{"id":"https://openalex.org/W2047503024","doi":"https://doi.org/10.1109/test.2012.6401558","title":"Hybrid selector for high-X scan compression","display_name":"Hybrid selector for high-X scan compression","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2047503024","doi":"https://doi.org/10.1109/test.2012.6401558","mag":"2047503024"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065896534","display_name":"P. Wohl","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"P. Wohl","raw_affiliation_strings":["Synopsys, Inc","Synopsys. Inc.#TAB#"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc","institution_ids":["https://openalex.org/I1335490905"]},{"raw_affiliation_string":"Synopsys. Inc.#TAB#","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062016144","display_name":"J.A. Waicukauski","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"J. A. Waicukauski","raw_affiliation_strings":["Synopsys, Inc","Synopsys. Inc.#TAB#"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc","institution_ids":["https://openalex.org/I1335490905"]},{"raw_affiliation_string":"Synopsys. Inc.#TAB#","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072452862","display_name":"F. Neuveux","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"F. Neuveux","raw_affiliation_strings":["Synopsys, Inc","Synopsys. Inc.#TAB#"],"affiliations":[{"raw_affiliation_string":"Synopsys, Inc","institution_ids":["https://openalex.org/I1335490905"]},{"raw_affiliation_string":"Synopsys. Inc.#TAB#","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070673314","display_name":"J.E. Colburn","orcid":"https://orcid.org/0009-0007-2166-6281"},"institutions":[{"id":"https://openalex.org/I1304085615","display_name":"Nvidia (United Kingdom)","ror":"https://ror.org/02kr42612","country_code":"GB","type":"company","lineage":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. E. Colburn","raw_affiliation_strings":["NVIDIA Corp","NVIDIA.CORPORATION"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corp","institution_ids":[]},{"raw_affiliation_string":"NVIDIA.CORPORATION","institution_ids":["https://openalex.org/I1304085615"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5065896534"],"corresponding_institution_ids":["https://openalex.org/I1335490905"],"apc_list":null,"apc_paid":null,"fwci":0.2901,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.56445569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.8811373114585876},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.78452467918396},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.6748930215835571},{"id":"https://openalex.org/keywords/compression-ratio","display_name":"Compression ratio","score":0.6054491996765137},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5762252807617188},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40437284111976624},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.22792598605155945},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16437965631484985},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16289979219436646}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.8811373114585876},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.78452467918396},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.6748930215835571},{"id":"https://openalex.org/C25797200","wikidata":"https://www.wikidata.org/wiki/Q828137","display_name":"Compression ratio","level":3,"score":0.6054491996765137},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5762252807617188},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40437284111976624},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.22792598605155945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16437965631484985},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16289979219436646},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.0},{"id":"https://openalex.org/C511840579","wikidata":"https://www.wikidata.org/wiki/Q12757","display_name":"Internal combustion engine","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2012.6401558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W655675557","https://openalex.org/W1484351771","https://openalex.org/W1515082873","https://openalex.org/W1548070247","https://openalex.org/W1576951655","https://openalex.org/W1590110141","https://openalex.org/W1592515516","https://openalex.org/W1601643892","https://openalex.org/W1844723944","https://openalex.org/W2046314918","https://openalex.org/W2058785831","https://openalex.org/W2087289986","https://openalex.org/W2097417935","https://openalex.org/W2114204923","https://openalex.org/W2118512592","https://openalex.org/W2125577649","https://openalex.org/W2127737927","https://openalex.org/W2131432014","https://openalex.org/W2131694824","https://openalex.org/W2134998505","https://openalex.org/W2138530143","https://openalex.org/W2139009001","https://openalex.org/W2144033909","https://openalex.org/W2146985446","https://openalex.org/W2147823627","https://openalex.org/W2149093111","https://openalex.org/W2161517301","https://openalex.org/W2165030600","https://openalex.org/W2169451209","https://openalex.org/W2171732829","https://openalex.org/W2614184438","https://openalex.org/W4237437496","https://openalex.org/W4246650320","https://openalex.org/W4297159816","https://openalex.org/W6621810450","https://openalex.org/W6737889296"],"related_works":["https://openalex.org/W1512321724","https://openalex.org/W4231317009","https://openalex.org/W326456911","https://openalex.org/W2367696392","https://openalex.org/W4383723869","https://openalex.org/W4293703255","https://openalex.org/W2161302774","https://openalex.org/W2388481516","https://openalex.org/W4384298135","https://openalex.org/W4383722264"],"abstract_inverted_index":{"Scan":[0],"testing":[1],"and":[2,48,77,93],"scan":[3,46],"compression":[4,66,92],"are":[5],"widely":[6],"used,":[7],"but":[8],"ever":[9],"more":[10,42],"complex":[11],"designs":[12,84],"require":[13],"higher":[14],"compression,":[15],"while":[16,40],"the":[17,61,69],"increased":[18],"density":[19,70],"of":[20,44,71],"unknown":[21,72],"(X)":[22],"values":[23,73],"reduces":[24],"effective":[25],"compression.":[26],"In":[27],"this":[28],"paper,":[29],"we":[30],"present":[31],"a":[32],"new":[33],"selector":[34,62],"design":[35],"which":[36,49],"blocks":[37],"all":[38],"Xs":[39],"allowing":[41],"observability":[43],"non-X":[45],"cells":[47],"requires":[50],"fewer":[51],"input":[52],"control":[53],"values.":[54],"Supported":[55],"by":[56],"novel":[57],"test":[58,94],"generation":[59],"algorithms,":[60],"enables":[63],"very":[64,75],"high":[65,76,91],"even":[67],"if":[68],"is":[74],"varies":[78],"every":[79],"shift.":[80],"Results":[81],"on":[82],"industrial":[83],"with":[85],"various":[86],"X":[87],"densities":[88],"demonstrate":[89],"consistently":[90],"coverage.":[95]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}