{"id":"https://openalex.org/W2891470205","doi":"https://doi.org/10.1109/tim.2018.2866315","title":"A Measurement of Noise Wave Correlation Matrix Using Noise Power Ratios","display_name":"A Measurement of Noise Wave Correlation Matrix Using Noise Power Ratios","publication_year":2018,"publication_date":"2018-09-21","ids":{"openalex":"https://openalex.org/W2891470205","doi":"https://doi.org/10.1109/tim.2018.2866315","mag":"2891470205"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2866315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2866315","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100429196","display_name":"Dong\u2010Hyun Lee","orcid":"https://orcid.org/0000-0002-0827-3818"},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Dong-Hyun Lee","raw_affiliation_strings":["Department of Radio Science and Engineering, Chungnam National University, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-0827-3818","affiliations":[{"raw_affiliation_string":"Department of Radio Science and Engineering, Chungnam National University, Daejeon, South Korea","institution_ids":["https://openalex.org/I196345858"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050829872","display_name":"Abdul\u2010Rahman Ahmed","orcid":"https://orcid.org/0000-0001-9387-4337"},"institutions":[{"id":"https://openalex.org/I28046988","display_name":"Kwame Nkrumah University of Science and Technology","ror":"https://ror.org/00cb23x68","country_code":"GH","type":"education","lineage":["https://openalex.org/I28046988"]}],"countries":["GH"],"is_corresponding":false,"raw_author_name":"Abdul-Rahman Ahmed","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Kwame Nkrumah University of Science and Technology, Ghana"],"raw_orcid":"https://orcid.org/0000-0001-9387-4337","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Kwame Nkrumah University of Science and Technology, Ghana","institution_ids":["https://openalex.org/I28046988"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087234898","display_name":"Kyung\u2010Whan Yeom","orcid":"https://orcid.org/0000-0002-8557-4972"},"institutions":[{"id":"https://openalex.org/I196345858","display_name":"Chungnam National University","ror":"https://ror.org/0227as991","country_code":"KR","type":"education","lineage":["https://openalex.org/I196345858"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung-Whan Yeom","raw_affiliation_strings":["Department of Radio Science and Engineering, Chungnam National University, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-8557-4972","affiliations":[{"raw_affiliation_string":"Department of Radio Science and Engineering, Chungnam National University, Daejeon, South Korea","institution_ids":["https://openalex.org/I196345858"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100429196"],"corresponding_institution_ids":["https://openalex.org/I196345858"],"apc_list":null,"apc_paid":null,"fwci":0.9162,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.7670849,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"68","issue":"7","first_page":"2579","last_page":"2593"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10822","display_name":"Acoustic Wave Phenomena Research","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6131404042243958},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.5843943953514099},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5337166786193848},{"id":"https://openalex.org/keywords/noise-spectral-density","display_name":"Noise spectral density","score":0.5164546966552734},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.4815509617328644},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.4647226929664612},{"id":"https://openalex.org/keywords/noise-power","display_name":"Noise power","score":0.4445037841796875},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.42244529724121094},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.42219656705856323},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41069626808166504},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3259759545326233},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.3028988838195801},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.3014689087867737},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26359957456588745},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.2047560214996338},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1929435431957245},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.16445589065551758},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07598590850830078}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6131404042243958},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.5843943953514099},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5337166786193848},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.5164546966552734},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.4815509617328644},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.4647226929664612},{"id":"https://openalex.org/C203234222","wikidata":"https://www.wikidata.org/wiki/Q2133519","display_name":"Noise power","level":3,"score":0.4445037841796875},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.42244529724121094},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.42219656705856323},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41069626808166504},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3259759545326233},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.3028988838195801},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.3014689087867737},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26359957456588745},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2047560214996338},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1929435431957245},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16445589065551758},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07598590850830078},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2866315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2866315","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7400000095367432,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G231934037","display_name":null,"funder_award_id":"NRF-2015R1D1A1A010 57036","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1535863280","https://openalex.org/W2026918675","https://openalex.org/W2042050102","https://openalex.org/W2049183003","https://openalex.org/W2052875310","https://openalex.org/W2057575455","https://openalex.org/W2064245841","https://openalex.org/W2075634643","https://openalex.org/W2099060920","https://openalex.org/W2105632971","https://openalex.org/W2109757554","https://openalex.org/W2129103579","https://openalex.org/W2129509174","https://openalex.org/W2131193330","https://openalex.org/W2138205396","https://openalex.org/W2143409138","https://openalex.org/W2147240558","https://openalex.org/W2148623572","https://openalex.org/W2158443035","https://openalex.org/W2163265417","https://openalex.org/W2164320414","https://openalex.org/W2168659901","https://openalex.org/W2170839164","https://openalex.org/W2171529296","https://openalex.org/W2211036571","https://openalex.org/W2325124186","https://openalex.org/W2516758624","https://openalex.org/W2545160419","https://openalex.org/W4238291911","https://openalex.org/W6632191242","https://openalex.org/W6679435221"],"related_works":["https://openalex.org/W1988257008","https://openalex.org/W2118931924","https://openalex.org/W2141570529","https://openalex.org/W2180056344","https://openalex.org/W3021392142","https://openalex.org/W2015133066","https://openalex.org/W2099930065","https://openalex.org/W2541054142","https://openalex.org/W4256307153","https://openalex.org/W2742666096"],"abstract_inverted_index":{"In":[0,100],"this":[1,48,104],"paper,":[2],"we":[3,106],"propose":[4],"a":[5,18,75,115],"novel":[6],"technique":[7],"for":[8],"the":[9,50,54,59,64,98,108,128],"measurement":[10],"of":[11,17,28,74,110,118],"noise":[12,23,31,44,60,72,85,90,116,124],"wave":[13],"correlation":[14],"matrix":[15],"(NWCM)":[16],"two-port":[19],"network":[20],"using":[21,58],"measured":[22,30,43,81,107,129],"power":[24,61,86],"ratios.":[25,62,87],"The":[26,88,123],"ratio":[27],"two":[29],"powers":[32,73],"is":[33],"observed":[34],"to":[35,52,82,102],"show":[36,131],"significantly":[37],"reduced":[38],"fluctuations":[39,133],"compared":[40],"with":[41,114],"absolutely":[42],"powers.":[45],"Based":[46],"on":[47],"observation,":[49],"equations":[51],"compute":[53],"NWCM":[55,65,109,130],"are":[56,80],"formulated":[57],"Since":[63],"has":[66],"four":[67,84],"unknowns,":[68],"five":[69],"absolute":[70],"output":[71],"device":[76],"under":[77],"test":[78],"(DUT)":[79],"obtain":[83],"conventional":[89],"parameters":[91,125],"can":[92],"then":[93],"be":[94],"obtained":[95],"by":[96],"converting":[97],"NWCM.":[99],"order":[101],"demonstrate":[103],"technique,":[105],"an":[111],"active":[112],"DUT":[113],"figure":[117],"less":[119],"than":[120],"1":[121],"dB.":[122],"resulting":[126],"from":[127],"minimal":[132],"as":[134],"expected.":[135]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}