{"id":"https://openalex.org/W2164177689","doi":"https://doi.org/10.1109/vtest.1991.208151","title":"Guardbanding VLSI EEPROM test programs","display_name":"Guardbanding VLSI EEPROM test programs","publication_year":2002,"publication_date":"2002-12-09","ids":{"openalex":"https://openalex.org/W2164177689","doi":"https://doi.org/10.1109/vtest.1991.208151","mag":"2164177689"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.1991.208151","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1991.208151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022243004","display_name":"Dominic Sweetman","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"D. Sweetman","raw_affiliation_strings":["SEEQ Technology, Inc., USA"],"affiliations":[{"raw_affiliation_string":"SEEQ Technology, Inc., USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5022243004"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.23289724,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"155","last_page":"160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.949313759803772},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6866245269775391},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6336959004402161},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6070845723152161},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5014829635620117},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.4742119610309601},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4114438593387604},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3754161596298218},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3581206798553467},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35257720947265625},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.3504209518432617},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.329522967338562},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32794150710105896},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3212137818336487},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18450850248336792},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16458174586296082},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1241503655910492}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.949313759803772},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6866245269775391},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6336959004402161},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6070845723152161},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5014829635620117},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.4742119610309601},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4114438593387604},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3754161596298218},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3581206798553467},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35257720947265625},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3504209518432617},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.329522967338562},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32794150710105896},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3212137818336487},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18450850248336792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16458174586296082},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1241503655910492},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.1991.208151","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.1991.208151","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","score":0.5799999833106995,"display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2140690871"],"related_works":["https://openalex.org/W4383094693","https://openalex.org/W3140922657","https://openalex.org/W2140342184","https://openalex.org/W2054390317","https://openalex.org/W2736956110","https://openalex.org/W2053998373","https://openalex.org/W2347856085","https://openalex.org/W2358154930","https://openalex.org/W2543283504","https://openalex.org/W2063781848"],"abstract_inverted_index":{"The":[0,13,25,90],"test":[1,20,46,68,72],"and":[2,23,28,33,37,60,67],"guardband":[3],"philosophy":[4,14,29],"is":[5,41],"essential":[6],"in":[7,58],"the":[8,16,31,42,54,75,85,93],"manufacturing":[9],"of":[10,44,95],"integrated":[11],"circuits.":[12],"integrates":[15],"general":[17],"rules":[18],"for":[19,35,87,97],"sequences,":[21],"hardware,":[22],"software.":[24],"data":[26],"sheet":[27],"determine":[30],"values":[32],"methodology":[34],"parameter":[36],"functional":[38],"tests.":[39],"Guardbanding":[40],"off-setting":[43],"a":[45,103],"parameter,":[47],"condition,":[48],"or":[49,78],"attribute":[50,88],"acceptance":[51],"level":[52],"from":[53,81],"specified":[55,83],"value.":[56],"Variability":[57],"equipment":[59],"device":[61],"performance":[62],"necessitate":[63],"machine":[64],"guardbands.":[65],"Device":[66],"program":[69],"guardbands":[70,86,96],"improve":[71],"productivity.":[73],"Changing":[74],"applied,":[76],"measured,":[77],"external":[79],"conditions":[80],"those":[82],"implements":[84],"testing.":[89],"author":[91],"addresses":[92],"use":[94],"an":[98],"MOS":[99],"VLSI":[100],"EEPROM,":[101],"i.e.":[102],"nonvolatile":[104],"reprogrammable":[105],"memory.<":[106],"<ETX":[107],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[108],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">&gt;</ETX>":[109]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}