{"id":"https://openalex.org/W2146400304","doi":"https://doi.org/10.1109/vtest.1999.766703","title":"Evaluating the fault tolerance capabilities of embedded systems via BDM","display_name":"Evaluating the fault tolerance capabilities of embedded systems via BDM","publication_year":2003,"publication_date":"2003-01-20","ids":{"openalex":"https://openalex.org/W2146400304","doi":"https://doi.org/10.1109/vtest.1999.766703","mag":"2146400304"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.1999.766703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1999.766703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076102072","display_name":"Maurizio Rebaudengo","orcid":"https://orcid.org/0000-0002-7135-7694"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Rebaudengo","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","[Dipt. di Autom. e Inf., Politecnico di Torino, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"[Dipt. di Autom. e Inf., Politecnico di Torino, Italy]","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","POLYTECHNIC UNIVERSITY OF TURIN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"POLYTECHNIC UNIVERSITY OF TURIN","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"452","last_page":"457"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.915607750415802},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7457075119018555},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.6990227103233337},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6747344136238098},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6712727546691895},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6506341695785522},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.6399109959602356},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5818213224411011},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5344176888465881},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.49884605407714844},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4851113557815552},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.451968252658844},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4266946017742157},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21723583340644836},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.202652245759964},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.17469432950019836}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.915607750415802},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7457075119018555},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.6990227103233337},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6747344136238098},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6712727546691895},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6506341695785522},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.6399109959602356},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5818213224411011},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5344176888465881},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.49884605407714844},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4851113557815552},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.451968252658844},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4266946017742157},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21723583340644836},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.202652245759964},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.17469432950019836},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vtest.1999.766703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1999.766703","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:2500925","is_oa":false,"landing_page_url":"http://porto.polito.it/2500925/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1500893261","https://openalex.org/W1634661032","https://openalex.org/W1784910285","https://openalex.org/W1927459197","https://openalex.org/W1964073704","https://openalex.org/W2072194206","https://openalex.org/W2098473740","https://openalex.org/W2098513789","https://openalex.org/W2100307454","https://openalex.org/W2127894564","https://openalex.org/W2138293202","https://openalex.org/W2148602057","https://openalex.org/W4235799760"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2138861322","https://openalex.org/W2082366402","https://openalex.org/W2083209667","https://openalex.org/W2120242933","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":{"Fault":[0],"injection":[1,45,63,69,90,130],"is":[2,48],"a":[3,43,61,87,107,117],"viable":[4],"solution":[5],"for":[6,41,126],"verifying":[7],"the":[8,26,29,55,68,72,80,119],"correct":[9],"design":[10],"and":[11,21,39,78,99,136],"implementation":[12],"of":[13,28,54,86,94,147],"fault":[14,44,62,73,89,129],"tolerance":[15],"mechanisms":[16],"at":[17],"different":[18],"levels":[19],"(hardware":[20],"software).":[22],"The":[23,84,104],"paper":[24],"discusses":[25],"use":[27],"background":[30],"diagnostic":[31],"mode":[32],"(BDM),":[33],"available":[34],"on":[35,132],"several":[36],"Motorola":[37],"microprocessors":[38],"microcontrollers,":[40],"implementing":[42,127],"environment.":[46],"BDM":[47],"well":[49,124],"suited":[50,125],"to":[51,112,122],"implement":[52],"some":[53],"most":[56],"critical":[57],"operations":[58],"required":[59],"by":[60],"environment,":[64],"such":[65],"as":[66],"activating":[67],"procedure,":[70],"injecting":[71],"in":[74,92,145],"memory":[75],"or":[76],"registers,":[77],"observing":[79],"faulty":[81],"system":[82,100],"behavior.":[83],"characteristics":[85],"BDM-based":[88],"environment":[91,109],"terms":[93,146],"intrusiveness,":[95],"flexibility,":[96],"time":[97,149],"efficiency,":[98],"requirements":[101],"are":[102,141],"analyzed.":[103],"authors":[105],"exploit":[106],"prototypical":[108],"they":[110],"implemented":[111],"validate":[113],"this":[114],"analysis.":[115],"As":[116],"result,":[118],"approach":[120],"appears":[121],"be":[123],"low-cost":[128],"experiments":[131],"simple":[133],"embedded":[134],"microprocessor-":[135],"microcontroller-based":[137],"boards.":[138],"Some":[139],"limitations":[140],"also":[142],"outlined,":[143],"mostly":[144],"execution":[148],"slow-down.":[150]},"counts_by_year":[{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}