{"id":"https://openalex.org/W4252024347","doi":"https://doi.org/10.1109/vlsi-dat.2015.7114564","title":"The sum of the parts: Overcoming leading edge design challenges by working in partnership","display_name":"The sum of the parts: Overcoming leading edge design challenges by working in partnership","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W4252024347","doi":"https://doi.org/10.1109/vlsi-dat.2015.7114564"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2015.7114564","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2015.7114564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design, Automation and Test(VLSI-DAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105122907","display_name":"Tim Whitfield","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Tim Whitfield","raw_affiliation_strings":["ARM, Taiwan"],"affiliations":[{"raw_affiliation_string":"ARM, Taiwan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5105122907"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.32666486,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.6266999840736389,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.6266999840736389,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6154999732971191,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.6129000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/general-partnership","display_name":"General partnership","score":0.690098762512207},{"id":"https://openalex.org/keywords/server","display_name":"Server","score":0.64999920129776},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6255183219909668},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.572877049446106},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4890306890010834},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.33260267972946167},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3269256353378296},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.32437941431999207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30198970437049866},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2996877133846283},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.18515869975090027},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1021747887134552}],"concepts":[{"id":"https://openalex.org/C71750763","wikidata":"https://www.wikidata.org/wiki/Q646164","display_name":"General partnership","level":2,"score":0.690098762512207},{"id":"https://openalex.org/C93996380","wikidata":"https://www.wikidata.org/wiki/Q44127","display_name":"Server","level":2,"score":0.64999920129776},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6255183219909668},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.572877049446106},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4890306890010834},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.33260267972946167},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3269256353378296},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.32437941431999207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30198970437049866},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2996877133846283},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.18515869975090027},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1021747887134552},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2015.7114564","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2015.7114564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design, Automation and Test(VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2388464034","https://openalex.org/W2533125852","https://openalex.org/W2140460949","https://openalex.org/W2105580438","https://openalex.org/W2739852106","https://openalex.org/W2057435755","https://openalex.org/W2018782216","https://openalex.org/W2949620858","https://openalex.org/W2770877918","https://openalex.org/W1989375655"],"abstract_inverted_index":{"Providing":[0],"IP":[1],"in":[2],"today's":[3],"fast":[4],"moving":[5],"technology":[6],"industry":[7],"means":[8],"much":[9],"more":[10],"than":[11],"just":[12],"delivering":[13],"RTL.":[14],"All":[15],"of":[16,42],"ARM's":[17],"partners":[18,54],"are":[19,37],"under":[20],"pressure":[21],"to":[22,27,56,63],"produce":[23],"increasingly":[24],"advanced":[25,43],"products":[26,59],"ever":[28],"demanding":[29],"consumers,":[30],"whilst":[31],"pressures":[32],"on":[33],"cost":[34],"and":[35,46],"timescales":[36],"also":[38],"increasing.":[39],"The":[40],"complexities":[41],"process":[44],"nodes":[45],"increasing":[47],"functionality":[48],"compound":[49],"the":[50],"problem":[51],"as":[52],"our":[53],"try":[55],"provide":[57],"innovative":[58],"from":[60],"tiny":[61],"sensors":[62],"powerful":[64],"servers.":[65]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}