{"id":"https://openalex.org/W2883645217","doi":"https://doi.org/10.1109/tim.2018.2853358","title":"A Robust Inclusion Boundary Reconstructor for Electrical Impedance Tomography With Geometric Constraints","display_name":"A Robust Inclusion Boundary Reconstructor for Electrical Impedance Tomography With Geometric Constraints","publication_year":2018,"publication_date":"2018-07-23","ids":{"openalex":"https://openalex.org/W2883645217","doi":"https://doi.org/10.1109/tim.2018.2853358","mag":"2883645217"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2018.2853358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2853358","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075293545","display_name":"Shangjie Ren","orcid":"https://orcid.org/0000-0003-2220-3856"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shangjie Ren","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-2220-3856","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011621095","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0002-7536-5253"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wang","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069469484","display_name":"Guanghui Liang","orcid":"https://orcid.org/0000-0002-6064-6730"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guanghui Liang","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-6064-6730","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025279788","display_name":"Feng Dong","orcid":"https://orcid.org/0000-0002-8478-8928"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Dong","raw_affiliation_strings":["Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-8478-8928","affiliations":[{"raw_affiliation_string":"Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.321,"has_fulltext":false,"cited_by_count":59,"citation_normalized_percentile":{"value":0.94860461,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"68","issue":"3","first_page":"762","last_page":"773"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8654851913452148},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.7001949548721313},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.666802167892456},{"id":"https://openalex.org/keywords/hausdorff-distance","display_name":"Hausdorff distance","score":0.6009963750839233},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.5727965235710144},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.44077906012535095},{"id":"https://openalex.org/keywords/boundary-value-problem","display_name":"Boundary value problem","score":0.4183441400527954},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.40344634652137756},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3881063163280487},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.3833155035972595},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.3723835349082947},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33951470255851746},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16048148274421692},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07088974118232727}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8654851913452148},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.7001949548721313},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.666802167892456},{"id":"https://openalex.org/C141898687","wikidata":"https://www.wikidata.org/wiki/Q1501997","display_name":"Hausdorff distance","level":2,"score":0.6009963750839233},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.5727965235710144},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.44077906012535095},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.4183441400527954},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.40344634652137756},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3881063163280487},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3833155035972595},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.3723835349082947},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33951470255851746},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16048148274421692},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07088974118232727},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2018.2853358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2018.2853358","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4990849688","display_name":null,"funder_award_id":"17JCQNJC03500","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G6686528367","display_name":null,"funder_award_id":"61571321","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1936049941","https://openalex.org/W1964492437","https://openalex.org/W1968633794","https://openalex.org/W1971508657","https://openalex.org/W1978770244","https://openalex.org/W1982662510","https://openalex.org/W1986286602","https://openalex.org/W1992372275","https://openalex.org/W2000241688","https://openalex.org/W2006432585","https://openalex.org/W2015552167","https://openalex.org/W2019410389","https://openalex.org/W2023722580","https://openalex.org/W2035414577","https://openalex.org/W2048867018","https://openalex.org/W2049772201","https://openalex.org/W2050184631","https://openalex.org/W2053510218","https://openalex.org/W2101916945","https://openalex.org/W2104095591","https://openalex.org/W2112890043","https://openalex.org/W2119699417","https://openalex.org/W2122294678","https://openalex.org/W2209495998","https://openalex.org/W2416754789","https://openalex.org/W2530033803","https://openalex.org/W2565717406","https://openalex.org/W2578894499","https://openalex.org/W2608090923","https://openalex.org/W2622008139","https://openalex.org/W2666464630","https://openalex.org/W2759764994","https://openalex.org/W2761812513","https://openalex.org/W2897807752","https://openalex.org/W2988659410","https://openalex.org/W3104219848","https://openalex.org/W3124114587"],"related_works":["https://openalex.org/W3126309201","https://openalex.org/W2147781185","https://openalex.org/W4220961646","https://openalex.org/W2883645217","https://openalex.org/W2094931821","https://openalex.org/W1556508989","https://openalex.org/W4288944437","https://openalex.org/W4206452777","https://openalex.org/W2951215589","https://openalex.org/W2072406906"],"abstract_inverted_index":{"As":[0],"a":[1,44,58],"nondestructive,":[2],"nonradioactive,":[3],"and":[4,18,48,69,92,138,155,162,167,179,190,196],"high":[5],"temporal":[6],"resolution":[7],"technique,":[8],"electrical":[9],"impedance":[10],"tomography":[11],"(EIT)":[12],"has":[13],"potential":[14],"applications":[15],"in":[16],"industrial":[17],"biomedical":[19],"imaging.":[20],"A":[21,103,120],"novel":[22],"geometrically":[23],"constrained":[24],"boundary":[25,37,81,97,117],"reconstructor":[26],"(GCBR)":[27],"is":[28,49],"presented":[29],"for":[30],"EIT.":[31],"It":[32],"can":[33],"directly":[34],"calculate":[35],"the":[36,39,66,70,78,83,90,95,100,112,116,129,132,141,148,160,170,180,184,188,199],"of":[38,65,105,122,131,140,169,183,198],"target":[40,142,161,189],"inclusions":[41,143],"embedded":[42],"into":[43],"homogeneous":[45],"background":[46],"conductivity":[47],"robust":[50],"to":[51,82,110,127],"noise.":[52],"The":[53,74,85,135,151,175],"proposed":[54,133],"GCBR":[55],"depends":[56],"on":[57],"specially":[59],"designed":[60],"energy":[61],"function,":[62],"which":[63],"consists":[64],"residual":[67,75],"term":[68,76,88],"geometric":[71,86],"constraints'":[72,87],"term.":[73],"drives":[77],"estimated":[79],"inclusion":[80,192],"targets.":[84],"regularizes":[89],"estimations":[91],"automatically":[93],"excludes":[94],"meaningless":[96],"guesses":[98],"from":[99,147],"candidate":[101],"solution.":[102],"set":[104,121],"numerical":[106],"tests":[107,124],"are":[108,125,144,165,194],"conducted":[109,126],"discuss":[111],"key":[113],"factors":[114],"influencing":[115],"reconstruction":[118],"performance.":[119],"experimental":[123],"evaluate":[128],"performance":[130],"GCBR.":[134],"position,":[136],"size,":[137],"shape":[139],"well":[145],"reconstructed":[146,163,191],"real":[149],"data.":[150],"mean":[152,156,176,181],"position":[153],"error":[154],"Hausdorff":[157],"distances":[158],"between":[159,187],"boundaries":[164],"0.39%":[166],"2.2%":[168],"maximal":[171],"observation":[172,201],"diameter,":[173],"respectively.":[174,203],"area":[177,182],"errors":[178],"symmetric":[185],"difference":[186],"regions":[193],"0.32%":[195],"2.54%":[197],"total":[200],"area,":[202]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":12}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}