{"id":"https://openalex.org/W2001773130","doi":"https://doi.org/10.1109/test.2011.6139174","title":"Forward prediction based on wafer sort data — A case study","display_name":"Forward prediction based on wafer sort data — A case study","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2001773130","doi":"https://doi.org/10.1109/test.2011.6139174","mag":"2001773130"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139174","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139174","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078270682","display_name":"Nik Sumikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Nik Sumikawa","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","Department of ECE, UC-Santa Barbara"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Department of ECE, UC-Santa Barbara","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075267840","display_name":"Dragoljub Drmanac","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Gagi Drmanac","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","Department of ECE, UC-Santa Barbara"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Department of ECE, UC-Santa Barbara","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li-C. Wang","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","Department of ECE, UC-Santa Barbara"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Department of ECE, UC-Santa Barbara","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084205383","display_name":"LeRoy Winemberg","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"LeRoy Winemberg","raw_affiliation_strings":["Freescale Semiconductor, Inc., USA","Freescale Semiconductor Inc"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semiconductor Inc","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011349515","display_name":"Magdy S. Abadir","orcid":"https://orcid.org/0000-0003-4046-2472"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Magdy S. Abadir","raw_affiliation_strings":["Freescale Semiconductor, Inc., USA","Freescale Semiconductor Inc"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semiconductor Inc","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5078270682"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":3.7776,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.92420375,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sort","display_name":"sort","score":0.7424455881118774},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6858742833137512},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.6782807111740112},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.6125532388687134},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5935643911361694},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5585898756980896},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5404693484306335},{"id":"https://openalex.org/keywords/wafer-testing","display_name":"Wafer testing","score":0.5204160809516907},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5055172443389893},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.501518964767456},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4524775743484497},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4519557058811188},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.43045079708099365},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.4291518032550812},{"id":"https://openalex.org/keywords/binary-classification","display_name":"Binary classification","score":0.41051116585731506},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.3405337929725647},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22011220455169678},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.12126365303993225},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.10696718096733093},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.08191731572151184}],"concepts":[{"id":"https://openalex.org/C88548561","wikidata":"https://www.wikidata.org/wiki/Q347599","display_name":"sort","level":2,"score":0.7424455881118774},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6858742833137512},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.6782807111740112},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.6125532388687134},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5935643911361694},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5585898756980896},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5404693484306335},{"id":"https://openalex.org/C44445679","wikidata":"https://www.wikidata.org/wiki/Q2538844","display_name":"Wafer testing","level":3,"score":0.5204160809516907},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5055172443389893},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.501518964767456},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4524775743484497},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4519557058811188},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.43045079708099365},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.4291518032550812},{"id":"https://openalex.org/C66905080","wikidata":"https://www.wikidata.org/wiki/Q17005494","display_name":"Binary classification","level":3,"score":0.41051116585731506},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.3405337929725647},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22011220455169678},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.12126365303993225},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.10696718096733093},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.08191731572151184},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139174","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139174","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1560724230","https://openalex.org/W1993220166","https://openalex.org/W2023450550","https://openalex.org/W2053724458","https://openalex.org/W2073822939","https://openalex.org/W2103333826","https://openalex.org/W2114167043","https://openalex.org/W2132870739","https://openalex.org/W2139497890","https://openalex.org/W2151378770","https://openalex.org/W2153635508","https://openalex.org/W2156227942","https://openalex.org/W2157826322","https://openalex.org/W2158176397","https://openalex.org/W2158695520","https://openalex.org/W2168239639","https://openalex.org/W3120421331","https://openalex.org/W3195149063","https://openalex.org/W6675969814","https://openalex.org/W6683379014","https://openalex.org/W7058071925"],"related_works":["https://openalex.org/W2131302668","https://openalex.org/W2028462208","https://openalex.org/W2982831492","https://openalex.org/W4285337533","https://openalex.org/W3195353062","https://openalex.org/W3138055416","https://openalex.org/W2187490799","https://openalex.org/W1574942924","https://openalex.org/W3094735304","https://openalex.org/W3019226033"],"abstract_inverted_index":{"This":[0],"paper":[1],"studies":[2],"the":[3,12,31,71,144],"potential":[4],"of":[5,14,37],"using":[6,22],"wafer":[7],"probe":[8],"tests":[9],"to":[10,46,57,139],"predict":[11],"outcome":[13],"future":[15],"tests.":[16],"The":[17],"study":[18],"is":[19,95],"carried":[20],"out":[21],"test":[23],"data":[24],"based":[25],"on":[26],"an":[27,79,137],"SoC":[28],"design":[29],"for":[30,86,97],"automotive":[32],"market.":[33],"Given":[34],"a":[35,49,109,122],"set":[36],"known":[38],"failing":[39,60,72,88,99,111],"parts,":[40],"there":[41],"are":[42,74],"two":[43,129],"possible":[44],"approaches":[45],"learn.":[47],"First":[48],"single":[50],"binary":[51],"classification":[52],"model":[53,58,82,124],"can":[54,67,83,125],"be":[55,68,84,126],"learned":[56,85],"all":[59],"parts.":[61],"We":[62,90,113],"show":[63,91,115],"that":[64,92,116],"this":[65,93],"approach":[66,94],"effective":[69],"if":[70],"parts":[73,100],"compatible":[75],"in":[76,128],"learning.":[77],"Second,":[78],"individual":[80],"outlier":[81],"each":[87,106],"part.":[89],"suitable":[96],"learning":[98,123],"such":[101],"as":[102],"customer":[103],"returns,":[104],"where":[105],"may":[107],"have":[108],"unique":[110],"behavior.":[112],"also":[114],"with":[117],"Principal":[118],"Component":[119],"Analysis":[120],"(PCA),":[121],"visualized":[127],"or":[130,142],"three":[131],"dimensional":[132],"PC":[133],"space,":[134],"which":[135],"facilitates":[136],"engineer":[138],"manually":[140],"select":[141],"adjust":[143],"model.":[145]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}