{"id":"https://openalex.org/W2113001322","doi":"https://doi.org/10.1109/tim.2009.2013920","title":"Online Ringing Characterization as a Diagnostic Technique for IGBTs in Power Drives","display_name":"Online Ringing Characterization as a Diagnostic Technique for IGBTs in Power Drives","publication_year":2009,"publication_date":"2009-02-20","ids":{"openalex":"https://openalex.org/W2113001322","doi":"https://doi.org/10.1109/tim.2009.2013920","mag":"2113001322"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2009.2013920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2013920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043357388","display_name":"Antonio Ginart","orcid":"https://orcid.org/0000-0002-8743-7090"},"institutions":[{"id":"https://openalex.org/I4210166736","display_name":"Impact Technology Development (United States)","ror":"https://ror.org/05ppvf150","country_code":"US","type":"company","lineage":["https://openalex.org/I4210166736"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.E. Ginart","raw_affiliation_strings":["Impact Technologies LLC, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technologies LLC, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210166736"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101807275","display_name":"Douglas W. Brown","orcid":"https://orcid.org/0000-0003-0790-3408"},"institutions":[{"id":"https://openalex.org/I4210166736","display_name":"Impact Technology Development (United States)","ror":"https://ror.org/05ppvf150","country_code":"US","type":"company","lineage":["https://openalex.org/I4210166736"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.W. Brown","raw_affiliation_strings":["Impact Technologies LLC, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technologies LLC, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210166736"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023574761","display_name":"Patrick W. Kalgren","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},{"id":"https://openalex.org/I4210166736","display_name":"Impact Technology Development (United States)","ror":"https://ror.org/05ppvf150","country_code":"US","type":"company","lineage":["https://openalex.org/I4210166736"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.W. Kalgren","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Impact Technologies LLC, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Impact Technologies LLC, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210166736"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108525595","display_name":"Michael Roemer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166736","display_name":"Impact Technology Development (United States)","ror":"https://ror.org/05ppvf150","country_code":"US","type":"company","lineage":["https://openalex.org/I4210166736"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.J. Roemer","raw_affiliation_strings":["Impact Technologies LLC, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Impact Technologies LLC, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210166736"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.0517,"has_fulltext":false,"cited_by_count":67,"citation_normalized_percentile":{"value":0.91557916,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"58","issue":"7","first_page":"2290","last_page":"2299"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ringing","display_name":"Ringing","score":0.8134703636169434},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5481082797050476},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.54424649477005},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.5247179269790649},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.49015411734580994},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.48736363649368286},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44283628463745117},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.43812987208366394},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.431308388710022},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4278873801231384},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24527740478515625},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20186716318130493},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.08553194999694824}],"concepts":[{"id":"https://openalex.org/C30684385","wikidata":"https://www.wikidata.org/wiki/Q176509","display_name":"Ringing","level":3,"score":0.8134703636169434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5481082797050476},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.54424649477005},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.5247179269790649},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.49015411734580994},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.48736363649368286},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44283628463745117},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.43812987208366394},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.431308388710022},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4278873801231384},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24527740478515625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20186716318130493},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.08553194999694824},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2009.2013920","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2009.2013920","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337345","display_name":"Office of Naval Research","ror":"https://ror.org/00rk2pe57"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1619862585","https://openalex.org/W2067751972","https://openalex.org/W2083725072","https://openalex.org/W2086103622","https://openalex.org/W2104422651","https://openalex.org/W2122714101","https://openalex.org/W2132870717","https://openalex.org/W2135758557","https://openalex.org/W2140198002","https://openalex.org/W2162087833","https://openalex.org/W2168171910","https://openalex.org/W2180015593","https://openalex.org/W2492373893","https://openalex.org/W2506580684","https://openalex.org/W4206206436","https://openalex.org/W4240840756"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2334579747","https://openalex.org/W1494945652","https://openalex.org/W2219179229","https://openalex.org/W1951203367","https://openalex.org/W1964750282","https://openalex.org/W2080247538","https://openalex.org/W2367288913","https://openalex.org/W3141529351","https://openalex.org/W3190465357"],"abstract_inverted_index":{"Embeddable":[0],"features":[1],"that":[2,37],"are":[3,11,72,166],"easily":[4],"incorporated":[5],"in":[6,41,64],"traditional":[7],"power":[8,85,113,178],"drive":[9],"systems":[10],"identified":[12],"for":[13],"prognostics":[14],"and":[15,67,116,162],"health":[16],"management":[17],"(PHM)":[18],"systems.":[19],"The":[20,58,150],"proposed":[21],"novel":[22,104],"feature":[23,105,144,157],"takes":[24],"advantage":[25],"of":[26,47,69,75,83,95,111,128,147],"the":[27,35,42,52,65,70,76,79,84,91,108,112,126],"original":[28],"pulsewidth":[29],"modulation":[30],"(PWM)":[31],"waveform":[32],"produced":[33],"by":[34],"inverter":[36],"is":[38,140],"already":[39],"available":[40],"system":[43,71],"as":[44,142,155,174],"a":[45,73,102,129,136,143,156,175],"succession":[46],"step":[48],"functions":[49],"to":[50,106,121,158],"study":[51],"system's":[53],"response":[54],"at":[55,135],"high":[56,137],"frequencies.":[57],"high-order":[59],"oscillatory":[60],"responses":[61],"(ringing)":[62],"present":[63],"voltages":[66],"currents":[68],"reflection":[74],"interaction":[77],"among":[78],"internal":[80],"parametric":[81],"components":[82],"devices,":[86],"allowing":[87],"device":[88,179],"characterization.":[89],"Evaluating":[90],"change":[92],"over":[93],"time":[94],"these":[96],"parameters":[97],"characterized":[98],"from":[99],"ringing":[100,154],"becomes":[101],"key":[103],"assess":[107],"aging":[109,148,161],"status":[110],"electronic":[114],"circuit":[115],"electric":[117],"machine":[118],"with":[119,168],"respect":[120],"transistor":[122],"degradation.":[123],"We":[124],"propose":[125],"use":[127],"low-cost":[130],"bandpass":[131],"analog":[132],"filter":[133],"centered":[134],"frequency,":[138],"which":[139],"relevant":[141],"input":[145],"capable":[146],"tracking.":[149],"simplified":[151],"model":[152],"supporting":[153],"evaluate":[159],"component":[160],"its":[163,172],"experimental":[164,169],"evaluation":[165],"presented":[167],"data,":[170],"corroborating":[171],"viability":[173],"practical":[176],"real-time":[177],"health-state":[180],"indicator.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}