{"id":"https://openalex.org/W2782019278","doi":"https://doi.org/10.1109/test.2017.8242027","title":"Automotive keynote: Look Mom! No hands!","display_name":"Automotive keynote: Look Mom! No hands!","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2782019278","doi":"https://doi.org/10.1109/test.2017.8242027","mag":"2782019278"},"language":"en","primary_location":{"id":"doi:10.1109/test.2017.8242027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062170311","display_name":"Joachim Kunkel","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Joachim Kunkel","raw_affiliation_strings":["Synopsys, Inc. Corporate Staff"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc. Corporate Staff","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062170311"],"corresponding_institution_ids":["https://openalex.org/I1335490905"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.26235862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9435999989509583,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9435999989509583,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9232000112533569,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8794183731079102},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6816667318344116},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5786711573600769},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4823993444442749},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.4758060872554779},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.4610670208930969},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4608336091041565},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.4408166706562042},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39459890127182007},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3478873372077942},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3346726894378662},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.262692928314209},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.16594484448432922},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10760810971260071}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8794183731079102},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6816667318344116},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5786711573600769},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4823993444442749},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.4758060872554779},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.4610670208930969},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4608336091041565},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.4408166706562042},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39459890127182007},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3478873372077942},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3346726894378662},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.262692928314209},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.16594484448432922},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10760810971260071},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2017.8242027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4401670978","https://openalex.org/W2758348730","https://openalex.org/W2132658806","https://openalex.org/W122916748","https://openalex.org/W2013364747","https://openalex.org/W2370405293","https://openalex.org/W2350720519","https://openalex.org/W4210295735","https://openalex.org/W2995193815","https://openalex.org/W4206754221"],"abstract_inverted_index":{"After":[0],"many":[1],"years":[2],"of":[3,54,86,93],"relying":[4],"on":[5],"established":[6],"processes":[7],"technology":[8],"geometries,":[9],"advanced":[10],"automotive":[11,61,76,87],"semiconductors,":[12],"driven":[13],"by":[14,36],"assisted":[15],"and":[16,38,57,78,81,98],"autonomous":[17],"driving":[18],"systems,":[19],"have":[20],"recently":[21],"joined":[22],"the":[23,32,45,60,71,84,91],"race":[24],"to":[25,70],"ever":[26],"smaller":[27],"semiconductor":[28,41],"process":[29],"technologies.":[30],"If":[31],"massive":[33],"functionality":[34],"enabled":[35],"16-nm":[37],"below":[39],"FinFET":[40],"processes,":[42],"combined":[43],"with":[44],"new":[46],"fault":[47],"mechanisms":[48],"they":[49],"bring":[50],"along,":[51],"weren't":[52],"enough":[53],"a":[55,66,94],"test":[56,77,95],"repair":[58,79],"challenge,":[59],"functional":[62,88],"safety":[63,89],"requirements":[64,80],"add":[65],"whole":[67],"other":[68],"dimension":[69],"problem.":[72],"This":[73],"talk":[74],"discusses":[75],"solutions":[82],"in":[83],"context":[85],"from":[90],"perspective":[92],"automation":[96],"tool":[97],"IP":[99],"provider.":[100]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}