{"id":"https://openalex.org/W4401880065","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631557","title":"A 512\u00d7512 SPAD Laser Speckle Autocorrelation Imager in Stacked 65/40nm CMOS","display_name":"A 512\u00d7512 SPAD Laser Speckle Autocorrelation Imager in Stacked 65/40nm CMOS","publication_year":2024,"publication_date":"2024-06-16","ids":{"openalex":"https://openalex.org/W4401880065","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631557"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020996970","display_name":"Francescopaolo Mattioli Della Rocca","orcid":"https://orcid.org/0000-0001-8558-3185"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Francescopaolo Mattioli Della Rocca","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062191670","display_name":"Edbert J. Sie","orcid":"https://orcid.org/0000-0003-3477-6459"},"institutions":[{"id":"https://openalex.org/I4210114444","display_name":"Meta (United States)","ror":"https://ror.org/01zbnvs85","country_code":"US","type":"company","lineage":["https://openalex.org/I4210114444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edbert J. Sie","raw_affiliation_strings":["Reality Labs Research, Meta Platforms Inc.,Menlo Park,USA"],"affiliations":[{"raw_affiliation_string":"Reality Labs Research, Meta Platforms Inc.,Menlo Park,USA","institution_ids":["https://openalex.org/I4210114444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001069449","display_name":"Ahmet T. Erdogan","orcid":"https://orcid.org/0000-0003-2451-9395"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ahmet T. Erdogan","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114213912","display_name":"Lars Fisher","orcid":null},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Lars Fisher","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024709213","display_name":"Andrew B. Matheson","orcid":"https://orcid.org/0000-0002-9391-6469"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Andrew B. Matheson","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044345216","display_name":"Neil Finlayson","orcid":"https://orcid.org/0000-0003-1598-9563"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Neil Finlayson","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056218539","display_name":"Alistair Gorman","orcid":null},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alistair Gorman","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081151296","display_name":"Istv\u00e1n Gy\u00f6ngy","orcid":"https://orcid.org/0000-0003-3931-7972"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Istvan Gyongy","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033429587","display_name":"Hanning Mai","orcid":"https://orcid.org/0000-0002-9300-0709"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Hanning Mai","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106737432","display_name":"Thierry Lachaud","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thierry Lachaud","raw_affiliation_strings":["STMicroelectronics R&D"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics R&D","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111301663","display_name":"R.S. Forsyth","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Russell Forsyth","raw_affiliation_strings":["STMicroelectronics R&D"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics R&D","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047834096","display_name":"Francesco Marsili","orcid":"https://orcid.org/0000-0003-0209-172X"},"institutions":[{"id":"https://openalex.org/I4210114444","display_name":"Meta (United States)","ror":"https://ror.org/01zbnvs85","country_code":"US","type":"company","lineage":["https://openalex.org/I4210114444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francesco Marsili","raw_affiliation_strings":["Reality Labs Research, Meta Platforms Inc.,Menlo Park,USA"],"affiliations":[{"raw_affiliation_string":"Reality Labs Research, Meta Platforms Inc.,Menlo Park,USA","institution_ids":["https://openalex.org/I4210114444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103198569","display_name":"Robert K. Henderson","orcid":"https://orcid.org/0000-0002-0398-7520"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Robert K. Henderson","raw_affiliation_strings":["School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK"],"affiliations":[{"raw_affiliation_string":"School of Engineering, The University of Edinburgh,Edinburgh,Scotland,UK","institution_ids":["https://openalex.org/I98677209"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5020996970"],"corresponding_institution_ids":["https://openalex.org/I98677209"],"apc_list":null,"apc_paid":null,"fwci":3.8761,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.93887957,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autocorrelation","display_name":"Autocorrelation","score":0.7873783111572266},{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.7830901145935059},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6796122193336487},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.44752585887908936},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43427643179893494},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.396409273147583},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3143253028392792},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2824578285217285},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.26211321353912354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1660100817680359},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10273054242134094}],"concepts":[{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.7873783111572266},{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.7830901145935059},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6796122193336487},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.44752585887908936},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43427643179893494},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.396409273147583},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3143253028392792},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2824578285217285},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.26211321353912354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1660100817680359},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10273054242134094}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1884413048","display_name":null,"funder_award_id":"EP/R005257/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2032208697","https://openalex.org/W3130907114","https://openalex.org/W4238312091","https://openalex.org/W4313462335","https://openalex.org/W4317906205","https://openalex.org/W4376223777"],"related_works":["https://openalex.org/W2793402697","https://openalex.org/W2019193285","https://openalex.org/W747394405","https://openalex.org/W2042019967","https://openalex.org/W4391491570","https://openalex.org/W2157133621","https://openalex.org/W4386174346","https://openalex.org/W2093785611","https://openalex.org/W4224073133","https://openalex.org/W1597124277"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,26,41],"single-photon":[3],"avalanche":[4],"diode":[5],"(SPAD)":[6],"autocorrelation":[7,34],"imager":[8],"implemented":[9],"in":[10,78],"65/40nm":[11],"3D-stacked":[12],"CMOS":[13],"for":[14],"laser":[15],"speckle":[16],"blood":[17,76],"flow":[18,77],"monitoring.":[19],"The":[20],"shared":[21],"per-pixel":[22],"SRAM":[23],"architecture":[24],"provides":[25],"compact":[27],"41.68":[28],"\u00b5m":[29],"pitch":[30],"128\u00d7128":[31],"resolution":[32],"parallel":[33],"function":[35],"operating":[36],"at":[37],"0.5T":[38],"Op/s":[39],"and":[40,56],"lag-time":[42],"of":[43,66],"1":[44],"\u00b5s.":[45],"SNR":[46],"gains":[47],"due":[48],"to":[49,62,70],"high":[50],"BSI":[51],"SP":[52],"AD":[53],"NIR":[54],"sensitivity":[55,68],"on-chip":[57],"averaging":[58],"extends":[59],"source-detector":[60],"separation":[61],"40":[63],"mm":[64],"indicative":[65],"the":[67],"required":[69],"discriminate":[71],"extracerebral":[72],"artifacts":[73],"from":[74],"deep-tissue":[75],"future":[79],"wearable":[80],"neuromonitoring":[81],"systems.":[82]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}