{"id":"https://openalex.org/W2147022944","doi":"https://doi.org/10.1109/tim.2007.895600","title":"Effect of Charge Recombination on Amplitude and Time Measurement of Induced Signals in Semiconductor Drift Detectors","display_name":"Effect of Charge Recombination on Amplitude and Time Measurement of Induced Signals in Semiconductor Drift Detectors","publication_year":2007,"publication_date":"2007-09-17","ids":{"openalex":"https://openalex.org/W2147022944","doi":"https://doi.org/10.1109/tim.2007.895600","mag":"2147022944"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2007.895600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.895600","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014682642","display_name":"M. Lazzaroni","orcid":"https://orcid.org/0000-0002-4094-1273"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Massimo Lazzaroni","raw_affiliation_strings":["Dipartimento di Technologie dell'Informazione, Universit\u00e0 degli Studi di Milano, Crema, Italy","Univ. degli Studi di Milano, Milano"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Technologie dell'Informazione, Universit\u00e0 degli Studi di Milano, Crema, Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Univ. degli Studi di Milano, Milano","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087330654","display_name":"Fabio E. Zocchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152658","display_name":"Active Technologies (Italy)","ror":"https://ror.org/03zp7nb85","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210152658"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fabio E. Zocchi","raw_affiliation_strings":["Localit\u00e0 Pascolo, Media Lario Technologies, Bosisio Parini, Italy","[Localit\u00e0 Pascolo, Media Lario Technologies, Bosisio Parini, Italy]"],"affiliations":[{"raw_affiliation_string":"Localit\u00e0 Pascolo, Media Lario Technologies, Bosisio Parini, Italy","institution_ids":[]},{"raw_affiliation_string":"[Localit\u00e0 Pascolo, Media Lario Technologies, Bosisio Parini, Italy]","institution_ids":["https://openalex.org/I4210152658"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5014682642"],"corresponding_institution_ids":["https://openalex.org/I189158943"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.06856437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"56","issue":"5","first_page":"1851","last_page":"1858"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.666537880897522},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6457735300064087},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.6213268637657166},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6151393055915833},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.6014531850814819},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5181164145469666},{"id":"https://openalex.org/keywords/semiconductor-detector","display_name":"Semiconductor detector","score":0.5056133270263672},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.4570084512233734},{"id":"https://openalex.org/keywords/diffusion","display_name":"Diffusion","score":0.45304349064826965},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.43279343843460083},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3876371383666992},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2494831383228302},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23944053053855896},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.08798637986183167}],"concepts":[{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.666537880897522},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6457735300064087},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.6213268637657166},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6151393055915833},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6014531850814819},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5181164145469666},{"id":"https://openalex.org/C148704626","wikidata":"https://www.wikidata.org/wiki/Q257415","display_name":"Semiconductor detector","level":3,"score":0.5056133270263672},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.4570084512233734},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.45304349064826965},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.43279343843460083},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3876371383666992},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2494831383228302},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23944053053855896},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.08798637986183167},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2007.895600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2007.895600","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1580561995","https://openalex.org/W1667165204","https://openalex.org/W1804441862","https://openalex.org/W1951665942","https://openalex.org/W1968327219","https://openalex.org/W1969612454","https://openalex.org/W1975001026","https://openalex.org/W1984820749","https://openalex.org/W1999483370","https://openalex.org/W2001234187","https://openalex.org/W2003544604","https://openalex.org/W2009422547","https://openalex.org/W2030765885","https://openalex.org/W2036488048","https://openalex.org/W2041948196","https://openalex.org/W2044425395","https://openalex.org/W2045487092","https://openalex.org/W2046703922","https://openalex.org/W2063928712","https://openalex.org/W2066350896","https://openalex.org/W2076623537","https://openalex.org/W2085315156","https://openalex.org/W2087313611","https://openalex.org/W2091696547","https://openalex.org/W2104078048","https://openalex.org/W2123153591","https://openalex.org/W2165020174","https://openalex.org/W2257222584","https://openalex.org/W3022448274","https://openalex.org/W4292198165"],"related_works":["https://openalex.org/W2366906938","https://openalex.org/W2349391998","https://openalex.org/W4205655149","https://openalex.org/W2000775715","https://openalex.org/W2795393339","https://openalex.org/W2068181668","https://openalex.org/W2297568236","https://openalex.org/W2004680861","https://openalex.org/W2534480362","https://openalex.org/W4245702891"],"abstract_inverted_index":{"The":[0,29],"effect":[1],"of":[2,16,40,81,88,92],"charge":[3],"recombination":[4,94],"on":[5,102],"the":[6,10,14,38,43,45,53,56,61,64,68,72,82,89,93],"noise":[7],"associated":[8],"with":[9,98],"signal":[11],"current":[12],"at":[13,60],"anode":[15,62],"a":[17,79],"semiconductor":[18],"drift":[19],"detector":[20],"is":[21,31,106],"studied":[22],"for":[23,63,85],"both":[24],"time":[25,69,90],"and":[26,55,71],"amplitude":[27,73],"measurements.":[28],"analysis":[30],"performed":[32],"by":[33],"fully":[34],"taking":[35],"into":[36],"account":[37],"diffusion":[39],"electrons":[41],"in":[42],"semiconductor,":[44],"electrostatic":[46],"induction":[47],"process":[48],"that":[49],"gives":[50],"rise":[51],"to":[52],"signal,":[54],"correct":[57],"boundary":[58],"condition":[59],"electron":[65],"density.":[66],"Both":[67],"variance":[70],"noise-to-signal":[74],"ratio":[75],"are":[76],"calculated":[77],"as":[78],"function":[80],"filter":[83],"width":[84],"different":[86],"values":[87],"constant":[91],"process.":[95],"A":[96],"comparison":[97],"previous":[99],"results":[100],"based":[101],"more":[103],"simplified":[104],"treatments":[105],"also":[107],"given.":[108]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}