{"id":"https://openalex.org/W3033133180","doi":"https://doi.org/10.1109/vts48691.2020.9107583","title":"A Zero-Cost Detection Approach for Recycled ICs using Scan Architecture","display_name":"A Zero-Cost Detection Approach for Recycled ICs using Scan Architecture","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3033133180","doi":"https://doi.org/10.1109/vts48691.2020.9107583","mag":"3033133180"},"language":"en","primary_location":{"id":"doi:10.1109/vts48691.2020.9107583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329067","display_name":"Wendong Wang","orcid":"https://orcid.org/0000-0002-6418-8087"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wendong Wang","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079601863","display_name":"Ujjwal Guin","orcid":"https://orcid.org/0000-0002-4819-8728"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ujjwal Guin","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104362993","display_name":"Adit D. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adit Singh","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100329067"],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":null,"apc_paid":null,"fwci":1.3862,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79747387,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zero","display_name":"Zero (linguistics)","score":0.5932289361953735},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5305935144424438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5077124834060669},{"id":"https://openalex.org/keywords/zero-emission","display_name":"Zero emission","score":0.4462588131427765},{"id":"https://openalex.org/keywords/ground-zero","display_name":"Ground zero","score":0.42259958386421204},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3627372980117798},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22953420877456665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1774480938911438},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07790154218673706}],"concepts":[{"id":"https://openalex.org/C2780813799","wikidata":"https://www.wikidata.org/wiki/Q3274237","display_name":"Zero (linguistics)","level":2,"score":0.5932289361953735},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5305935144424438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5077124834060669},{"id":"https://openalex.org/C118334743","wikidata":"https://www.wikidata.org/wiki/Q846292","display_name":"Zero emission","level":2,"score":0.4462588131427765},{"id":"https://openalex.org/C2780518707","wikidata":"https://www.wikidata.org/wiki/Q685332","display_name":"Ground zero","level":2,"score":0.42259958386421204},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3627372980117798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22953420877456665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1774480938911438},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07790154218673706},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts48691.2020.9107583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1595368737","https://openalex.org/W1992413325","https://openalex.org/W1993023092","https://openalex.org/W1995505545","https://openalex.org/W2007280892","https://openalex.org/W2019794239","https://openalex.org/W2035407142","https://openalex.org/W2091664166","https://openalex.org/W2093439000","https://openalex.org/W2099101940","https://openalex.org/W2112414127","https://openalex.org/W2112787602","https://openalex.org/W2124458446","https://openalex.org/W2158902938","https://openalex.org/W2300806133","https://openalex.org/W2307493678","https://openalex.org/W2422685390","https://openalex.org/W2798461574","https://openalex.org/W2808442774","https://openalex.org/W2949793452","https://openalex.org/W3026084164","https://openalex.org/W4235205102","https://openalex.org/W4236584923","https://openalex.org/W4243195860","https://openalex.org/W4299855476","https://openalex.org/W6649424060","https://openalex.org/W6673357431"],"related_works":["https://openalex.org/W4300821880","https://openalex.org/W4402779703","https://openalex.org/W4313594480","https://openalex.org/W950663903","https://openalex.org/W4395043342","https://openalex.org/W2979003581