{"id":"https://openalex.org/W4385489554","doi":"https://doi.org/10.1109/tr.2023.3273082","title":"A Prognosis-Centered Intelligent Maintenance Optimization Framework Under Uncertain Failure Threshold","display_name":"A Prognosis-Centered Intelligent Maintenance Optimization Framework Under Uncertain Failure Threshold","publication_year":2023,"publication_date":"2023-08-02","ids":{"openalex":"https://openalex.org/W4385489554","doi":"https://doi.org/10.1109/tr.2023.3273082"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2023.3273082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3273082","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038114094","display_name":"Li Yang","orcid":"https://orcid.org/0000-0002-4738-0210"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Li Yang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4738-0210","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068255519","display_name":"Yi Chen","orcid":"https://orcid.org/0000-0002-0934-0787"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Chen","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0934-0787","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032957857","display_name":"Xiaobing Ma","orcid":"https://orcid.org/0000-0002-0913-9012"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobing Ma","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0913-9012","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019417978","display_name":"Qingan Qiu","orcid":"https://orcid.org/0000-0001-8741-0536"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingan Qiu","raw_affiliation_strings":["School of Management and Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8741-0536","affiliations":[{"raw_affiliation_string":"School of Management and Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081036659","display_name":"Rui Peng","orcid":"https://orcid.org/0000-0001-6596-0334"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Peng","raw_affiliation_strings":["School of Economics and Management, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-6596-0334","affiliations":[{"raw_affiliation_string":"School of Economics and Management, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5038114094"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":19.1795,"has_fulltext":false,"cited_by_count":98,"citation_normalized_percentile":{"value":0.99850491,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"73","issue":"1","first_page":"115","last_page":"130"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.7608828544616699},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7407243847846985},{"id":"https://openalex.org/keywords/condition-based-maintenance","display_name":"Condition-based maintenance","score":0.7022699117660522},{"id":"https://openalex.org/keywords/maintenance-actions","display_name":"Maintenance actions","score":0.6029073596000671},{"id":"https://openalex.org/keywords/optimal-maintenance","display_name":"Optimal maintenance","score":0.5679595470428467},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.5465027689933777},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5011827945709229},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.4829365611076355},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4818231165409088},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4242687225341797},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.41935116052627563},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1440630853176117},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.13456764817237854}],"concepts":[{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.7608828544616699},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7407243847846985},{"id":"https://openalex.org/C2776907094","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Condition-based maintenance","level":2,"score":0.7022699117660522},{"id":"https://openalex.org/C2778814095","wikidata":"https://www.wikidata.org/wiki/Q6736790","display_name":"Maintenance actions","level":2,"score":0.6029073596000671},{"id":"https://openalex.org/C2776671899","wikidata":"https://www.wikidata.org/wiki/Q7098945","display_name":"Optimal maintenance","level":2,"score":0.5679595470428467},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.5465027689933777},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5011827945709229},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.4829365611076355},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4818231165409088},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4242687225341797},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.41935116052627563},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1440630853176117},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.13456764817237854},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2023.3273082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3273082","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.699999988079071}],"awards":[{"id":"https://openalex.org/G2133658867","display_name":null,"funder_award_id":"72101010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7875718932","display_name":null,"funder_award_id":"72001026","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1566045017","https://openalex.org/W1978450991","https://openalex.org/W2010393165","https://openalex.org/W2112935810","https://openalex.org/W2293772046","https://openalex.org/W2398187068","https://openalex.org/W2751701569","https://openalex.org/W2791384746","https://openalex.org/W2792483925","https://openalex.org/W2803205874","https://openalex.org/W2900019985","https://openalex.org/W3018718829","https://openalex.org/W3023426396","https://openalex.org/W3033721775","https://openalex.org/W3033873024","https://openalex.org/W3034763826","https://openalex.org/W3036269430","https://openalex.org/W3037872117","https://openalex.org/W3045162186","https://openalex.org/W3106684196","https://openalex.org/W3133229138","https://openalex.org/W3169289106","https://openalex.org/W3194674212","https://openalex.org/W3204492588","https://openalex.org/W4205745682","https://openalex.org/W4206835608","https://openalex.org/W4224491628","https://openalex.org/W4283517257","https://openalex.org/W4296982214","https://openalex.org/W4319866196","https://openalex.org/W6633761756"],"related_works":["https://openalex.org/W3049049469","https://openalex.org/W2133779003","https://openalex.org/W2154660294","https://openalex.org/W2585580176","https://openalex.org/W1610391226","https://openalex.org/W4385489554","https://openalex.org/W3187804119","https://openalex.org/W2018583472","https://openalex.org/W2160198307","https://openalex.org/W2044322963"],"abstract_inverted_index":{"Condition-based":[0],"maintenance":[1,54,79,141,175,185],"(CBM),":[2],"as":[3,25,124,126],"a":[4,63,86,180],"key":[5],"component":[6],"of":[7,20,43,53,99,139,156,168,187],"asset":[8],"health":[9],"management,":[10],"is":[11,40,83,94,106,118,150],"crucial":[12],"to":[13,73,108,113,142],"enhance":[14],"the":[15,41,51,91,97,121,137,153,157,169],"operational":[16,147],"safety":[17,129,164],"and":[18,77,90,111,163],"availability":[19],"diverse":[21],"mechatronic":[22],"systems,":[23],"such":[24,59],"railway":[26],"vehicles,":[27],"wind":[28],"power":[29],"equipment,":[30],"nuclear":[31],"devices,":[32],"etc.":[33],"A":[34,102],"common":[35],"phenomenon":[36],"observed":[37],"in":[38,134],"CBM":[39,66],"existence":[42],"dispersibility":[44],"regarding":[45],"degradation-induced":[46],"failure":[47],"threshold,":[48,162],"which":[49,68],"affects":[50],"precision":[52],"decisions.":[55],"This":[56],"article":[57],"addresses":[58],"challenges":[60],"by":[61,85,120,179],"scheduling":[62],"prognosis-centered":[64],"intelligent":[65],"policy,":[67],"harnesses":[69],"dynamic":[70,103],"lifetime":[71,92,123],"information":[72],"support":[74],"both":[75],"scheduled":[76],"opportunistic":[78,140],"decision-making.":[80],"The":[81,131,146,166],"degradation":[82],"characterized":[84],"generalized-form":[87],"stochastic":[88],"process,":[89],"distribution":[93],"assessed":[95],"through":[96,152],"fusion":[98],"multiple":[100],"uncertainties.":[101],"reliability":[104,161],"criterion":[105],"set":[107],"determine":[109],"whether":[110],"when":[112],"postpone":[114],"maintenance,":[115],"whose":[116],"interval":[117],"controlled":[119],"remaining":[122],"well":[125],"an":[127],"optimizable":[128],"coefficient.":[130,165],"postponement":[132],"interval,":[133,159],"turn,":[135],"enables":[136],"planning":[138,186],"mitigate":[143],"system":[144],"downtime.":[145],"cost":[148],"rate":[149],"minimized":[151],"joint":[154],"optimization":[155],"inspection":[158],"conditional":[160],"superiorities":[167],"proposed":[170],"policy":[171],"over":[172],"some":[173],"conventional/heuristic":[174],"policies":[176],"are":[177],"demonstrated":[178],"case":[181],"study":[182],"on":[183],"filed":[184],"high-speed":[188],"train":[189],"bearing.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":9},{"year":2025,"cited_by_count":36},{"year":2024,"cited_by_count":41},{"year":2023,"cited_by_count":12}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}