{"id":"https://openalex.org/W1961059423","doi":"https://doi.org/10.1109/wcnc.2005.1424615","title":"On the statistics of the residual frequency error for frequency estimators","display_name":"On the statistics of the residual frequency error for frequency estimators","publication_year":2005,"publication_date":"2005-04-25","ids":{"openalex":"https://openalex.org/W1961059423","doi":"https://doi.org/10.1109/wcnc.2005.1424615","mag":"1961059423"},"language":"en","primary_location":{"id":"doi:10.1109/wcnc.2005.1424615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wcnc.2005.1424615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Wireless Communications and Networking Conference, 2005","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033982342","display_name":"T. Luo","orcid":"https://orcid.org/0000-0001-5139-5784"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Tao Luo","raw_affiliation_strings":["Qualcomm, Inc., San Diego, CA, USA","Qualcomm Inc.  San Diego CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm, Inc., San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Qualcomm Inc.  San Diego CA USA","institution_ids":["https://openalex.org/I19268510","https://openalex.org/I4210111675"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101651851","display_name":"Youngchai Ko","orcid":"https://orcid.org/0000-0001-5707-0032"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Chai Ko","raw_affiliation_strings":["Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea","School of Electrical Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09606956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"830","last_page":"835"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.789895236492157},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.6764112114906311},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.6120238900184631},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46579015254974365},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33724766969680786},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2764711081981659}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.789895236492157},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.6764112114906311},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.6120238900184631},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46579015254974365},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33724766969680786},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2764711081981659}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/wcnc.2005.1424615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wcnc.2005.1424615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Wireless Communications and Networking Conference, 2005","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2025934813","https://openalex.org/W2108794019","https://openalex.org/W2111855076","https://openalex.org/W2135992111","https://openalex.org/W2145469175","https://openalex.org/W2163525501","https://openalex.org/W2798333393","https://openalex.org/W2913817822","https://openalex.org/W7018733341"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W4245490552","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2042127053","https://openalex.org/W2142036596","https://openalex.org/W4313645560"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"some":[5],"new":[6],"statistical":[7,52],"modeling":[8,53],"of":[9,33,42,61],"the":[10,15,28,34,40,50],"residual":[11,35],"frequency":[12,19,36],"error":[13,37],"when":[14],"classical":[16],"open":[17],"loop":[18],"estimator":[20],"is":[21,54],"employed.":[22],"We":[23],"obtain":[24],"a":[25,58],"closed-form":[26],"for":[27],"cumulative":[29],"density":[30],"function":[31],"(CDF)":[32],"by":[38],"using":[39],"method":[41],"convex":[43],"combination.":[44],"The":[45],"simulation":[46],"results":[47],"show":[48],"that":[49],"proposed":[51],"very":[55],"accurate":[56],"over":[57],"wide":[59],"range":[60],"system":[62],"parameters.":[63]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}