{"id":"https://openalex.org/W4411086589","doi":"https://doi.org/10.1109/tim.2025.3576001","title":"An Analog Front-End Circuit for Noncontact Voltage Measurements, Immune to Input Capacitance","display_name":"An Analog Front-End Circuit for Noncontact Voltage Measurements, Immune to Input Capacitance","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411086589","doi":"https://doi.org/10.1109/tim.2025.3576001"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3576001","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3576001","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065165007","display_name":"Marcelo Haberman","orcid":"https://orcid.org/0000-0003-1387-3436"},"institutions":[{"id":"https://openalex.org/I4210138160","display_name":"Centro Cient\u00edfico Tecnol\u00f3gico - La Plata","ror":"https://ror.org/03qan4b12","country_code":"AR","type":"facility","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4210138160","https://openalex.org/I4387155568"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Marcelo Alejandro Haberman","raw_affiliation_strings":["Institute LEICI, CONICET, UNLP, La Plata, Argentina"],"raw_orcid":"https://orcid.org/0000-0003-1387-3436","affiliations":[{"raw_affiliation_string":"Institute LEICI, CONICET, UNLP, La Plata, Argentina","institution_ids":["https://openalex.org/I4210138160"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065084374","display_name":"Enrique Mario Spinelli","orcid":"https://orcid.org/0000-0002-4164-9151"},"institutions":[{"id":"https://openalex.org/I4210138160","display_name":"Centro Cient\u00edfico Tecnol\u00f3gico - La Plata","ror":"https://ror.org/03qan4b12","country_code":"AR","type":"facility","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4210138160","https://openalex.org/I4387155568"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Enrique Mario Spinelli","raw_affiliation_strings":["Institute LEICI, CONICET, UNLP, La Plata, Argentina"],"raw_orcid":"https://orcid.org/0000-0002-4164-9151","affiliations":[{"raw_affiliation_string":"Institute LEICI, CONICET, UNLP, La Plata, Argentina","institution_ids":["https://openalex.org/I4210138160"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210138160"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.2866,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49512429,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7513628005981445},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.5801894664764404},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5800033807754517},{"id":"https://openalex.org/keywords/analog-front-end","display_name":"Analog front-end","score":0.5573921799659729},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5518195033073425},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.5379920601844788},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4721298813819885},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.46355879306793213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2973434329032898},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24261406064033508},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.22852131724357605},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1607409417629242},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.13712796568870544}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7513628005981445},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.5801894664764404},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5800033807754517},{"id":"https://openalex.org/C2778870119","wikidata":"https://www.wikidata.org/wiki/Q16002927","display_name":"Analog front-end","level":3,"score":0.5573921799659729},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5518195033073425},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.5379920601844788},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4721298813819885},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46355879306793213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2973434329032898},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24261406064033508},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.22852131724357605},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1607409417629242},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.13712796568870544},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2025.3576001","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3576001","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:ri.conicet.gov.ar:11336/275677","is_oa":false,"landing_page_url":"http://hdl.handle.net/11336/275677","pdf_url":null,"source":{"id":"https://openalex.org/S4306401400","display_name":"Conicet","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210104196","host_organization_name":"Centro Cient\u00edfico Tecnol\u00f3gico - Nordeste","host_organization_lineage":["https://openalex.org/I4210104196"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G3837176340","display_name":null,"funder_award_id":"PIP 0323","funder_id":"https://openalex.org/F4320321594","funder_display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas"}],"funders":[{"id":"https://openalex.org/F4320321594","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W223281588","https://openalex.org/W2341979208","https://openalex.org/W2533137575","https://openalex.org/W2790578887","https://openalex.org/W2926216946","https://openalex.org/W2953680952","https://openalex.org/W4295308156","https://openalex.org/W4363674660","https://openalex.org/W4385796240","https://openalex.org/W4387567156","https://openalex.org/W6635432953","https://openalex.org/W6731471704","https://openalex.org/W6755116493"],"related_works":["https://openalex.org/W2058545256","https://openalex.org/W4396689093","https://openalex.org/W2394034449","https://openalex.org/W2904654231","https://openalex.org/W4210807885","https://openalex.org/W2051045034","https://openalex.org/W2248915580","https://openalex.org/W2999380399","https://openalex.org/W4304890870","https://openalex.org/W2126779451"],"abstract_inverted_index":{"This":[0,39],"work":[1],"presents":[2],"a":[3,18,49],"novel":[4],"analog":[5],"front-end":[6],"circuit":[7,59],"for":[8],"the":[9,26,35,42,45,65,81,119,122,127],"non-contact":[10,84],"voltage":[11,19,86],"measurement":[12,46,123],"of":[13,29,44,107,121,126],"power-line":[14,85],"voltages.":[15],"It":[16],"introduces":[17],"supply":[20],"driving":[21],"scheme":[22],"designed":[23],"to":[24,34,53,79],"address":[25],"primary":[27],"challenge":[28],"this":[30],"technique:":[31],"its":[32,55],"sensitivity":[33],"input":[36],"parasitic":[37],"capacitanceCin.":[38],"capacitance":[40],"affects":[41],"accuracy":[43,67,113],"and":[47,68,101,109],"demands":[48],"specific":[50],"calibration":[51,73],"procedure":[52],"mitigate":[54],"effects.":[56],"The":[57],"proposed":[58],"is":[60],"insensitive":[61],"toCin,":[62],"thus":[63],"improving":[64],"method":[66],"not":[69],"requiring":[70],"an":[71],"additional":[72],"procedure.":[74],"Several":[75],"tests":[76],"were":[77,88],"performed":[78],"validate":[80],"solution.":[82],"Actual":[83],"measurements":[87],"done":[89],"by":[90,118],"using":[91],"two":[92],"different":[93],"capacitive":[94,136],"probes":[95],"with":[96],"coupling":[97],"capacitancesCXof":[98],"3.2":[99],"pf":[100],"86":[102],"fF,":[103],"resulting":[104],"in":[105,129],"accuracies":[106],"0.2\u00b10.3%":[108],"2.6\u00b10.3%":[110],"respectively.":[111],"These":[112],"levels":[114],"are":[115],"mainly":[116],"determined":[117],"uncertainties":[120],"instruments":[124],"instead":[125],"factorCin/CXas":[128],"previous":[130],"solutions":[131],"that":[132],"highly":[133],"penalize":[134],"small":[135],"probes.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}