{"id":"https://openalex.org/W2034030717","doi":"https://doi.org/10.1109/test.2007.4437649","title":"Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects","display_name":"Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2034030717","doi":"https://doi.org/10.1109/test.2007.4437649","mag":"2034030717"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082331096","display_name":"J. Geuzebroek","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Jeroen Geuzebroek","raw_affiliation_strings":["NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","I&T / Res., NXP Semicond. Corp., Eindhoven"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"I&T / Res., NXP Semicond. Corp., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044629739","display_name":"Erik Jan Marinissen","orcid":"https://orcid.org/0000-0002-5058-8303"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Erik Jan Marinissen","raw_affiliation_strings":["NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","NXP Semiconductors, Corporate I&T / DTF, High Tech Campus 37, 5656AE Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semiconductors, Corporate I&T / DTF, High Tech Campus 37, 5656AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113662264","display_name":"Ananta K. Majhi","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ananta Majhi","raw_affiliation_strings":["NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","NXP Semiconductors, Corporate I&T / DTF, High Tech Campus 37, 5656AE Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Corporate Innovation and Technology Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semiconductors, Corporate I&T / DTF, High Tech Campus 37, 5656AE Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066282637","display_name":"Andreas Glowatz","orcid":"https://orcid.org/0000-0002-8086-6220"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"Andreas Glowatz","raw_affiliation_strings":["NXP Semiconductors, Corporate I and T/DTF, Hamburg, Germany","NXP Semiconductors, Corporate I&T / DTF, Georg-Heyken-Stra\u00dfe 1, D-21147 Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Corporate I and T/DTF, Hamburg, Germany","institution_ids":["https://openalex.org/I4210123704"]},{"raw_affiliation_string":"NXP Semiconductors, Corporate I&T / DTF, Georg-Heyken-Stra\u00dfe 1, D-21147 Hamburg, Germany","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065187948","display_name":"Friedrich Hapke","orcid":"https://orcid.org/0000-0001-8744-3039"},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]},{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"Friedrich Hapke","raw_affiliation_strings":["NXP Semiconductors, Corporate I and T/DTF, Hamburg, Germany","NXP Semiconductors, Corporate I&T / DTF, Georg-Heyken-Stra\u00dfe 1, D-21147 Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Corporate I and T/DTF, Hamburg, Germany","institution_ids":["https://openalex.org/I4210123704"]},{"raw_affiliation_string":"NXP Semiconductors, Corporate I&T / DTF, Georg-Heyken-Stra\u00dfe 1, D-21147 Hamburg, Germany","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082331096"],"corresponding_institution_ids":["https://openalex.org/I109147379"],"apc_list":null,"apc_paid":null,"fwci":6.0357,"has_fulltext":false,"cited_by_count":66,"citation_normalized_percentile":{"value":0.96091361,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8081809282302856},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5603196024894714},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5202130675315857},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5098018050193787},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4904181659221649},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4682259261608124},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4587138295173645},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.4233984351158142},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36052730679512024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24877169728279114},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.209232896566391},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.16622933745384216},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10035094618797302},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.07321518659591675}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8081809282302856},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5603196024894714},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5202130675315857},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5098018050193787},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4904181659221649},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4682259261608124},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4587138295173645},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.4233984351158142},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36052730679512024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24877169728279114},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.209232896566391},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.16622933745384216},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10035094618797302},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.07321518659591675},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2007.4437649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309036","display_name":"Purdue University","ror":"https://ror.org/02dqehb95"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1592030557","https://openalex.org/W1600468096","https://openalex.org/W1690611602","https://openalex.org/W1895791932","https://openalex.org/W1990723067","https://openalex.org/W2103935412","https://openalex.org/W2107995582","https://openalex.org/W2117031250","https://openalex.org/W2119041895","https://openalex.org/W2119205109","https://openalex.org/W2131845814","https://openalex.org/W2134142685","https://openalex.org/W2136534898","https://openalex.org/W2140289669","https://openalex.org/W2141552561","https://openalex.org/W2149949200","https://openalex.org/W2156747864","https://openalex.org/W2161824088","https://openalex.org/W2171908682","https://openalex.org/W4252726629","https://openalex.org/W6677480915"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2129713538","https://openalex.org/W2341817401","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2128148266","https://openalex.org/W1493811107","https://openalex.org/W3038280805"],"abstract_inverted_index":{"The":[0],"demand":[1],"for":[2],"higher":[3,71],"quality":[4,72],"requires":[5],"more":[6,27,94],"effective":[7],"testing":[8],"to":[9,92],"filter":[10],"out":[11],"the":[12,39,46],"bad":[13],"devices.":[14],"It":[15],"is":[16],"already":[17],"known":[18],"that":[19,59,86],"multi-detection":[20,61],"of":[21,30,62],"single":[22],"stuck-at":[23,35,100],"faults":[24,63],"results":[25,68,84],"in":[26,69,77],"fortuitous":[28],"detections":[29],"defects":[31],"not":[32],"behaving":[33],"as":[34],"faults,":[36],"which":[37],"increases":[38],"test":[40,53,78],"quality.":[41],"Existing":[42],"multi-detect":[43,88],"tests,":[44,49],"i.e.,":[45],"well-known":[47],"n-detect":[48],"suffer":[50],"from":[51],"significant":[52,75],"size":[54],"increases.":[55],"This":[56],"paper":[57],"shows":[58],"embedding":[60],"within":[64],"regular":[65],"ATPG":[66],"patterns":[67],"a":[70,74],"without":[73],"increase":[76],"set":[79],"size.":[80],"High-volume":[81],"silicon":[82],"measurement":[83],"demonstrate":[85],"embedded":[87],"tests":[89],"detect":[90],"2.3%":[91],"4.7%":[93],"defective":[95],"devices":[96],"than":[97],"conventional":[98],"single-detect":[99],"tests.":[101]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":7}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}