{"id":"https://openalex.org/W2009550745","doi":"https://doi.org/10.1117/12.2001770","title":"Continuous fabrication technology for improving resolution in RGB-stacked organic image sensor","display_name":"Continuous fabrication technology for improving resolution in RGB-stacked organic image sensor","publication_year":2013,"publication_date":"2013-02-19","ids":{"openalex":"https://openalex.org/W2009550745","doi":"https://doi.org/10.1117/12.2001770","mag":"2009550745"},"language":"en","primary_location":{"id":"doi:10.1117/12.2001770","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2001770","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033973949","display_name":"Toshikatsu Sakai","orcid":"https://orcid.org/0000-0001-9157-9967"},"institutions":[{"id":"https://openalex.org/I15905956","display_name":"NHK Spring (Japan)","ror":"https://ror.org/00vse3055","country_code":"JP","type":"company","lineage":["https://openalex.org/I15905956"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Toshikatsu Sakai","raw_affiliation_strings":["NHK Science and Technology Research Labs. (Japan)"],"affiliations":[{"raw_affiliation_string":"NHK Science and Technology Research Labs. (Japan)","institution_ids":["https://openalex.org/I15905956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021621215","display_name":"Hokuto Seo","orcid":null},"institutions":[{"id":"https://openalex.org/I15905956","display_name":"NHK Spring (Japan)","ror":"https://ror.org/00vse3055","country_code":"JP","type":"company","lineage":["https://openalex.org/I15905956"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hokuto Seo","raw_affiliation_strings":["NHK Science and Technology Research Labs. (Japan)"],"affiliations":[{"raw_affiliation_string":"NHK Science and Technology Research Labs. (Japan)","institution_ids":["https://openalex.org/I15905956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109417623","display_name":"Satoshi Aihara","orcid":null},"institutions":[{"id":"https://openalex.org/I15905956","display_name":"NHK Spring (Japan)","ror":"https://ror.org/00vse3055","country_code":"JP","type":"company","lineage":["https://openalex.org/I15905956"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Aihara","raw_affiliation_strings":["NHK Science and Technology Research Labs. (Japan)"],"affiliations":[{"raw_affiliation_string":"NHK Science and Technology Research Labs. (Japan)","institution_ids":["https://openalex.org/I15905956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100813031","display_name":"Misao Kubota","orcid":null},"institutions":[{"id":"https://openalex.org/I15905956","display_name":"NHK Spring (Japan)","ror":"https://ror.org/00vse3055","country_code":"JP","type":"company","lineage":["https://openalex.org/I15905956"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Misao Kubota","raw_affiliation_strings":["NHK Science and Technology Research Labs. (Japan)"],"affiliations":[{"raw_affiliation_string":"NHK Science and Technology Research Labs. (Japan)","institution_ids":["https://openalex.org/I15905956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046446439","display_name":"Mamoru Furuta","orcid":"https://orcid.org/0000-0003-1685-3246"},"institutions":[{"id":"https://openalex.org/I35568498","display_name":"Kochi University of Technology","ror":"https://ror.org/00rghrr56","country_code":"JP","type":"education","lineage":["https://openalex.org/I35568498"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mamoru Furuta","raw_affiliation_strings":["Kochi Univ. of Technology (Japan)","Kochi Univ. of Technology Japan"],"affiliations":[{"raw_affiliation_string":"Kochi Univ. of Technology (Japan)","institution_ids":["https://openalex.org/I35568498"]},{"raw_affiliation_string":"Kochi Univ. of Technology Japan","institution_ids":["https://openalex.org/I35568498"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5033973949"],"corresponding_institution_ids":["https://openalex.org/I15905956"],"apc_list":null,"apc_paid":null,"fwci":0.7093,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.73837423,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"8659","issue":null,"first_page":"86590G","last_page":"86590G"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.8013671636581421},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7481111884117126},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.637127161026001},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.6142511963844299},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.5651782751083374},{"id":"https://openalex.org/keywords/stacking","display_name":"Stacking","score":0.5481583476066589},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