{"id":"https://openalex.org/W2113442245","doi":"https://doi.org/10.1109/tim.2009.2019720","title":"Influence of Sampling Voltmeter Parameters on RMS Measurements of Josephson Stepwise-Approximated Sine Waves","display_name":"Influence of Sampling Voltmeter Parameters on RMS Measurements of Josephson Stepwise-Approximated Sine Waves","publication_year":2009,"publication_date":"2009-09-09","ids":{"openalex":"https://openalex.org/W2113442245","doi":"https://doi.org/10.1109/tim.2009.2019720","mag":"2113442245"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2019720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2019720","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016704640","display_name":"Helko E. van den Brom","orcid":"https://orcid.org/0000-0001-5796-3906"},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H.E. van den Brom","raw_affiliation_strings":["VSL, Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL, Delft, Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079714418","display_name":"Ernest Houtzager","orcid":"https://orcid.org/0000-0001-9430-618X"},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"E. Houtzager","raw_affiliation_strings":["VSL, Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL, Delft, Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064813049","display_name":"S. Verhoeckx","orcid":null},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S. Verhoeckx","raw_affiliation_strings":["VSL, Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL, Delft, Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046527042","display_name":"Quincy Martina","orcid":null},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Q.E.V.N. Martina","raw_affiliation_strings":["VSL, Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL, Delft, Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073844637","display_name":"Gert Rietveld","orcid":"https://orcid.org/0000-0002-5239-4019"},"institutions":[{"id":"https://openalex.org/I4210164637","display_name":"VSL Dutch Metrology Institute","ror":"https://ror.org/05ap1vt50","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210164637"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"G. Rietveld","raw_affiliation_strings":["VSL, Delft, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VSL, Delft, Netherlands","institution_ids":["https://openalex.org/I4210164637"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210164637"],"apc_list":null,"apc_paid":null,"fwci":0.3052,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.64463593,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"58","issue":"10","first_page":"3806","last_page":"3812"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9592000246047974,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9556999802589417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltmeter","display_name":"Voltmeter","score":0.8455777168273926},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.7611255049705505},{"id":"https://openalex.org/keywords/root-mean-square","display_name":"Root mean square","score":0.6232526302337646},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5506753325462341},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5333831906318665},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5179011821746826},{"id":"https://openalex.org/keywords/synchronization","display_name":"Synchronization (alternating current)","score":0.5016183853149414},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.4948112368583679},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.4477626085281372},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.44699183106422424},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4304599165916443},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4198010265827179},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3956414461135864},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.21986523270606995},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.0842125415802002}],"concepts":[{"id":"https://openalex.org/C165051773","wikidata":"https://www.wikidata.org/wiki/Q179741","display_name":"Voltmeter","level":3,"score":0.8455777168273926},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.7611255049705505},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.6232526302337646},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5506753325462341},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5333831906318665},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5179011821746826},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.5016183853149414},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.4948112368583679},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.4477626085281372},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.44699183106422424},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4304599165916443},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4198010265827179},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3956414461135864},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.21986523270606995},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0842125415802002},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2019720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2019720","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320313458","display_name":"European Association of National Metrology Institutes","ror":"https://ror.org/03csrq586"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1530876674","https://openalex.org/W1621698972","https://openalex.org/W1964661619","https://openalex.org/W1979514275","https://openalex.org/W1992286365","https://openalex.org/W2026731950","https://openalex.org/W2031821198","https://openalex.org/W2045940492","https://openalex.org/W2056065340","https://openalex.org/W2098827896","https://openalex.org/W2119568377","https://openalex.org/W2123177410","https://openalex.org/W2128269426","https://openalex.org/W2131729362","https://openalex.org/W2146107278","https://openalex.org/W2157049088","https://openalex.org/W2158928027","https://openalex.org/W2163219687","https://openalex.org/W2165750195","https://openalex.org/W2165751916","https://openalex.org/W3145651816","https://openalex.org/W4251914251","https://openalex.org/W6636576466"],"related_works":["https://openalex.org/W1773148802","https://openalex.org/W3015838480","https://openalex.org/W2071204493","https://openalex.org/W1980429525","https://openalex.org/W2318061778","https://openalex.org/W1970944956","https://openalex.org/W2028848887","https://openalex.org/W2014885665","https://openalex.org/W2906950246","https://openalex.org/W2774114410"],"abstract_inverted_index":{"A":[0,129],"binary":[1],"Josephson-array":[2],"voltage":[3,87],"standard":[4,30],"was":[5],"used":[6],"to":[7,96,106],"investigate":[8],"the":[9,15,25,28,52,55,62,84,135],"influence":[10,53],"of":[11,17,27,54,66],"device":[12],"settings":[13],"on":[14,51,61],"reading":[16],"an":[18],"81/2-digit":[19],"sampling":[20],"voltmeter.":[21],"This":[22],"voltmeter":[23,56],"is":[24,101],"heart":[26],"primary":[29],"for":[31,71,78,114,137],"power":[32],"at":[33,39,118],"50":[34],"Hz":[35,38],"or":[36],"60":[37],"several":[40],"National":[41],"Metrology":[42],"Institutes":[43],"(NMIs).":[44],"In":[45],"this":[46],"paper,":[47],"we":[48,111],"present":[49],"results":[50,75],"synchronization":[57],"and":[58,100],"measurement":[59],"parameters":[60],"root-mean-square":[63],"(RMS)":[64],"measurements":[65],"Josephson":[67],"stepwise-approximated":[68,115],"sine":[69,116],"waves":[70,117],"different":[72],"frequencies.":[73],"Our":[74],"show":[76,112],"that":[77,113],"aperture":[79,98],"times":[80,99,122],"above":[81,139],"100":[82],"mus,":[83],"measured":[85],"RMS":[86],"shows":[88],"a":[89,140],"large":[90],"step":[91],"in":[92],"value":[93],"with":[94],"respect":[95],"shorter":[97],"much":[102],"more":[103],"accurate.":[104],"Furthermore,":[105],"obtain":[107],"0.2":[108],"muV/V":[109],"accuracy,":[110],"53":[119],"Hz,":[120],"delay":[121,131],"higher":[123],"than":[124],"10":[125],"mus":[126],"are":[127],"necessary.":[128],"slight":[130],"time":[132],"dependence":[133],"limits":[134],"accuracy":[136],"frequencies":[138],"few":[141],"hundred":[142],"hertz.":[143]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}