{"id":"https://openalex.org/W2596529426","doi":"https://doi.org/10.1109/tie.2017.2681968","title":"Comparative Analysis on Conducted CM EMI Emission of Motor Drives: WBG Versus Si Devices","display_name":"Comparative Analysis on Conducted CM EMI Emission of Motor Drives: WBG Versus Si Devices","publication_year":2017,"publication_date":"2017-03-15","ids":{"openalex":"https://openalex.org/W2596529426","doi":"https://doi.org/10.1109/tie.2017.2681968","mag":"2596529426"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2681968","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2681968","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083004341","display_name":"Di Han","orcid":"https://orcid.org/0000-0002-1543-9548"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Di Han","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043835440","display_name":"Silong Li","orcid":"https://orcid.org/0000-0001-6920-2880"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Silong Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101962073","display_name":"Yujiang Wu","orcid":"https://orcid.org/0000-0003-3355-853X"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yujiang Wu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101630461","display_name":"Wooyoung Choi","orcid":"https://orcid.org/0000-0001-6731-0431"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wooyoung Choi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054455747","display_name":"Bulent Sarlioglu","orcid":"https://orcid.org/0000-0003-3327-3606"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bulent Sarlioglu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":16.0798,"has_fulltext":false,"cited_by_count":279,"citation_normalized_percentile":{"value":0.99364066,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"64","issue":"10","first_page":"8353","last_page":"8363"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.84552401304245},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.7254189848899841},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.7225822806358337},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.7124543190002441},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7064986228942871},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5913008451461792},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5575411319732666},{"id":"https://openalex.org/keywords/motor-drive","display_name":"Motor drive","score":0.5322102904319763},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5320392847061157},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5289716124534607},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5113427042961121},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.5113369822502136},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.47229841351509094},{"id":"https://openalex.org/keywords/common-mode-signal","display_name":"Common-mode signal","score":0.4383505582809448},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.42905133962631226},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41136810183525085},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39399442076683044},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2363385558128357},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10680598020553589},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08697211742401123}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.84552401304245},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.7254189848899841},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.7225822806358337},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.7124543190002441},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7064986228942871},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5913008451461792},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5575411319732666},{"id":"https://openalex.org/C154750914","wikidata":"https://www.wikidata.org/wiki/Q4304910","display_name":"Motor drive","level":2,"score":0.5322102904319763},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5320392847061157},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5289716124534607},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5113427042961121},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.5113369822502136},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.47229841351509094},{"id":"https://openalex.org/C189714311","wikidata":"https://www.wikidata.org/wiki/Q1530371","display_name":"Common-mode signal","level":4,"score":0.4383505582809448},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.42905133962631226},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41136810183525085},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39399442076683044},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2363385558128357},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10680598020553589},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08697211742401123},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2017.2681968","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2681968","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1546460110","https://openalex.org/W1592222274","https://openalex.org/W1965817159","https://openalex.org/W1972715367","https://openalex.org/W1975671662","https://openalex.org/W1980257247","https://openalex.org/W1980768991","https://openalex.org/W2024092974","https://openalex.org/W2029699094","https://openalex.org/W2046998299","https://openalex.org/W2063873444","https://openalex.org/W2075328427","https://openalex.org/W2086397266","https://openalex.org/W2106888255","https://openalex.org/W2120281644","https://openalex.org/W2122178809","https://openalex.org/W2128253476","https://openalex.org/W2131650585","https://openalex.org/W2131964793","https://openalex.org/W2132943914","https://openalex.org/W2136156914","https://openalex.org/W2136220673","https://openalex.org/W2158106195","https://openalex.org/W2169668955","https://openalex.org/W2171886847","https://openalex.org/W2290511012","https://openalex.org/W2396575540","https://openalex.org/W2578059947","https://openalex.org/W2588937652","https://openalex.org/W2590365226"],"related_works":["https://openalex.org/W2542938167","https://openalex.org/W2351897634","https://openalex.org/W2153075823","https://openalex.org/W2147300601","https://openalex.org/W2144739540","https://openalex.org/W2358134854","https://openalex.org/W2132129057","https://openalex.org/W2119183794","https://openalex.org/W2380765541","https://openalex.org/W2889450868"],"abstract_inverted_index":{"Silicon":[0],"carbide":[1],"(SiC)":[2],"MOSFETs":[3,20],"and":[4,19,23,31,70,90],"gallium":[5],"nitride":[6],"(GaN)":[7],"high-electron":[8],"mobility":[9],"transistors":[10],"are":[11,93,129],"perceived":[12],"as":[13],"future":[14],"replacements":[15],"for":[16],"Si":[17],"IGBTs":[18],"in":[21,74],"medium-":[22],"low-voltage":[24],"drives":[25,52],"due":[26],"to":[27,132],"their":[28],"low":[29],"conduction":[30],"switching":[32,60,122],"losses.":[33],"However,":[34],"it":[35],"is":[36,112,124],"widely":[37],"believed":[38],"that":[39,102],"the":[40,58,72,75,99,103,108,116,119,134],"already":[41],"significant":[42],"conducted":[43,76,109,131],"common-mode":[44],"(CM)":[45],"electromagnetic":[46],"interference":[47],"(EMI)":[48],"emission":[49,79,111],"of":[50,62,80,105,121],"motor":[51,86],"will":[53],"be":[54],"further":[55],"exacerbated":[56],"by":[57],"high-speed":[59],"operation":[61],"these":[63],"new":[64],"devices.":[65],"Hence,":[66],"this":[67],"paper":[68],"investigates":[69],"quantifies":[71],"increase":[73],"CM":[77,110],"EMI":[78],"a":[81],"pulse":[82],"width":[83],"modulation":[84],"inverter-based":[85],"drive":[87],"when":[88],"SiC":[89],"GaN":[91],"devices":[92],"adopted.":[94],"Through":[95],"an":[96],"analytical":[97],"approach,":[98],"results":[100],"reveal":[101],"influence":[104,120],"dv/dt":[106],"on":[107],"generally":[113],"limited.":[114],"On":[115],"other":[117],"hand,":[118],"frequency":[123],"more":[125],"significant.":[126],"Lab":[127],"tests":[128],"also":[130],"verify":[133],"analysis.":[135]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":29},{"year":2024,"cited_by_count":33},{"year":2023,"cited_by_count":33},{"year":2022,"cited_by_count":29},{"year":2021,"cited_by_count":42},{"year":2020,"cited_by_count":41},{"year":2019,"cited_by_count":38},{"year":2018,"cited_by_count":20},{"year":2017,"cited_by_count":11}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}