{"id":"https://openalex.org/W2106460721","doi":"https://doi.org/10.1109/test.2007.4437652","title":"SiP-test: Predicting delivery quality","display_name":"SiP-test: Predicting delivery quality","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2106460721","doi":"https://doi.org/10.1109/test.2007.4437652","mag":"2106460721"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004441305","display_name":"A. Biewenga","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Alex Biewenga","raw_affiliation_strings":["NXP Semiconductors, Eindhoven, Netherlands","NXP Semicond., Eindhoven"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semicond., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110504524","display_name":"Frans de Jong","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Frans de Jong","raw_affiliation_strings":["NXP Semiconductors, Eindhoven, Netherlands","NXP Semicond., Eindhoven"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semicond., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5004441305"],"corresponding_institution_ids":["https://openalex.org/I109147379"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.11412665,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7061676383018494},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5690094828605652},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5653905868530273},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5579779744148254},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.46088266372680664},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4435696005821228},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.4292275011539459},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4156160354614258},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.225346177816391},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.15250751376152039},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.06725099682807922}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7061676383018494},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5690094828605652},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5653905868530273},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5579779744148254},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.46088266372680664},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4435696005821228},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4292275011539459},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4156160354614258},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.225346177816391},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.15250751376152039},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.06725099682807922},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2007.4437652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1547098962","https://openalex.org/W1879900893","https://openalex.org/W1988192422","https://openalex.org/W2058885739"],"related_works":["https://openalex.org/W4234874385","https://openalex.org/W2323648130","https://openalex.org/W2157140558","https://openalex.org/W2378782423","https://openalex.org/W4233308809","https://openalex.org/W2388988621","https://openalex.org/W2357797405","https://openalex.org/W2366623913","https://openalex.org/W2374905595","https://openalex.org/W4256020104"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,69,83],"intricacies":[4],"of":[5,9,25],"predicting":[6],"delivery":[7,23],"quality":[8,24],"system":[10],"in":[11,29,47,76],"package":[12],"(SiP)":[13],"devices.":[14],"The":[15,22,37],"basic":[16],"production":[17],"process":[18],"is":[19,27,62],"explained":[20],"first.":[21],"SiPs":[26],"discussed":[28],"relation":[30],"to":[31,49,66,78,81],"manufacturing":[32],"yield":[33,72],"and":[34,52,73],"test":[35,74],"coverage.":[36],"presented":[38,63],"tools":[39],"have":[40],"been":[41],"kept":[42],"as":[43,45],"simple":[44],"possible":[46],"order":[48,77],"make":[50],"quick":[51],"easy":[53],"application":[54],"possible.":[55],"Finally":[56],"a":[57],"method":[58],"for":[59],"sensitivity":[60],"analysis":[61],"that":[64],"helps":[65],"fine":[67],"tune":[68],"balance":[70],"between":[71],"coverage":[75],"be":[79],"able":[80],"optimize":[82],"cost":[84],"versus":[85],"benefits.":[86]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}