{"id":"https://openalex.org/W2042045893","doi":"https://doi.org/10.1117/1.1556766","title":"Morphological characterization of dithering masks","display_name":"Morphological characterization of dithering masks","publication_year":2003,"publication_date":"2003-04-01","ids":{"openalex":"https://openalex.org/W2042045893","doi":"https://doi.org/10.1117/1.1556766","mag":"2042045893"},"language":"en","primary_location":{"id":"doi:10.1117/1.1556766","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1556766","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103515707","display_name":"Vladimir Mi\u0161i\u0107","orcid":null},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Vladimir Misic","raw_affiliation_strings":["Univ. of Rochester (United States)","University of Rochester, Department of Electrical and Computer Engineering, Rochester, New York 14627"],"affiliations":[{"raw_affiliation_string":"Univ. of Rochester (United States)","institution_ids":["https://openalex.org/I5388228"]},{"raw_affiliation_string":"University of Rochester, Department of Electrical and Computer Engineering, Rochester, New York 14627","institution_ids":["https://openalex.org/I5388228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5103515707"],"corresponding_institution_ids":["https://openalex.org/I5388228"],"apc_list":null,"apc_paid":null,"fwci":0.2517,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55688486,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"12","issue":"2","first_page":"278","last_page":"278"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.743474006652832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5705816149711609},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5380287766456604},{"id":"https://openalex.org/keywords/imaging-science","display_name":"Imaging science","score":0.4449627995491028},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4203200340270996},{"id":"https://openalex.org/keywords/data-science","display_name":"Data science","score":0.3942282795906067},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.328982949256897},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.29838693141937256},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2127259373664856},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1544835865497589},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1440633237361908}],"concepts":[{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.743474006652832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5705816149711609},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5380287766456604},{"id":"https://openalex.org/C57177791","wikidata":"https://www.wikidata.org/wiki/Q1038886","display_name":"Imaging science","level":2,"score":0.4449627995491028},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4203200340270996},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.3942282795906067},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.328982949256897},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.29838693141937256},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2127259373664856},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1544835865497589},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1440633237361908},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/1.1556766","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1556766","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1999792808","https://openalex.org/W2005010120","https://openalex.org/W2010153747","https://openalex.org/W2068111273","https://openalex.org/W2102493018","https://openalex.org/W2110053117","https://openalex.org/W2208958634"],"related_works":["https://openalex.org/W2389128124","https://openalex.org/W2364812720","https://openalex.org/W2138725603","https://openalex.org/W2050335563","https://openalex.org/W3001913892","https://openalex.org/W2273639645","https://openalex.org/W2050646564","https://openalex.org/W1507581877","https://openalex.org/W4289376995","https://openalex.org/W2354772242"],"abstract_inverted_index":{"The":[0],"<i>Journal":[1],"of":[2,27],"Electronic":[3],"Imaging</i>":[4],"(JEI),":[5],"copublished":[6],"bimonthly":[7],"with":[8],"the":[9],"Society":[10],"for":[11],"Imaging":[12],"Science":[13],"and":[14,22,31],"Technology,":[15],"publishes":[16],"peer-reviewed":[17],"papers":[18],"that":[19],"cover":[20],"research":[21],"applications":[23],"in":[24],"all":[25],"areas":[26],"electronic":[28],"imaging":[29],"science":[30],"technology.":[32]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}