{"id":"https://openalex.org/W2123459486","doi":"https://doi.org/10.1117/1.1477442","title":"Analysis of the microstructures (\u201crosettes\u201d) in the superposition of periodic layers","display_name":"Analysis of the microstructures (\u201crosettes\u201d) in the superposition of periodic layers","publication_year":2002,"publication_date":"2002-01-01","ids":{"openalex":"https://openalex.org/W2123459486","doi":"https://doi.org/10.1117/1.1477442","mag":"2123459486"},"language":"en","primary_location":{"id":"doi:10.1117/1.1477442","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1477442","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/99884","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054835416","display_name":"Isaac Amidror","orcid":null},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]},{"id":"https://openalex.org/I142476485","display_name":"\u00c9cole Polytechnique","ror":"https://ror.org/05hy3tk52","country_code":"FR","type":"education","lineage":["https://openalex.org/I142476485","https://openalex.org/I4210145102"]}],"countries":["CH","FR"],"is_corresponding":true,"raw_author_name":"Isaac Amidror","raw_affiliation_strings":["Ecole Polytechnique Federale de Lausanne (Switzerland)","Ecole Polytechnique Fe\u00b4de\u00b4rale de Lausanne (EPFL), Lab. de Syste`mes Pe\u00b4riphe\u00b4riques (LSP), 1015\u2009Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"Ecole Polytechnique Federale de Lausanne (Switzerland)","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Ecole Polytechnique Fe\u00b4de\u00b4rale de Lausanne (EPFL), Lab. de Syste`mes Pe\u00b4riphe\u00b4riques (LSP), 1015\u2009Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864","https://openalex.org/I142476485"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108536482","display_name":"Roger D. Hersch","orcid":null},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]},{"id":"https://openalex.org/I142476485","display_name":"\u00c9cole Polytechnique","ror":"https://ror.org/05hy3tk52","country_code":"FR","type":"education","lineage":["https://openalex.org/I142476485","https://openalex.org/I4210145102"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Roger D. Hersch","raw_affiliation_strings":["Ecole Polytechnique Federale de Lausanne (Switzerland)","Ecole Polytechnique Fe\u00b4de\u00b4rale de Lausanne (EPFL), Lab. de Syste`mes Pe\u00b4riphe\u00b4riques (LSP), 1015\u2009Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"Ecole Polytechnique Federale de Lausanne (Switzerland)","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Ecole Polytechnique Fe\u00b4de\u00b4rale de Lausanne (EPFL), Lab. de Syste`mes Pe\u00b4riphe\u00b4riques (LSP), 1015\u2009Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864","https://openalex.org/I142476485"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5054835416"],"corresponding_institution_ids":["https://openalex.org/I142476485","https://openalex.org/I5124864"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.21247851,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"11","issue":"3","first_page":"316","last_page":"316"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.92330002784729,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.92330002784729,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/superposition-principle","display_name":"Superposition principle","score":0.5772847533226013},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.5737588405609131},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.499408483505249},{"id":"https://openalex.org/keywords/imaging-science","display_name":"Imaging science","score":0.43763455748558044},{"id":"https://openalex.org/keywords/data-science","display_name":"Data science","score":0.3264729380607605},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2815471887588501},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2243228256702423},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13999450206756592}],"concepts":[{"id":"https://openalex.org/C27753989","wikidata":"https://www.wikidata.org/wiki/Q284885","display_name":"Superposition principle","level":2,"score":0.5772847533226013},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.5737588405609131},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.499408483505249},{"id":"https://openalex.org/C57177791","wikidata":"https://www.wikidata.org/wiki/Q1038886","display_name":"Imaging science","level":2,"score":0.43763455748558044},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.3264729380607605},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2815471887588501},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2243228256702423},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13999450206756592},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/1.1477442","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1477442","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"},{"id":"pmh:oai:infoscience.epfl.ch:99884","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/99884","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:infoscience.epfl.ch:99884","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/99884","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W199717678","https://openalex.org/W572110952","https://openalex.org/W620735285","https://openalex.org/W1678903980","https://openalex.org/W2043602925","https://openalex.org/W2101809485","https://openalex.org/W2105672294","https://openalex.org/W2144459302","https://openalex.org/W2161318046","https://openalex.org/W2616163540","https://openalex.org/W3022201711","https://openalex.org/W3149448910","https://openalex.org/W3199688851","https://openalex.org/W4236789552","https://openalex.org/W4244515953"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4308749380","https://openalex.org/W2372481764","https://openalex.org/W2610947892","https://openalex.org/W1977264433","https://openalex.org/W4308448008","https://openalex.org/W2037841693","https://openalex.org/W2347371661","https://openalex.org/W2746368218","https://openalex.org/W2012943989"],"abstract_inverted_index":{"The":[0],"<i>Journal":[1],"of":[2,27],"Electronic":[3],"Imaging</i>":[4],"(JEI),":[5],"copublished":[6],"bimonthly":[7],"with":[8],"the":[9],"Society":[10],"for":[11],"Imaging":[12],"Science":[13],"and":[14,22,31],"Technology,":[15],"publishes":[16],"peer-reviewed":[17],"papers":[18],"that":[19],"cover":[20],"research":[21],"applications":[23],"in":[24],"all":[25],"areas":[26],"electronic":[28],"imaging":[29],"science":[30],"technology.":[32]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
