{"id":"https://openalex.org/W2014353816","doi":"https://doi.org/10.1117/1.3455991","title":"Thermographic crack detection and failure classification","display_name":"Thermographic crack detection and failure classification","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W2014353816","doi":"https://doi.org/10.1117/1.3455991","mag":"2014353816"},"language":"en","primary_location":{"id":"doi:10.1117/1.3455991","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.3455991","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075629444","display_name":"Beate Oswald-Tranta","orcid":"https://orcid.org/0000-0002-1994-3039"},"institutions":[{"id":"https://openalex.org/I182712176","display_name":"Montanuniversit\u00e4t Leoben","ror":"https://ror.org/02fhfw393","country_code":"AT","type":"education","lineage":["https://openalex.org/I182712176"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Beata Oswald-Tranta","raw_affiliation_strings":["Montan Univ. Leoben (Austria)"],"affiliations":[{"raw_affiliation_string":"Montan Univ. Leoben (Austria)","institution_ids":["https://openalex.org/I182712176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5075629444"],"corresponding_institution_ids":["https://openalex.org/I182712176"],"apc_list":null,"apc_paid":null,"fwci":4.4476,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.92984025,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"19","issue":"3","first_page":"031204","last_page":"031204"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9714000225067139,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9527999758720398,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7400000691413879},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.7359281182289124},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.7223289012908936},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.5668609738349915},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.5311426520347595},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5066314339637756},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4903557300567627},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42984652519226074},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4276009500026703},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.4178135395050049},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4135904908180237},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.37103381752967834},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3680407404899597},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.28204071521759033},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.19875380396842957},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19479331374168396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11657854914665222}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7400000691413879},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.7359281182289124},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.7223289012908936},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.5668609738349915},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.5311426520347595},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5066314339637756},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4903557300567627},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42984652519226074},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4276009500026703},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.4178135395050049},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4135904908180237},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.37103381752967834},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3680407404899597},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.28204071521759033},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19875380396842957},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19479331374168396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11657854914665222},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/1.3455991","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.3455991","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1039335564","https://openalex.org/W1993902044","https://openalex.org/W2003413050","https://openalex.org/W2011324653","https://openalex.org/W2114439509","https://openalex.org/W2116044718","https://openalex.org/W2161654748","https://openalex.org/W4241395986"],"related_works":["https://openalex.org/W2035425333","https://openalex.org/W2535232420","https://openalex.org/W2084261063","https://openalex.org/W2057623303","https://openalex.org/W2955313200","https://openalex.org/W2522484973","https://openalex.org/W2547064751","https://openalex.org/W2003586886","https://openalex.org/W2764437764","https://openalex.org/W1616769725"],"abstract_inverted_index":{"In":[0],"the":[1,6,16,19,24,43,51,57,65,73,77,119,129,148,151],"case":[2],"of":[3,18,29,42,76,128,150],"thermographic":[4],"inspection,":[5],"workpiece":[7],"is":[8,61,99,107,135],"heated":[9],"in":[10,50,72],"a":[11,39,100,110,142],"particular":[12],"manner":[13],"followed":[14],"by":[15,27,124],"observation":[17],"resulting":[20],"temperature":[21,139],"increase":[22,140],"at":[23,147],"material":[25],"surface":[26,36,74],"means":[28],"an":[30],"infrared":[31,52,130],"camera.":[32],"Inhomogeneities":[33],"such":[34],"as":[35],"cracks":[37],"cause":[38],"nonuniform":[40],"distribution":[41],"temperature;":[44],"consequently,":[45],"they":[46],"can":[47,90],"be":[48,91],"localized":[49],"images.":[53,131],"For":[54],"metallic":[55],"pieces,":[56],"most":[58],"efficient":[59],"way":[60],"inductive":[62],"heating,":[63],"whereby":[64],"induced":[66],"eddy":[67],"current":[68],"generates":[69],"heat":[70],"directly":[71],"skin":[75],"sample.":[78],"Experiments":[79],"have":[80,169],"been":[81,156,170],"carried":[82],"out":[83],"on":[84],"how":[85],"steel":[86],"workpieces,":[87],"especially":[88],"castings,":[89],"thermographically":[92],"inspected":[93],"to":[94,108,136,158,161],"detect":[95],"cracks.":[96],"The":[97,105,132],"testing":[98,113],"nondestructive":[101],"and":[102,126,144,160,166],"contact-free":[103],"method.":[104],"goal":[106],"develop":[109],"fully":[111],"automated":[112],"equipment":[114],"with":[115],"high":[116],"throughput,":[117],"where":[118],"flawed":[120],"pieces":[121],"are":[122],"identified":[123],"evaluation":[125],"classification":[127,133],"task":[134],"distinguish":[137],"between":[138],"around":[141],"crack":[143],"additional":[145],"heating":[146],"edges":[149],"workpieces.":[152],"Neural":[153],"network":[154],"has":[155],"used":[157],"train":[159],"classify":[162],"about":[163],"750":[164],"images,":[165],"good":[167],"results":[168],"achieved.":[171]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}