{"id":"https://openalex.org/W4252611270","doi":"https://doi.org/10.1117/12.2000378","title":"On the analysis of wavelet-based approaches for print grain artifacts","display_name":"On the analysis of wavelet-based approaches for print grain artifacts","publication_year":2013,"publication_date":"2013-02-04","ids":{"openalex":"https://openalex.org/W4252611270","doi":"https://doi.org/10.1117/12.2000378"},"language":"en","primary_location":{"id":"doi:10.1117/12.2000378","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2000378","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102911931","display_name":"Ahmed H. Eid","orcid":"https://orcid.org/0009-0004-4241-9915"},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ahmed H. Eid","raw_affiliation_strings":["Lexmark International Inc. (United States)"],"affiliations":[{"raw_affiliation_string":"Lexmark International Inc. (United States)","institution_ids":["https://openalex.org/I154586514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109002042","display_name":"B. E. Cooper","orcid":null},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian E. Cooper","raw_affiliation_strings":["Lexmark International Inc. (United States)"],"affiliations":[{"raw_affiliation_string":"Lexmark International Inc. (United States)","institution_ids":["https://openalex.org/I154586514"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047572977","display_name":"Edward E. Rippetoe","orcid":null},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward E. Rippetoe","raw_affiliation_strings":["Lexmark International Inc. (United States)"],"affiliations":[{"raw_affiliation_string":"Lexmark International Inc. (United States)","institution_ids":["https://openalex.org/I154586514"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102911931"],"corresponding_institution_ids":["https://openalex.org/I154586514"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.38215651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"8653","issue":null,"first_page":"86530K","last_page":"86530K"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.7305574417114258},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6138495802879333},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4934522211551666},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37702804803848267},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.37156742811203003}],"concepts":[{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.7305574417114258},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6138495802879333},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4934522211551666},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37702804803848267},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.37156742811203003}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2000378","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2000378","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2058170566","https://openalex.org/W2772917594","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398","https://openalex.org/W2775347418"],"abstract_inverted_index":{"Grain":[0],"is":[1,260],"one":[2,277],"of":[3,17,30,79,108,121,127,155,179,202,234,255,280],"several":[4,147],"attributes":[5],"described":[6],"in":[7,138,167,278],"ISO/IEC":[8,50,92,139,142,170,226],"TS":[9,143,270],"24790,":[10],"a":[11,38,83,88,99,168,200,263],"technical":[12],"specification":[13],"for":[14,20,165,246],"the":[15,42,59,69,77,91,106,114,118,125,135,141,153,156,161,182,186,191,207,213,225,230,235,266,292],"measurement":[16,78,95],"image":[18,48],"quality":[19],"monochrome":[21],"printed":[22,47,128,203],"output.":[23],"It":[24],"defines":[25],"grain":[26,80,94,129,136,204,248,268],"as":[27,66,160],"aperiodic":[28],"fluctuations":[29,64],"lightness":[31],"greater":[32],"than":[33],"0.4":[34],"cycles":[35],"per":[36],"millimeter,":[37],"definition":[39,54],"inherited":[40],"from":[41,68],"latest":[43],"official":[44],"standard":[45],"on":[46,58,212,251],"quality,":[49],"13660.":[51],"Since":[52],"this":[53],"places":[55],"no":[56],"bounds":[57],"upper":[60],"frequency":[61,253],"range,":[62],"higher-frequency":[63],"(such":[65],"those":[67],"printer\u2019s":[70],"halftone":[71],"pattern)":[72],"could":[73],"contribute":[74],"significantly":[75],"to":[76,90,104,132,152,261],"artifacts.":[81,130,205],"In":[82,239],"previous":[84],"publication,":[85],"we":[86,241],"introduced":[87],"modification":[89,112],"13660":[93,227],"algorithm":[96,137,164],"that":[97],"includes":[98],"band-pass,":[100],"wavelet-based,":[101],"filtering":[102],"step":[103],"limit":[105],"contribution":[107],"high-frequency":[109],"fluctuations.":[110],"This":[111,150],"improves":[113],"algorithm\u2019s":[115],"correlation":[116,178,220,288],"with":[117],"subjective":[119,187,232],"evaluation":[120,188,233],"experts":[122],"who":[123],"rated":[124],"severity":[126],"Seeking":[131],"improve":[133],"upon":[134,196],"13660,":[140],"24790":[144],"committee":[145,193,237],"evaluated":[146],"graininess":[148],"metrics.":[149],"led":[151],"selection":[154],"above":[157],"wavelet-based":[158,183],"approach":[159,184,228,245,272],"top":[162],"candidate":[163],"inclusion":[166],"future":[169],"standard.":[171],"Our":[172,258,283],"recent":[173],"experimental":[174,284],"results":[175,285],"showed":[176,217,286],"r<sup>2</sup>":[177,287],"0.9278":[180],"between":[181,224,265,291],"and":[185,229,273,294],"conducted":[189],"by":[190],"ISO":[192,236],"members":[194],"based":[195,250],"26":[197],"samples":[198],"covering":[199],"variety":[201],"On":[206],"other":[208],"hand,":[209],"our":[210],"experiments":[211],"same":[214,231],"data":[215],"set":[216],"much":[218],"lower":[219],"(r<sup>2":[221],"</sup>=":[222],"0.3555)":[223],"members.":[238],"addition,":[240],"introduce":[242],"an":[243],"alternative":[244],"measuring":[247],"defects":[249],"spatial":[252,293],"analysis":[254],"wavelet-filtered":[256],"images.":[257],"goal":[259],"establish":[262],"link":[264],"spatial-based":[267],"(ISO/IEC":[269],"24790)":[271],"its":[274],"equivalent":[275],"frequency-based":[276,295],"light":[279],"Parseval\u2019s":[281],"theorem.":[282],"near":[289],"0.99":[290],"approaches.":[296]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}