{"id":"https://openalex.org/W4389887791","doi":"https://doi.org/10.1109/tim.2023.3343812","title":"A Flexible Evaluation System for the Complex Calibration of Inductive and Resistive Voltage Dividers up to 100 kHz","display_name":"A Flexible Evaluation System for the Complex Calibration of Inductive and Resistive Voltage Dividers up to 100 kHz","publication_year":2023,"publication_date":"2023-12-18","ids":{"openalex":"https://openalex.org/W4389887791","doi":"https://doi.org/10.1109/tim.2023.3343812"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3343812","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3343812","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101829330","display_name":"T. Yamada","orcid":"https://orcid.org/0000-0003-3590-9663"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tatsuji Yamada","raw_affiliation_strings":["National Metrology Institute of Japan, Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3590-9663","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103178769","display_name":"Hidekazu Muramatsu","orcid":"https://orcid.org/0000-0001-9823-5729"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hidekazu Muramatsu","raw_affiliation_strings":["National Metrology Institute of Japan, Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9823-5729","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005311753","display_name":"Norihiko Sakamoto","orcid":"https://orcid.org/0000-0002-0102-7198"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Norihiko Sakamoto","raw_affiliation_strings":["National Metrology Institute of Japan, Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0102-7198","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, Tsukuba, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013233262","display_name":"Katsuya Tachibana","orcid":"https://orcid.org/0000-0003-0206-2080"},"institutions":[{"id":"https://openalex.org/I88100897","display_name":"Yokogawa Electric (Japan)","ror":"https://ror.org/04bdy7914","country_code":"JP","type":"company","lineage":["https://openalex.org/I88100897"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuya Tachibana","raw_affiliation_strings":["Yokogawa Electric Corporation, Kofu, Japan"],"raw_orcid":"https://orcid.org/0000-0003-0206-2080","affiliations":[{"raw_affiliation_string":"Yokogawa Electric Corporation, Kofu, Japan","institution_ids":["https://openalex.org/I88100897"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018014539","display_name":"Toshiaki Shioda","orcid":"https://orcid.org/0000-0002-9369-9804"},"institutions":[{"id":"https://openalex.org/I88100897","display_name":"Yokogawa Electric (Japan)","ror":"https://ror.org/04bdy7914","country_code":"JP","type":"company","lineage":["https://openalex.org/I88100897"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiaki Shioda","raw_affiliation_strings":["Yokogawa Test and Measurement Corporation, Hachioji, Japan"],"raw_orcid":"https://orcid.org/0000-0002-9369-9804","affiliations":[{"raw_affiliation_string":"Yokogawa Test and Measurement Corporation, Hachioji, Japan","institution_ids":["https://openalex.org/I88100897"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3681,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60779844,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7607596516609192},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.728360116481781},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6579669117927551},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6247917413711548},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6199513077735901},{"id":"https://openalex.org/keywords/lock-in-amplifier","display_name":"Lock-in amplifier","score":0.5843483209609985},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.5562667846679688},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5557799339294434},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5262320041656494},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4869459867477417},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4770228862762451},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4650173485279083},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4501117765903473},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4485548436641693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4357265830039978},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3106882572174072},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.20051318407058716},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17869791388511658},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.176316499710083}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7607596516609192},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.728360116481781},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6579669117927551},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6247917413711548},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6199513077735901},{"id":"https://openalex.org/C2780259410","wikidata":"https://www.wikidata.org/wiki/Q1752933","display_name":"Lock-in amplifier","level":4,"score":0.5843483209609985},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.5562667846679688},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5557799339294434},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5262320041656494},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4869459867477417},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4770228862762451},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4650173485279083},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4501117765903473},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4485548436641693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4357265830039978},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3106882572174072},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.20051318407058716},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17869791388511658},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.176316499710083},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3343812","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3343812","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.49000000953674316,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G691679726","display_name":null,"funder_award_id":"JP22K04059","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1963519326","https://openalex.org/W1992708211","https://openalex.org/W2086307905","https://openalex.org/W2098727463","https://openalex.org/W2130356356","https://openalex.org/W2172070676","https://openalex.org/W2318193616","https://openalex.org/W2402940538","https://openalex.org/W2477141154","https://openalex.org/W2513782356","https://openalex.org/W2517363324","https://openalex.org/W2585385347","https://openalex.org/W2592651446","https://openalex.org/W2770493372","https://openalex.org/W2783814089","https://openalex.org/W2899113161","https://openalex.org/W2899137266","https://openalex.org/W2914363055","https://openalex.org/W3047172377","https://openalex.org/W3084441666","https://openalex.org/W3114669261"],"related_works":["https://openalex.org/W3049121420","https://openalex.org/W2326770010","https://openalex.org/W2020914616","https://openalex.org/W2374263760","https://openalex.org/W2409756458","https://openalex.org/W4255647936","https://openalex.org/W2561767754","https://openalex.org/W2289162976","https://openalex.org/W1486069742","https://openalex.org/W2461589354"],"abstract_inverted_index":{"Toward":[0],"calibration":[1],"of":[2,55,88],"wideband":[3,43],"resistive":[4],"voltage":[5,25],"dividers":[6,26],"(WRVDs),":[7],"a":[8,42,47,81],"new":[9],"evaluation":[10,33,83,90],"system":[11,61,91],"has":[12,18,74,92],"been":[13,19,76,93],"developed,":[14],"and":[15,38],"its":[16],"validation":[17],"made":[20],"by":[21,29,95],"employing":[22],"standard":[23,45],"inductive":[24],"(IVDs)":[27],"calibrated":[28],"Thompson\u2019s":[30],"method.":[31],"The":[32],"system,":[34],"designed":[35],"within":[36],"120-V":[37],"100-kHz":[39],"ranges,":[40],"introduced":[41],"phase":[44,53,57],"as":[46],"two-phase":[48],"signal":[49],"generator,":[50],"allowing":[51],"the":[52,56,60,70,86,89,100],"errors":[54],"meters":[58],"in":[59],"to":[62],"be":[63],"measured":[64],"preliminarily.":[65],"An":[66],"error":[67],"correction":[68],"for":[69],"digital":[71],"lock-in":[72],"amplifier":[73],"also":[75],"applied.":[77],"Those":[78],"corrections":[79],"attained":[80],"great":[82],"performance.":[84],"Furthermore,":[85],"uncertainty":[87,101],"estimated":[94],"considering":[96],"some":[97],"correlations":[98],"between":[99],"contributions":[102],"factors.":[103]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}