{"id":"https://openalex.org/W2134865714","doi":"https://doi.org/10.1109/test.2012.6401537","title":"A digital method for phase noise measurement","display_name":"A digital method for phase noise measurement","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2134865714","doi":"https://doi.org/10.1109/test.2012.6401537","mag":"2134865714"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401537","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401537","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039830523","display_name":"Allan Ecker","orcid":null},"institutions":[{"id":"https://openalex.org/I58610484","display_name":"Seattle University","ror":"https://ror.org/02jqc0m91","country_code":"US","type":"education","lineage":["https://openalex.org/I58610484"]},{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Allan Ecker","raw_affiliation_strings":["University of Washington, Seattle, USA","University of Washington - Seattle, USA"],"affiliations":[{"raw_affiliation_string":"University of Washington, Seattle, USA","institution_ids":["https://openalex.org/I201448701","https://openalex.org/I58610484"]},{"raw_affiliation_string":"University of Washington - Seattle, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026305197","display_name":"Ken Blakkan","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]},{"id":"https://openalex.org/I58610484","display_name":"Seattle University","ror":"https://ror.org/02jqc0m91","country_code":"US","type":"education","lineage":["https://openalex.org/I58610484"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ken Blakkan","raw_affiliation_strings":["University of Washington, Seattle, USA","University of Washington - Seattle, USA"],"affiliations":[{"raw_affiliation_string":"University of Washington, Seattle, USA","institution_ids":["https://openalex.org/I201448701","https://openalex.org/I58610484"]},{"raw_affiliation_string":"University of Washington - Seattle, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112265787","display_name":"M. Soma","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]},{"id":"https://openalex.org/I58610484","display_name":"Seattle University","ror":"https://ror.org/02jqc0m91","country_code":"US","type":"education","lineage":["https://openalex.org/I58610484"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mani Soma","raw_affiliation_strings":["University of Washington, Seattle, USA","University of Washington - Seattle, USA"],"affiliations":[{"raw_affiliation_string":"University of Washington, Seattle, USA","institution_ids":["https://openalex.org/I201448701","https://openalex.org/I58610484"]},{"raw_affiliation_string":"University of Washington - Seattle, USA","institution_ids":["https://openalex.org/I201448701"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5039830523"],"corresponding_institution_ids":["https://openalex.org/I201448701","https://openalex.org/I58610484"],"apc_list":null,"apc_paid":null,"fwci":3.2455,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.92596262,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6917733550071716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6614837646484375},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.6451008915901184},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.6364526152610779},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.5535401701927185},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5402770638465881},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4559115171432495},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4533396065235138},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.4257681965827942},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.23829370737075806},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.22301331162452698},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17359840869903564},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11977452039718628},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10301876068115234}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6917733550071716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6614837646484375},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.6451008915901184},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.6364526152610779},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.5535401701927185},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5402770638465881},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4559115171432495},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4533396065235138},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.4257681965827942},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.23829370737075806},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.22301331162452698},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17359840869903564},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11977452039718628},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10301876068115234},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2012.6401537","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401537","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:digital.lib.washington.edu:1773/25477","is_oa":false,"landing_page_url":"https://digital.lib.washington.edu/bitstreams/ff0479ba-8d64-4d0e-8b5c-2eb2cda135d5/download","pdf_url":null,"source":{"id":"https://openalex.org/S4306401128","display_name":"ResearchWorks at the University of Washington (University of Washington)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I201448701","host_organization_name":"University of Washington","host_organization_lineage":["https://openalex.org/I201448701"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Thesis"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5799999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1501111449","https://openalex.org/W1537447520","https://openalex.org/W1537881105","https://openalex.org/W1793307733","https://openalex.org/W1839443115","https://openalex.org/W1971886777","https://openalex.org/W2002081725","https://openalex.org/W2018956219","https://openalex.org/W2053998514","https://openalex.org/W2096974486","https://openalex.org/W2102671182","https://openalex.org/W2106241283","https://openalex.org/W2110466008","https://openalex.org/W2120912680","https://openalex.org/W2137603067","https://openalex.org/W2142504726","https://openalex.org/W2158155314","https://openalex.org/W2987221203","https://openalex.org/W3105670805"],"related_works":["https://openalex.org/W2073634370","https://openalex.org/W2154061062","https://openalex.org/W3198195942","https://openalex.org/W2077191990","https://openalex.org/W3046469549","https://openalex.org/W2154317586","https://openalex.org/W2105611532","https://openalex.org/W2125896897","https://openalex.org/W2978383591","https://openalex.org/W2910846249"],"abstract_inverted_index":{"To":[0],"reduce":[1],"the":[2,21],"test":[3],"costs":[4],"of":[5],"phase":[6,16],"noise":[7,17],"measurements,":[8],"we":[9],"use":[10],"all-digital":[11],"methods":[12],"to":[13],"detect":[14],"sinusoidal":[15],"components":[18],"while":[19],"reducing":[20],"need":[22],"for":[23],"computation":[24],"intensive":[25],"FFT.":[26]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":5}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}