{"id":"https://openalex.org/W4391327736","doi":"https://doi.org/10.1109/vcip59821.2023.10402682","title":"Distance Weighted Refining Segmentation Method for Visual Quality Improvement in V-PCC","display_name":"Distance Weighted Refining Segmentation Method for Visual Quality Improvement in V-PCC","publication_year":2023,"publication_date":"2023-12-04","ids":{"openalex":"https://openalex.org/W4391327736","doi":"https://doi.org/10.1109/vcip59821.2023.10402682"},"language":"en","primary_location":{"id":"doi:10.1109/vcip59821.2023.10402682","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vcip59821.2023.10402682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Visual Communications and Image Processing (VCIP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043902098","display_name":"Min Ku Lee","orcid":"https://orcid.org/0000-0001-6378-2407"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Min Ku Lee","raw_affiliation_strings":["Korea Electronics Technology Institute,Intelligent Image Processing Research Center,Seongnam-si,Korea","Intelligent Image Processing Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,Intelligent Image Processing Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"Intelligent Image Processing Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100614045","display_name":"Yong-Hwan Kim","orcid":"https://orcid.org/0000-0003-3323-0323"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Hwan Kim","raw_affiliation_strings":["Korea Electronics Technology Institute,Intelligent Image Processing Research Center,Seongnam-si,Korea","Intelligent Image Processing Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,Intelligent Image Processing Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"Intelligent Image Processing Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043902098"],"corresponding_institution_ids":["https://openalex.org/I4210131650"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19532627,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/refining","display_name":"Refining (metallurgy)","score":0.7209365367889404},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7070042490959167},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5918934941291809},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5380055904388428},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5053418278694153},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.45549118518829346},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4163094460964203},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3670276403427124},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.049726784229278564}],"concepts":[{"id":"https://openalex.org/C60044698","wikidata":"https://www.wikidata.org/wiki/Q1283324","display_name":"Refining (metallurgy)","level":2,"score":0.7209365367889404},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7070042490959167},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5918934941291809},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5380055904388428},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5053418278694153},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.45549118518829346},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4163094460964203},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3670276403427124},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.049726784229278564},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vcip59821.2023.10402682","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vcip59821.2023.10402682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Visual Communications and Image Processing (VCIP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2941750291","https://openalex.org/W3166009041","https://openalex.org/W3192639358"],"related_works":["https://openalex.org/W2392526918","https://openalex.org/W2019560916","https://openalex.org/W2362540361","https://openalex.org/W2361983698","https://openalex.org/W2347697528","https://openalex.org/W2354123794","https://openalex.org/W2372508235","https://openalex.org/W2560036917","https://openalex.org/W2349506406","https://openalex.org/W1522196789"],"abstract_inverted_index":{"In":[0,83],"this":[1],"paper,":[2],"we":[3],"propose":[4,109],"an":[5,27,50],"innovative":[6],"method":[7,11,115],"for":[8],"refining":[9,87,113],"segmentation":[10,88,114],"that":[12,96,116],"improves":[13],"the":[14,71,86,90,99,118],"visual":[15,54,125,134],"quality":[16,55,135],"of":[17,53,89,120],"Video-based":[18],"Point":[19],"Cloud":[20],"Compression":[21],"(V-PCC)":[22],"encoder.":[23],"Recently":[24],"standardized":[25],"as":[26],"international":[28],"standard":[29,33],"by":[30],"MPEG,":[31],"V-PCC":[32,47,72],"provides":[34],"state-of-the-art":[35],"performance":[36],"in":[37,70,85,133],"compressing":[38],"dynamic":[39],"and":[40],"dense":[41],"point":[42,65,78],"cloud":[43,66,79],"object.":[44],"However,":[45],"lossy":[46],"encoder":[48],"has":[49],"unavoidable":[51],"problem":[52],"degradation":[56],"due":[57,102],"to":[58,67,103,123],"lost":[59],"points.":[60],"When":[61],"converting":[62],"a":[63,77,110,130],"3D":[64],"2D":[68,91],"patches":[69],"encoder,":[73],"some":[74],"points":[75,95,122],"constituting":[76],"are":[80,97],"not":[81],"converted.":[82],"particular,":[84],"patch":[92],"generation":[93],"process,":[94],"changed":[98],"projection":[100],"plane":[101],"over-smoothing":[104],"can":[105],"be":[106],"discarded.":[107],"We":[108],"distance":[111],"weighted":[112],"reduces":[117],"number":[119],"missed":[121],"improve":[124],"quality.":[126],"Experimental":[127],"results":[128],"show":[129],"noticeable":[131],"improvement":[132],"with":[136],"minor":[137],"coding":[138],"gain.":[139]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}