{"id":"https://openalex.org/W3210322019","doi":"https://doi.org/10.1115/1.4052838","title":"Bayesian Optimization LSTM/bi-LSTM Network With Self-Optimized Structure and Hyperparameters for Remaining Useful Life Estimation of Lathe Spindle Unit","display_name":"Bayesian Optimization LSTM/bi-LSTM Network With Self-Optimized Structure and Hyperparameters for Remaining Useful Life Estimation of Lathe Spindle Unit","publication_year":2021,"publication_date":"2021-10-28","ids":{"openalex":"https://openalex.org/W3210322019","doi":"https://doi.org/10.1115/1.4052838","mag":"3210322019"},"language":"en","primary_location":{"id":"doi:10.1115/1.4052838","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4052838","pdf_url":null,"source":{"id":"https://openalex.org/S173178594","display_name":"Journal of Computing and Information Science in Engineering","issn_l":"1530-9827","issn":["1530-9827","1944-7078"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computing and Information Science in Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088788970","display_name":"Nikhil M. Thoppil","orcid":"https://orcid.org/0000-0002-0713-1965"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Nikhil M. Thoppil","raw_affiliation_strings":["Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045309814","display_name":"V. Vasu","orcid":"https://orcid.org/0000-0002-3050-9591"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V. Vasu","raw_affiliation_strings":["Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036272436","display_name":"C. S. P. Rao","orcid":"https://orcid.org/0000-0003-1919-1540"},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]},{"id":"https://openalex.org/I4210153924","display_name":"National Institute of Technology Andhra Pradesh","ror":"https://ror.org/0456pcg54","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210153924"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"C. S. P. Rao","raw_affiliation_strings":["Department of Mechanical Engineering, National Institute of Technology Andhra Pradesh, Tadepalligudem 534101, Andhra Pradesh, India","Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, National Institute of Technology Andhra Pradesh, Tadepalligudem 534101, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210153924"]},{"raw_affiliation_string":"Department of Mechanical Engineering, National Institute of Technology Warangal, Warangal 506004, Telangana, India;","institution_ids":["https://openalex.org/I121750182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5088788970"],"corresponding_institution_ids":["https://openalex.org/I121750182"],"apc_list":null,"apc_paid":null,"fwci":2.1654,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.87731337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"22","issue":"2","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9563999772071838,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hyperparameter","display_name":"Hyperparameter","score":0.8520468473434448},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.6348579525947571},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.630967378616333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5918103456497192},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5763161182403564},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4969322979450226},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.48144716024398804},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4185035824775696},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35817569494247437}],"concepts":[{"id":"https://openalex.org/C8642999","wikidata":"https://www.wikidata.org/wiki/Q4171168","display_name":"Hyperparameter","level":2,"score":0.8520468473434448},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.6348579525947571},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.630967378616333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5918103456497192},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5763161182403564},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4969322979450226},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.48144716024398804},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4185035824775696},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35817569494247437},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1115/1.4052838","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4052838","pdf_url":null,"source":{"id":"https://openalex.org/S173178594","display_name":"Journal of Computing and Information Science in Engineering","issn_l":"1530-9827","issn":["1530-9827","1944-7078"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computing and Information Science in Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W1689711448","https://openalex.org/W1990729297","https://openalex.org/W2055873761","https://openalex.org/W2064675550","https://openalex.org/W2116261113","https://openalex.org/W2131241448","https://openalex.org/W2337713278","https://openalex.org/W2558869916","https://openalex.org/W2617137613","https://openalex.org/W2730139424","https://openalex.org/W2744067593","https://openalex.org/W2775835322","https://openalex.org/W2782812883","https://openalex.org/W2791083576","https://openalex.org/W2791895255","https://openalex.org/W2791998773","https://openalex.org/W2792003566","https://openalex.org/W2799884077","https://openalex.org/W2805330622","https://openalex.org/W2892035503","https://openalex.org/W2897557170","https://openalex.org/W2906713437","https://openalex.org/W2908441554","https://openalex.org/W2910660149","https://openalex.org/W2915330174","https://openalex.org/W2920966068","https://openalex.org/W2936195001","https://openalex.org/W2941829840","https://openalex.org/W2944364052","https://openalex.org/W2952602217","https://openalex.org/W2959076430","https://openalex.org/W2961350108","https://openalex.org/W2963500514","https://openalex.org/W2965445157","https://openalex.org/W2970449294","https://openalex.org/W2972137370","https://openalex.org/W2974878855","https://openalex.org/W2983948788","https://openalex.org/W2998227980","https://openalex.org/W3000983008","https://openalex.org/W3005331186","https://openalex.org/W3006551220","https://openalex.org/W3008143440","https://openalex.org/W3011065368","https://openalex.org/W3014191625","https://openalex.org/W3016111263","https://openalex.org/W3024761859","https://openalex.org/W3041440607","https://openalex.org/W3042726568","https://openalex.org/W3048894909","https://openalex.org/W3089341989","https://openalex.org/W3097764154","https://openalex.org/W3110038429","https://openalex.org/W3123084659","https://openalex.org/W3126793309","https://openalex.org/W3135079779","https://openalex.org/W6678911119"],"related_works":["https://openalex.org/W2140186469","https://openalex.org/W4390421286","https://openalex.org/W4280563792","https://openalex.org/W4389724018","https://openalex.org/W4318719684","https://openalex.org/W3183136280","https://openalex.org/W4318559728","https://openalex.org/W2775233965","https://openalex.org/W3114716045","https://openalex.org/W4360995913"],"abstract_inverted_index":{"Abstract":[0],"An":[1],"effective":[2],"maintenance":[3,8,37],"strategy":[4],"to":[5,117,134,139,151,168,207],"cut":[6],"back":[7],"costs":[9],"and":[10,57,94,143,189],"production":[11],"loss":[12],"with":[13],"assured":[14],"product":[15],"quality":[16],"has":[17,29],"always":[18],"been":[19],"a":[20,31,83,152],"major":[21],"concern":[22],"for":[23,34,67,87,174,183,213],"industries.":[24],"The":[25,76,96,123,196],"Industry":[26],"4.0":[27],"era":[28],"built":[30],"wide":[32],"acceptance":[33],"the":[35,40,68,72,88,132,162,170,180,209],"predictive":[36,63],"techniques":[38],"in":[39],"remaining":[41],"useful":[42],"life":[43],"(RUL)":[44],"estimation":[45,70],"of":[46,71,90,179],"critical":[47],"industrial":[48],"systems.":[49],"In":[50],"this":[51],"paper,":[52],"long":[53],"short-term":[54],"memory":[55],"(LSTM)":[56],"bidirectional-LSTM":[58],"(bi-LSTM)":[59],"deep":[60,77,98,202],"neural":[61],"architecture-based":[62],"algorithms":[64],"are":[65,137,148,166,194],"proposed":[66,97],"RUL":[69,120,175,216],"lathe":[73,104,127,214],"spindle":[74,105,128,215],"unit.":[75],"learning":[78,99],"algorithm":[79,86,100],"is":[80,101,205],"embedded":[81],"within":[82],"Bayesian":[84,184,197],"optimization":[85],"self-optimization":[89],"its":[91],"network":[92,173,187,203],"structure":[93],"hyperparameters.":[95],"trained":[102],"using":[103],"health":[106,129,133],"degradation":[107,130],"data":[108],"collected":[109],"from":[110,131],"an":[111,119],"experimental":[112],"accelerated":[113],"run-to-failure":[114],"test":[115],"rig":[116],"evolve":[118],"prediction":[121,181,211],"model.":[122],"vibration":[124],"signals":[125],"representing":[126],"faulty":[135],"state":[136],"analyzed":[138],"extract":[140],"time,":[141],"frequency,":[142],"time-frequency":[144],"domain":[145],"features,":[146],"which":[147],"then":[149],"subjected":[150],"neighborhood":[153],"component":[154],"analysis":[155],"(NCA)":[156],"based":[157],"feature":[158],"selection":[159],"criteria.":[160],"Finally,":[161],"selected":[163],"relevant":[164],"features":[165],"used":[167],"train":[169],"optimized":[171,185,198],"LSTM/bi-LSTM":[172,186],"estimation.":[176,217],"A":[177],"comparison":[178],"results":[182],"architectures":[188],"other":[190],"prominent":[191],"data-driven":[192],"approaches":[193],"performed.":[195],"LSTM":[199],"+":[200],"bi-LSTM":[201],"architecture":[204],"observed":[206],"have":[208],"highest":[210],"accuracy":[212]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":3}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}