{"id":"https://openalex.org/W3133745567","doi":"https://doi.org/10.1115/1.4050376","title":"Quality Deviation Control for Aircraft Using Digital Twin","display_name":"Quality Deviation Control for Aircraft Using Digital Twin","publication_year":2021,"publication_date":"2021-03-04","ids":{"openalex":"https://openalex.org/W3133745567","doi":"https://doi.org/10.1115/1.4050376","mag":"3133745567"},"language":"en","primary_location":{"id":"doi:10.1115/1.4050376","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4050376","pdf_url":null,"source":{"id":"https://openalex.org/S173178594","display_name":"Journal of Computing and Information Science in Engineering","issn_l":"1530-9827","issn":["1530-9827","1944-7078"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computing and Information Science in Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101236063","display_name":"Hongxia Cai","orcid":"https://orcid.org/0000-0001-6501-1374"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongxia Cai","raw_affiliation_strings":["Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102201928","display_name":"Jiamin Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiamin Zhu","raw_affiliation_strings":["Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069094306","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0001-7044-3411"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Key Laboratory of Intelligent Manufacturing and Robotics, School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I113940042"],"apc_list":null,"apc_paid":null,"fwci":4.6639,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.95137486,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"21","issue":"3","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6527646780014038},{"id":"https://openalex.org/keywords/data-quality","display_name":"Data quality","score":0.5579193830490112},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5348675847053528},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4865471422672272},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4687740206718445},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.46372291445732117},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.4160052239894867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38514474034309387},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3419126868247986},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.33082133531570435},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13832205533981323},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13319343328475952},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13129520416259766},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.1219072937965393}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6527646780014038},{"id":"https://openalex.org/C24756922","wikidata":"https://www.wikidata.org/wiki/Q1757694","display_name":"Data quality","level":3,"score":0.5579193830490112},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5348675847053528},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4865471422672272},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4687740206718445},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.46372291445732117},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.4160052239894867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38514474034309387},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3419126868247986},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.33082133531570435},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13832205533981323},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13319343328475952},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13129520416259766},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.1219072937965393},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1115/1.4050376","is_oa":false,"landing_page_url":"https://doi.org/10.1115/1.4050376","pdf_url":null,"source":{"id":"https://openalex.org/S173178594","display_name":"Journal of Computing and Information Science in Engineering","issn_l":"1530-9827","issn":["1530-9827","1944-7078"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310316053","host_organization_name":"ASM International","host_organization_lineage":["https://openalex.org/P4310316053"],"host_organization_lineage_names":["ASM International"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Computing and Information Science in Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.5400000214576721,"display_name":"Responsible consumption and production"}],"awards":[{"id":"https://openalex.org/G1013296991","display_name":null,"funder_award_id":"XX-XXFZ-01-15-4832","funder_id":"https://openalex.org/F4320325413","funder_display_name":"Shanghai Municipal Commission of Economy and Informatization"}],"funders":[{"id":"https://openalex.org/F4320325413","display_name":"Shanghai Municipal Commission of Economy and Informatization","ror":"https://ror.org/04166ws88"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1916883132","https://openalex.org/W2271284862","https://openalex.org/W2579850834","https://openalex.org/W2597150627","https://openalex.org/W2617376044","https://openalex.org/W2757653483","https://openalex.org/W2790165007","https://openalex.org/W2916928233","https://openalex.org/W2953754084","https://openalex.org/W2988359971","https://openalex.org/W2998465471","https://openalex.org/W3000027621","https://openalex.org/W3003667836","https://openalex.org/W3012041784","https://openalex.org/W6640116730","https://openalex.org/W6744474789","https://openalex.org/W6749326494"],"related_works":["https://openalex.org/W4252337044","https://openalex.org/W118630527","https://openalex.org/W38289631","https://openalex.org/W2592886773","https://openalex.org/W2922142213","https://openalex.org/W4211121235","https://openalex.org/W1903168099","https://openalex.org/W3030807550","https://openalex.org/W2365131446","https://openalex.org/W1978684294"],"abstract_inverted_index":{"Abstract":[0],"During":[1],"the":[2,14,69,74,77,109,139,149,165,182,191,197,202,206,210,218,229,237],"manufacturing":[3,20],"process":[4],"of":[5,17,39,73,89,214],"aircraft,":[6],"quality":[7,35,47,65,90,100,110,132,153,169,184,215,239],"deviation":[8,36,48,101,111,133,154,170,185,240],"problems":[9,112,123],"inevitably":[10],"occur":[11],"due":[12],"to":[13,63,107,119,162,204,234],"high":[15],"complexity":[16],"aircraft":[18,41,75,183,238],"design,":[19],"errors,":[21],"tooling":[22],"mistakes,":[23],"human":[24],"factors,":[25],"environmental":[26],"influences,":[27],"design":[28],"defects,":[29],"and":[30,59,80,83,93,113,151,159,196,212],"other":[31],"factors.":[32],"The":[33],"current":[34],"control":[37,49,134],"system":[38,98,171,203],"civil":[40],"suffers":[42],"from":[43,68],"two":[44],"problems:":[45],"(1)":[46],"data":[50,91,155,186],"are":[51,199],"scattered":[52],"in":[53,217],"more":[54],"than":[55],"100":[56],"management":[57,146],"systems,":[58],"it":[60,104,114],"is":[61,86,105,136,226,232],"difficult":[62,106],"extract":[64],"data-related":[66],"information":[67],"whole":[70],"life":[71],"cycle":[72],"involving":[76],"main":[78],"manufacturer":[79],"each":[81],"supplier":[82],"(2)":[84],"there":[85],"a":[87,94,116,129,168,223],"lack":[88],"analysis":[92],"closed-loop":[95],"information-physics":[96],"fusion":[97],"for":[99],"control.":[102],"Thus,":[103],"locate":[108],"takes":[115],"long":[117],"time":[118],"deal":[120,163,235],"with":[121,164,236],"these":[122],"as":[124],"well.":[125],"In":[126,179,221],"this":[127,180],"paper,":[128],"digital":[130,140,177],"twin-based":[131],"model":[135],"proposed.":[137],"Through":[138],"twin":[141],"modeling":[142],"based":[143,175],"on":[144,176],"asset":[145],"shell":[147],"technology,":[148],"multi-source":[150],"heterogeneous":[152],"can":[156,187],"be":[157,188],"extracted":[158],"integrated.":[160],"Furthermore,":[161],"second":[166],"problem,":[167],"has":[172],"been":[173],"built":[174],"twin.":[178],"system,":[181],"analyzed":[189],"by":[190],"FP-growth":[192],"association":[193],"rule":[194],"algorithm":[195],"results":[198],"provided":[200],"through":[201],"guide":[205],"assembly":[207],"site,":[208],"improving":[209],"efficiency":[211],"accuracy":[213],"problem-solving":[216],"physical":[219],"world.":[220],"addition,":[222],"case":[224],"study":[225],"stated,":[227],"where":[228],"proposed":[230],"approach":[231],"applied":[233],"problems.":[241]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}