{"id":"https://openalex.org/W89446158","doi":"https://doi.org/10.1109/vtest.1998.670876","title":"Mixed signal DFT at GHz frequencies","display_name":"Mixed signal DFT at GHz frequencies","publication_year":2002,"publication_date":"2002-11-27","ids":{"openalex":"https://openalex.org/W89446158","doi":"https://doi.org/10.1109/vtest.1998.670876","mag":"89446158"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.1998.670876","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1998.670876","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002460896","display_name":"R. Mason","orcid":"https://orcid.org/0000-0002-1260-6451"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"R. Mason","raw_affiliation_strings":["Carleton University, Ottawa, ONT, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carleton University, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070464448","display_name":"Shuai Ma","orcid":"https://orcid.org/0000-0001-9168-3131"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Ma","raw_affiliation_strings":["Cadabra, Nepean, ONT, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cadabra, Nepean, ONT, Canada","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"245","last_page":"251"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/undersampling","display_name":"Undersampling","score":0.9814181327819824},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.615426242351532},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6042285561561584},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5948032140731812},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5845104455947876},{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.577254056930542},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5393736958503723},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5041102170944214},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4786180853843689},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.46723324060440063},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4104440212249756},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2801036238670349},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23683035373687744},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18121564388275146},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10134837031364441},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.07737067341804504}],"concepts":[{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.9814181327819824},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.615426242351532},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6042285561561584},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5948032140731812},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5845104455947876},{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.577254056930542},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5393736958503723},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5041102170944214},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4786180853843689},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.46723324060440063},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4104440212249756},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2801036238670349},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23683035373687744},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18121564388275146},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10134837031364441},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.07737067341804504},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.1998.670876","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1998.670876","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W643008456","https://openalex.org/W1560200347","https://openalex.org/W1767020226","https://openalex.org/W1901574727","https://openalex.org/W1974887607","https://openalex.org/W2044219616","https://openalex.org/W2096020190","https://openalex.org/W2097350134","https://openalex.org/W2109125616","https://openalex.org/W2119877269","https://openalex.org/W2983329332","https://openalex.org/W4229544539","https://openalex.org/W6633458637","https://openalex.org/W6770174411"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2118869825","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W1925788181"],"abstract_inverted_index":{"A":[0],"high":[1,30,96],"frequency":[2],"analog":[3,32,84],"IC":[4],"testing":[5,98],"technique":[6,40],"using":[7,46],"a":[8,13,47,82],"periodic":[9],"input":[10],"stimuli":[11],"and":[12,80,99,109],"sequential":[14],"undersampling":[15,39,103],"algorithm":[16,21],"has":[17],"been":[18],"developed.":[19],"This":[20,54,90],"overcomes":[22],"many":[23],"of":[24,37,63,71],"the":[25,38,61,64,69],"loading":[26],"problems":[27],"associated":[28],"with":[29],"speed":[31,97],"signal":[33],"testing.":[34],"The":[35],"utility":[36],"was":[41],"shown":[42],"in":[43,106],"previous":[44],"work":[45,58],"1.2":[48],"/spl":[49],"mu/m":[50],"CMOS":[51],"prototype":[52],"IC.":[53],"paper":[55],"expands":[56],"that":[57],"by":[59],"improving":[60],"performance":[62],"original":[65],"sampling":[66,107],"circuits,":[67],"investigating":[68],"possibility":[70],"generating":[72],"control":[73],"signals":[74],"on-chip":[75],"to":[76],"reduce":[77],"test":[78],"cost,":[79],"developing":[81],"structured":[83],"Design":[85],"For":[86],"Testability":[87],"(DFT)":[88],"approach.":[89],"approach":[91],"can":[92],"be":[93],"used":[94,105],"for":[95],"is":[100],"based":[101],"upon":[102],"techniques":[104],"oscilloscopes":[108],"mixed-signal":[110],"testers.":[111]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}