","https://openalex.org/W4239895606","https://openalex.org/W2285651113","https://openalex.org/W2529210858","https://openalex.org/W2984831814"],"abstract_inverted_index":{"The":[0,302],"recycling":[1],"of":[2,15,61,68,76,149,176,197,211,249,255,264,277,316,339,363,385],"used":[3,205,230,377],"integrated":[4],"circuits":[5],"(ICs)":[6],"has":[7],"raised":[8],"serious":[9,24],"problems":[10],"in":[11,86,95,105,114,155,171,188,224,268,313,321],"ensuring":[12],"the":[13,58,66,69,80,106,145,161,208,234,238,247,250,256,269,286,294,299,314,346],"integrity":[14],"today\u2019s":[16],"globalized":[17],"semiconductor":[18],"supply":[19],"chain.":[20],"This":[21],"poses":[22],"a":[23,48,87,124,192,212,221,261,361],"threat":[25],"to":[26,30,65,79,98,182,374],"critical":[27],"infrastructure":[28],"due":[29,97],"potentially":[31],"shorter":[32],"lifetime,":[33],"lower":[34],"reliability,":[35],"and":[36,82,201,329],"poorer":[37],"performance":[38],"from":[39,102,232],"these":[40,322,331,350],"counterfeit":[41],"new":[42,88,328],"chips.":[43],"Recently,":[44],"we":[45,138,219,258],"have":[46,131],"proposed":[47],"highly":[49],"effective":[50,113],"approach":[51,142],"for":[52,206,240],"detecting":[53,115],"such":[54,281],"chips":[55],"by":[56],"exploiting":[57],"power-up":[59,78,147,181],"state":[60,148,289],"on-chip":[62,133],"SRAMs.":[63],"Due":[64],"symmetry":[67],"memory":[70],"array":[71],"layout,":[72,172],"an":[73,140,173],"equal":[74,174],"number":[75,126,175,263,315],"cells":[77,178],"0":[81,183,300],"1":[83,185,287],"logic":[84,186,199,288],"states":[85,187],"unused":[89],"SRAM;":[90],"this":[91,109,136,216,225,356],"ratio":[92],"gets":[93],"skewed":[94],"time":[96,194,312,345],"uneven":[99],"NBTI":[100],"aging":[101],"normal":[103],"usage":[104,210],"field.":[107],"Although":[108],"solution":[110,223],"is":[111,120,279,372],"very":[112],"recycled":[116],"ICs,":[117],"its":[118],"applicability":[119],"somewhat":[121],"limited":[122],"as":[123,380,382],"large":[125,132],"older":[127],"designs":[128],"do":[129],"not":[130,168,180],"memories.":[134],"In":[135],"paper,":[137],"propose":[139,220],"alternate":[141],"based":[143],"on":[144],"initial":[146],"scan":[150,177,253],"flip-flops,":[151,162],"which":[152],"are":[153,166],"present":[154],"virtually":[156],"every":[157],"digital":[158],"circuit.":[159,251],"Since":[160],"unlike":[163],"SRAM":[164],"cells,":[165],"generally":[167],"perfectly":[169],"symmetrical":[170],"will":[179],"or":[184,245],"most":[189],"designs.":[190],"Consequently,":[191],"stable":[193],"zero":[195],"reference":[196,243],"50%":[198],"0s":[200,317],"1s":[202,340],"cannot":[203],"be":[204,360],"determining":[207],"subsequent":[209],"chip.":[213],"To":[214],"overcome":[215],"key":[217],"limitation,":[218],"novel":[222],"paper":[226],"that":[227,282,355,370],"reliably":[228,375],"identifies":[229],"ICs":[231,378],"testing":[233,254],"part":[235],"alone,":[236],"without":[237],"need":[239],"any":[241],"additional":[242],"data":[244],"even":[246],"netlist":[248],"Through":[252],"IC,":[257],"first":[259],"identify":[260],"significant":[262],"asymmetrically":[265],"stressed":[266],"flip-flops":[267,278],"design,":[270],"divided":[271],"into":[272],"two":[273,323,332],"groups.":[274],"One":[275],"group":[276,296],"selected":[280],"it":[283,371],"mostly":[284,297],"experiences":[285,298],"during":[290,306],"functional":[291],"operation,":[292],"while":[293],"other":[295],"state.":[301],"resulting":[303],"differential":[304,347],"stress":[305,348],"operation":[307],"causes":[308],"growing":[309],"disparity":[310],"over":[311,344],"(and":[318],"1s)":[319],"observed":[320],"groups":[324,333],"at":[325],"power-up.":[326],"When":[327],"unaged,":[330],"behave":[334],"similarly,":[335],"with":[336],"similar":[337],"percentage":[338],"(or":[341],"0s).":[342],"However,":[343],"makes":[349],"counts":[351],"diverge.":[352],"We":[353],"show":[354,369],"changing":[357],"count":[358],"can":[359],"measure":[362],"operational":[364],"aging.":[365],"Our":[366],"simulation":[367],"results":[368],"possible":[373],"detect":[376],"after":[379],"little":[381],"three":[383],"months":[384],"operation.":[386]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}