","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101890549","display_name":"Jong Won Choi","orcid":"https://orcid.org/0000-0001-7940-7919"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong Won Choi","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017702668","display_name":"Ho Woo Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ho Woo Park","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004232635","display_name":"Sang Il Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Il Jung","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112106145","display_name":"Hoon Sang Oh","orcid":"https://orcid.org/0009-0004-2666-7169"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoon Sang Oh","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102087880","display_name":"Jung Chak Ahn","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung Chak Ahn","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004041535","display_name":"Goto Hiroshige","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hiroshige Goto","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111776515","display_name":"Chi Young Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chi Young Choi","raw_affiliation_strings":["SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","SAMSUNG Electronics Co., Ltd., (Korea, Republic of)"],"affiliations":[{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd. (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"SAMSUNG Electronics Co., Ltd., (Korea, Republic of)","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029769355","display_name":"Yonghan Roh","orcid":"https://orcid.org/0000-0003-0683-0219"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yonghan Roh","raw_affiliation_strings":["Sungkyunkwan Univ. (Korea, Republic of)","Sungkyunkwan University, Korea, Republic of;"],"affiliations":[{"raw_affiliation_string":"Sungkyunkwan Univ. (Korea, Republic of)","institution_ids":["https://openalex.org/I848706"]},{"raw_affiliation_string":"Sungkyunkwan University, Korea, Republic of;","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":15,"corresponding_author_ids":["https://openalex.org/A5104083046"],"corresponding_institution_ids":["https://openalex.org/I2250650973","https://openalex.org/I848706"],"apc_list":null,"apc_paid":null,"fwci":0.2365,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61055675,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"8659","issue":null,"first_page":"86590F","last_page":"86590F"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shallow-trench-isolation","display_name":"Shallow trench isolation","score":0.8543474674224854},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.8441794514656067},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.8205294013023376},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.754730224609375},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7006740570068359},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6668072938919067},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6093157529830933},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.5142723917961121},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.47280874848365784},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.4507260322570801},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39224523305892944},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32627710700035095},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32485252618789673},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.27346599102020264},{"id":"https://openalex.org/keywords/trench","display_name":"Trench","score":0.26734107732772827},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24553346633911133},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2384859323501587},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1980237364768982},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10798078775405884}],"concepts":[{"id":"https://openalex.org/C105066941","wikidata":"https://www.wikidata.org/wiki/Q1424524","display_name":"Shallow trench isolation","level":4,"score":0.8543474674224854},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.8441794514656067},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.8205294013023376},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.754730224609375},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7006740570068359},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6668072938919067},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6093157529830933},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.5142723917961121},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47280874848365784},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.4507260322570801},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39224523305892944},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32627710700035095},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32485252618789673},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.27346599102020264},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.26734107732772827},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24553346633911133},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2384859323501587},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1980237364768982},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10798078775405884},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2003697","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2003697","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1539039655","https://openalex.org/W3137255043","https://openalex.org/W2611369832","https://openalex.org/W2099015120","https://openalex.org/W810815649","https://openalex.org/W2094128133","https://openalex.org/W1987262524","https://openalex.org/W1964634575","https://openalex.org/W2064050377","https://openalex.org/W2937506944"],"abstract_inverted_index":{"New":[0],"isolation":[1,25,92,113],"scheme":[2,93],"for":[3,61],"CMOS":[4],"image":[5],"sensor":[6],"pixel":[7,37,56,69],"is":[8,16,19,27,71],"proposed":[9],"and":[10,104],"its":[11],"improved":[12],"dark":[13,33,63,102,124],"current":[14,34,103,125],"performance":[15],"reported.":[17],"It":[18,118],"well":[20],"known":[21],"that":[22,122],"shallow":[23],"trench":[24],"(STI)":[26],"one":[28],"of":[29,32,42,68,94,114,140],"major":[30],"sources":[31],"in":[35,116],"imager":[36],"due":[38],"to":[39,78,99,109],"the":[40,49,54,66,101,111,123,131,134],"existence":[41],"interfacial":[43],"defects":[44],"at":[45],"STI/Si":[46],"interface.":[47],"On":[48],"account":[50],"STI-free":[51],"structure":[52],"over":[53],"whole":[55],"area":[57],"was":[58,119,126],"previously":[59],"reported":[60],"reducing":[62],"current.":[64],"As":[65],"size":[67],"pitch":[70],"shrunk,":[72],"however,":[73],"it":[74],"becomes":[75],"increasingly":[76],"difficult":[77],"isolate":[79],"in-pixel":[80,141],"transistors":[81,108,115],"electrically":[82],"without":[83],"STI.":[84],"In":[85],"this":[86],"work,":[87],"we":[88],"implemented":[89],"hybrid":[90],"type":[91],"removing":[95,130],"STI":[96,106,132],"around":[97,133],"photodiode":[98,135],"suppress":[100],"remaining":[105],"near":[107],"guarantee":[110],"electrical":[112],"pixel.":[117],"successfully":[120],"achieved":[121],"significantly":[127],"reduced":[128],"by":[129],"together":[136],"with":[137],"normal":[138],"operation":[139],"transistors.":[142]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}