{"id":"https://openalex.org/W1997504591","doi":"https://doi.org/10.1117/1.1314335","title":"Configuration assistant for versatile vision-based inspection systems","display_name":"Configuration assistant for versatile vision-based inspection systems","publication_year":2001,"publication_date":"2001-01-01","ids":{"openalex":"https://openalex.org/W1997504591","doi":"https://doi.org/10.1117/1.1314335","mag":"1997504591"},"language":"en","primary_location":{"id":"doi:10.1117/1.1314335","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1314335","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098220813","display_name":"Olivier Hu \u0308sser","orcid":null},"institutions":[{"id":"https://openalex.org/I57825437","display_name":"University of Neuch\u00e2tel","ror":"https://ror.org/00vasag41","country_code":"CH","type":"education","lineage":["https://openalex.org/I57825437"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Olivier Hu\u00a8sser","raw_affiliation_strings":["Univ. de Neuchatel (Switzerland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. de Neuchatel (Switzerland)","institution_ids":["https://openalex.org/I57825437"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5098220813"],"corresponding_institution_ids":["https://openalex.org/I57825437"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17026975,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":"1","first_page":"308","last_page":"308"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6078407168388367},{"id":"https://openalex.org/keywords/imaging-science","display_name":"Imaging science","score":0.5698666572570801},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.5511778593063354},{"id":"https://openalex.org/keywords/medical-imaging","display_name":"Medical imaging","score":0.44262969493865967},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.41115081310272217},{"id":"https://openalex.org/keywords/data-science","display_name":"Data science","score":0.40211284160614014},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3757936954498291},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3598361015319824},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.17335349321365356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1694972813129425}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6078407168388367},{"id":"https://openalex.org/C57177791","wikidata":"https://www.wikidata.org/wiki/Q1038886","display_name":"Imaging science","level":2,"score":0.5698666572570801},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.5511778593063354},{"id":"https://openalex.org/C31601959","wikidata":"https://www.wikidata.org/wiki/Q931309","display_name":"Medical imaging","level":2,"score":0.44262969493865967},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.41115081310272217},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.40211284160614014},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3757936954498291},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3598361015319824},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.17335349321365356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1694972813129425},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/1.1314335","is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1314335","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.5199999809265137,"display_name":"Peace, Justice and strong institutions"},{"id":"https://metadata.un.org/sdg/10","score":0.46000000834465027,"display_name":"Reduced inequalities"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320998","display_name":"Kommission f\u00fcr Technologie und Innovation","ror":"https://ror.org/012y9zp98"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W109881820","https://openalex.org/W1974334408","https://openalex.org/W2018472474","https://openalex.org/W2020999234","https://openalex.org/W2022637272","https://openalex.org/W2049981393","https://openalex.org/W2050553376","https://openalex.org/W2087347434","https://openalex.org/W2152150600","https://openalex.org/W2904250082","https://openalex.org/W3017143921","https://openalex.org/W3023540311"],"related_works":["https://openalex.org/W1030065632","https://openalex.org/W136350006","https://openalex.org/W52064113","https://openalex.org/W2379420744","https://openalex.org/W2119791479","https://openalex.org/W2468245288","https://openalex.org/W2030262610","https://openalex.org/W1984898093","https://openalex.org/W4327648046","https://openalex.org/W2377647257"],"abstract_inverted_index":{"The":[0],"<i>Journal":[1],"of":[2,27],"Electronic":[3],"Imaging</i>":[4],"(JEI),":[5],"copublished":[6],"bimonthly":[7],"with":[8],"the":[9],"Society":[10],"for":[11],"Imaging":[12],"Science":[13],"and":[14,22,31],"Technology,":[15],"publishes":[16],"peer-reviewed":[17],"papers":[18],"that":[19],"cover":[20],"research":[21],"applications":[23],"in":[24],"all":[25],"areas":[26],"electronic":[28],"imaging":[29],"science":[30],"technology.":[32]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}