{"id":"https://openalex.org/W2125286842","doi":"https://doi.org/10.1109/tim.2008.2004979","title":"Metrological Characterization of a Vision-Based Measurement System for the Online Inspection of Automotive Rubber Profile","display_name":"Metrological Characterization of a Vision-Based Measurement System for the Online Inspection of Automotive Rubber Profile","publication_year":2008,"publication_date":"2008-10-07","ids":{"openalex":"https://openalex.org/W2125286842","doi":"https://doi.org/10.1109/tim.2008.2004979","mag":"2125286842"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2008.2004979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004979","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081274022","display_name":"R. Anchini","orcid":null},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"R. Anchini","raw_affiliation_strings":["Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052856423","display_name":"Giuseppe Di Leo","orcid":"https://orcid.org/0000-0002-9521-6239"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Di Leo","raw_affiliation_strings":["Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062085198","display_name":"Consolatina Liguori","orcid":"https://orcid.org/0000-0003-3254-2069"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Liguori","raw_affiliation_strings":["Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000757750","display_name":"Alfredo Paolillo","orcid":"https://orcid.org/0000-0001-9543-7333"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Paolillo","raw_affiliation_strings":["Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Engineering (DIIIE), University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Dept. of Electr. & Inf. Eng., Univ. of Salerno, Salerno","institution_ids":["https://openalex.org/I131729948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5081274022"],"corresponding_institution_ids":["https://openalex.org/I131729948"],"apc_list":null,"apc_paid":null,"fwci":0.8249,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.78712729,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"1","first_page":"4","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8568743467330933},{"id":"https://openalex.org/keywords/unavailability","display_name":"Unavailability","score":0.8101043701171875},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.7593652009963989},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.7196634411811829},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.7085661888122559},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6580740213394165},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46860942244529724},{"id":"https://openalex.org/keywords/natural-rubber","display_name":"Natural rubber","score":0.4391201138496399},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43272554874420166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41866233944892883},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3743552565574646},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3459215462207794},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3255161643028259},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11358407139778137},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.10493412613868713},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0868186354637146}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8568743467330933},{"id":"https://openalex.org/C2780505938","wikidata":"https://www.wikidata.org/wiki/Q17093282","display_name":"Unavailability","level":2,"score":0.8101043701171875},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.7593652009963989},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7196634411811829},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.7085661888122559},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6580740213394165},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46860942244529724},{"id":"https://openalex.org/C176933379","wikidata":"https://www.wikidata.org/wiki/Q131877","display_name":"Natural rubber","level":2,"score":0.4391201138496399},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43272554874420166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41866233944892883},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3743552565574646},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3459215462207794},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3255161643028259},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11358407139778137},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.10493412613868713},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0868186354637146},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2008.2004979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2008.2004979","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W147723833","https://openalex.org/W2004830399","https://openalex.org/W2009787997","https://openalex.org/W2038203223","https://openalex.org/W2039026439","https://openalex.org/W2045216125","https://openalex.org/W2108711494","https://openalex.org/W2113176004","https://openalex.org/W2118104180","https://openalex.org/W2137362823","https://openalex.org/W2164281224","https://openalex.org/W2167667767","https://openalex.org/W2168487298","https://openalex.org/W2315214008","https://openalex.org/W2802292112","https://openalex.org/W3022352042","https://openalex.org/W4256068510","https://openalex.org/W6683884326","https://openalex.org/W6750823258"],"related_works":["https://openalex.org/W3015838480","https://openalex.org/W2071668446","https://openalex.org/W1980429525","https://openalex.org/W2085930114","https://openalex.org/W2326770010","https://openalex.org/W3049121420","https://openalex.org/W2374263760","https://openalex.org/W4255647936","https://openalex.org/W1486069742","https://openalex.org/W2461589354"],"abstract_inverted_index":{"This":[0],"paper":[1],"deals":[2],"with":[3],"the":[4,13,37,44,47,59,75,83],"metrological":[5],"characterization":[6,24],"of":[7,15,25,28,39,46,58,72],"a":[8,55,70],"stereovision-based":[9],"measurement":[10,29,41,48],"system":[11,49],"for":[12,62],"inspection":[14],"automotive":[16],"rubber":[17],"profiles":[18],"in":[19],"an":[20],"industrial":[21],"plant.":[22],"The":[23],"this":[26],"class":[27],"systems":[30],"introduces":[31],"new":[32],"challenges":[33],"due":[34],"to":[35,69],"both":[36],"unavailability":[38],"reference":[40],"instruments":[42],"and":[43,92],"complexity":[45],"itself,":[50],"which":[51],"does":[52],"not":[53,79],"allow":[54],"straightforward":[56],"application":[57],"standard":[60],"procedures":[61],"uncertainty":[63,85],"evaluation.":[64],"To":[65],"assign":[66],"optimum":[67],"values":[68],"number":[71],"design":[73],"parameters,":[74],"followed":[76],"approach":[77],"focuses":[78],"only":[80],"on":[81,88],"evaluating":[82],"total":[84],"but":[86],"also":[87],"analyzing":[89],"systematic":[90],"effects":[91],"influence":[93],"quantities.":[94]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}