.47400104999542236},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.45087337493896484},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.4227578341960907},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.33693909645080566},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2723788022994995},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20002564787864685},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.10723245143890381}],"concepts":[{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.8013671636581421},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7481111884117126},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.637127161026001},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.6142511963844299},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.5651782751083374},{"id":"https://openalex.org/C33347731","wikidata":"https://www.wikidata.org/wiki/Q285210","display_name":"Stacking","level":2,"score":0.5481583476066589},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.47400104999542236},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.45087337493896484},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.4227578341960907},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.33693909645080566},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2723788022994995},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20002564787864685},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.10723245143890381},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2001770","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2001770","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2380576232","https://openalex.org/W2532740565","https://openalex.org/W2527471840","https://openalex.org/W2049246612","https://openalex.org/W2937054111","https://openalex.org/W2066223521","https://openalex.org/W2013178899","https://openalex.org/W373327546","https://openalex.org/W2321534397","https://openalex.org/W2271044277"],"abstract_inverted_index":{"With":[0],"the":[1,33,50,65,69,76,80,94,97,100,105,109,133,137,149,157,161,189],"goal":[2],"of":[3,32,47,68,79,99,140,147,152,160,188,217],"developing":[4],"a":[5,15,40,83,124,141,214,227],"compact,":[6],"high-resolution":[7],"color":[8,35],"camera,":[9],"we":[10,131],"have":[11],"been":[12],"studying":[13],"about":[14,61],"novel":[16],"image":[17,48,144,239],"sensor":[18,70,101,145,240],"with":[19],"three":[20,110],"stacked":[21,107],"organic":[22,111,143,153,171,179,238],"photoconductive":[23,172],"films:":[24],"each":[25,38,121],"film":[26,173],"is":[27,54,71,102],"sensitive":[28],"to":[29,57,96,120],"only":[30],"one":[31],"primary":[34],"components,":[36],"and":[37,155,164,185,226],"has":[39,232],"signal":[41,165],"readout":[42,166],"circuit.":[43],"In":[44,104,128],"this":[45,129],"type":[46],"sensor,":[49,82,108],"acceptable":[51],"focal":[52],"depth":[53],"roughly":[55],"estimated":[56],"be":[58,175,193,242],"shorter":[59],"than":[60],"20":[62],"\u03bcm":[63],"when":[64],"pixel":[66],"pitch":[67],"several":[72],"\u03bcm.":[73],"To":[74],"reduce":[75],"total":[77],"thickness":[78],"stack-type":[81,142],"continuous":[84,138],"fabrication":[85,139,158,187],"technology":[86],"that":[87],"entails":[88],"stacking":[89],"continuously":[90,106],"all":[91],"layers":[92,112],"from":[93],"bottom":[95],"top":[98],"necessary.":[103],"separated":[113],"by":[114,177,195,219,244],"interlayer":[115,162,190],"insulators":[116,163],"are":[117,211],"formed":[118],"close":[119],"other":[122],"on":[123],"single":[125],"glass":[126],"substrate.":[127],"paper,":[130],"describe":[132],"elemental":[134],"technologies":[135],"for":[136],"consisting":[146],"improving":[148],"heat":[150],"resistance":[151],"films":[154],"decreasing":[156],"temperature":[159,216],"circuits.":[167],"A":[168,236],"150\u00b0C":[169,218],"heat-resistant":[170],"can":[174,192,241],"obtained":[176],"using":[178,198,220],"materials":[180],"possessing":[181],"high":[182],"glass-transition":[183],"temperatures,":[184],"low-temperature":[186],"insulator":[191,223],"accomplished":[194],"metal":[196],"oxides":[197],"atomic":[199],"layer":[200],"deposition":[201],"(ALD)":[202],"at":[203,213],"150\u00b0C.":[204],"The":[205,229],"amorphous":[206],"In-Ga-Zn-O":[207],"thin-film":[208],"transistors":[209],"(TFT)":[210],"fabricated":[212,243],"maximum":[215],"Al<sub>2</sub>O<sub>3</sub>":[221],"gate":[222],"via":[224],"ALD":[225],"post-treatment.":[228],"resulting":[230],"TFT":[231],"good":[233],"transfer":[234],"characteristics.":[235],"continuously-stacked":[237],"integrating":[245],"these":[246],"technologies.":[247]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}