{"id":"https://openalex.org/W2170132164","doi":"https://doi.org/10.1109/vtest.1994.292280","title":"Boundary-scan: beyond production test","display_name":"Boundary-scan: beyond production test","publication_year":2002,"publication_date":"2002-12-17","ids":{"openalex":"https://openalex.org/W2170132164","doi":"https://doi.org/10.1109/vtest.1994.292280","mag":"2170132164"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.1994.292280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1994.292280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035900322","display_name":"R.M. Sedmark","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"R.M. Sedmark","raw_affiliation_strings":["Self-Test Services, Ambler, PA, USA"],"affiliations":[{"raw_affiliation_string":"Self-Test Services, Ambler, PA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5035900322"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7155,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.90996992,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"415","last_page":"420"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.7588793635368347},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.7578927278518677},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.6191322207450867},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5603867769241333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5511363744735718},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5156020522117615},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4935504198074341},{"id":"https://openalex.org/keywords/phase-boundary","display_name":"Phase boundary","score":0.44092857837677},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4402112066745758},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.42924758791923523},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16842016577720642},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.15748906135559082},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1225263774394989},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.11447682976722717},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0981922447681427},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08962765336036682}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.7588793635368347},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.7578927278518677},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.6191322207450867},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5603867769241333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5511363744735718},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5156020522117615},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4935504198074341},{"id":"https://openalex.org/C188324986","wikidata":"https://www.wikidata.org/wiki/Q7180938","display_name":"Phase boundary","level":3,"score":0.44092857837677},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4402112066745758},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.42924758791923523},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16842016577720642},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.15748906135559082},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1225263774394989},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.11447682976722717},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0981922447681427},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08962765336036682},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.1994.292280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1994.292280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1580093467","https://openalex.org/W1834494688","https://openalex.org/W1888065395","https://openalex.org/W1898228168","https://openalex.org/W2143334303","https://openalex.org/W2150234131","https://openalex.org/W2163748468","https://openalex.org/W4251744051"],"related_works":["https://openalex.org/W2379280877","https://openalex.org/W2001654810","https://openalex.org/W2538042735","https://openalex.org/W1484535011","https://openalex.org/W2172081922","https://openalex.org/W2083969764","https://openalex.org/W2105797754","https://openalex.org/W3151669388","https://openalex.org/W1497704817","https://openalex.org/W2162740853"],"abstract_inverted_index":{"The":[0],"use":[1],"of":[2,15,31,38,57],"boundary-scan,":[3],"as":[4],"specified":[5],"in":[6],"IEEE":[7],"1149.1-1990,":[8],"has":[9],"always":[10],"been":[11],"considered":[12],"a":[13,39],"source":[14],"major":[16],"benefits":[17],"for":[18],"the":[19],"production":[20],"test":[21],"process.":[22],"However,":[23],"there":[24],"are":[25],"many":[26],"existing":[27],"and":[28,44,47],"potential":[29],"applications":[30],"boundary-scan":[32,58],"during":[33],"other":[34],"life":[35],"cycle":[36],"phases":[37,56],"product/spl":[40],"minus/the":[41],"design":[42],"phase":[43],"field":[45],"operation":[46],"support":[48],"phase.":[49],"This":[50],"paper":[51],"focuses":[52],"on":[53],"these":[54],"additional":[55],"application.<":[59],"<ETX":[60],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[61],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">&gt;</ETX>":[62]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}