{"id":"https://openalex.org/W4366371074","doi":"https://doi.org/10.1109/tr.2023.3264943","title":"Fault Tree Analysis Including Component Dependencies","display_name":"Fault Tree Analysis Including Component Dependencies","publication_year":2023,"publication_date":"2023-04-19","ids":{"openalex":"https://openalex.org/W4366371074","doi":"https://doi.org/10.1109/tr.2023.3264943"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2023.3264943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3264943","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://nottingham-repository.worktribe.com/preview/20286249/Fault%20Tree%20Analysis%20Including%20Component%20Dependencies%20IEEE.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022661420","display_name":"Silvia Tolo","orcid":"https://orcid.org/0000-0003-3547-7012"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Silvia Tolo","raw_affiliation_strings":["Resilience Engineering Research Group, University of Nottingham, Nottingham, U.K"],"raw_orcid":"https://orcid.org/0000-0003-3547-7012","affiliations":[{"raw_affiliation_string":"Resilience Engineering Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004278876","display_name":"John Andrews","orcid":"https://orcid.org/0000-0002-2316-3959"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"John Andrews","raw_affiliation_strings":["Resilience Engineering Research Group, University of Nottingham, Nottingham, U.K"],"raw_orcid":"https://orcid.org/0000-0002-2316-3959","affiliations":[{"raw_affiliation_string":"Resilience Engineering Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142263535"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":4.8842,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.9836525,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"73","issue":"1","first_page":"413","last_page":"421"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.7383249998092651},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6120588183403015},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6105720400810242},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4913746416568756},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4535145163536072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19367864727973938},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.16558799147605896}],"concepts":[{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.7383249998092651},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6120588183403015},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6105720400810242},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4913746416568756},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4535145163536072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19367864727973938},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.16558799147605896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2023.3264943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3264943","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:nottingham-repository.worktribe.com:20286250","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/20286250","pdf_url":"https://nottingham-repository.worktribe.com/preview/20286249/Fault%20Tree%20Analysis%20Including%20Component%20Dependencies%20IEEE.pdf","source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"},{"id":"pmh:oai:nottingham-repository.worktribe.com:10916495","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/10916495","pdf_url":null,"source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Presentation / Conference Contribution"}],"best_oa_location":{"id":"pmh:oai:nottingham-repository.worktribe.com:20286250","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/20286250","pdf_url":"https://nottingham-repository.worktribe.com/preview/20286249/Fault%20Tree%20Analysis%20Including%20Component%20Dependencies%20IEEE.pdf","source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"},"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320310833","display_name":"Lloyd's Register Foundation","ror":"https://ror.org/057q4mw47"},{"id":"https://openalex.org/F4320325699","display_name":"Lloyd's Register","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4366371074.pdf","grobid_xml":"https://content.openalex.org/works/W4366371074.grobid-xml"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W156132702","https://openalex.org/W1596778355","https://openalex.org/W1969883598","https://openalex.org/W2042206224","https://openalex.org/W2050984657","https://openalex.org/W2056268283","https://openalex.org/W2074897389","https://openalex.org/W2113355185","https://openalex.org/W2136245106","https://openalex.org/W2147029036","https://openalex.org/W2154884120","https://openalex.org/W2620928019","https://openalex.org/W2794149938","https://openalex.org/W4229514253","https://openalex.org/W4234428022","https://openalex.org/W4299835756","https://openalex.org/W4304187219","https://openalex.org/W4308780249"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2022683204","https://openalex.org/W4300939757","https://openalex.org/W2962655934","https://openalex.org/W2067279514","https://openalex.org/W3144902966"],"abstract_inverted_index":{"Fault":[0],"Tree":[1],"(FT)":[2],"analysis":[3,49,101],"is":[4,22,70,78,122,136],"not":[5,80],"only":[6],"the":[7,16,34,71,83,87,100,116],"most":[8,66],"common":[9],"technique":[10],"used":[11],"in":[12,53,62,138],"engineering":[13,88],"practice":[14],"for":[15,33,99,105,129],"estimation":[17],"of":[18,42,58,68,73,86,102,118],"system":[19],"reliability,":[20],"but":[21],"also":[23],"a":[24,55,96,125],"key":[25],"tool":[26],"shared":[27],"between":[28],"designers,":[29],"analysts,":[30],"and":[31,37,108,133],"regulators":[32],"safe":[35],"operation":[36],"licensing":[38],"purposes.":[39],"In":[40],"spite":[41],"its":[43],"long":[44],"lasting":[45],"success,":[46],"traditional":[47],"FT":[48],"presents":[50],"significant":[51],"limitations":[52],"modeling":[54,91],"wide":[56],"range":[57],"features":[59],"frequently":[60],"encountered":[61],"modern":[63],"systems.":[64],"The":[65,111],"critical":[67],"these":[69],"assumption":[72],"failure":[74],"events":[75],"independence,":[76],"which":[77],"often":[79],"justified":[81],"by":[82],"realistic":[84],"behavior":[85],"system,":[89],"undermining":[90],"accuracy.":[92],"This":[93],"article":[94],"introduces":[95],"novel":[97],"methodology":[98],"FTs":[103],"allowing":[104],"component":[106],"dependencies":[107],"dynamic":[109],"features.":[110],"proposed":[112],"approach,":[113],"based":[114],"on":[115],"use":[117],"binary":[119],"decision":[120],"diagrams,":[121],"demonstrated":[123],"using":[124],"simple":[126],"numerical":[127],"application":[128],"verification.":[130],"Its":[131],"applicability":[132],"computational":[134],"feasibility":[135],"discussed":[137],"details.":[139]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":2}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}