{"id":"https://openalex.org/W2095709610","doi":"https://doi.org/10.1109/test.2007.4437595","title":"High throughput non-contact SiP testing","display_name":"High throughput non-contact SiP testing","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2095709610","doi":"https://doi.org/10.1109/test.2007.4437595","mag":"2095709610"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110255845","display_name":"B. Moore","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"B. Moore","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, Edmonton, AB"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, Edmonton, AB","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009299853","display_name":"C. Sellathamby","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"C. Sellathamby","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, Edmonton, AB"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, Edmonton, AB","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012495022","display_name":"Philippe Cauvet","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"P. Cauvet","raw_affiliation_strings":["NXP Semiconductors, Caen, France","NXP Semiconductors, 2 Esplanade Anton Philips B.P. 20000 14906 Caen Cedex 9, France"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Caen, France","institution_ids":[]},{"raw_affiliation_string":"NXP Semiconductors, 2 Esplanade Anton Philips B.P. 20000 14906 Caen Cedex 9, France","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043340550","display_name":"Herv\u00e9 Fleury","orcid":"https://orcid.org/0000-0002-5318-489X"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. Fleury","raw_affiliation_strings":["NXP Semiconductors, Caen, France","NXP Semiconductors, 2 Esplanade Anton Philips B.P. 20000 14906 Caen Cedex 9, France"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Caen, France","institution_ids":[]},{"raw_affiliation_string":"NXP Semiconductors, 2 Esplanade Anton Philips B.P. 20000 14906 Caen Cedex 9, France","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052410517","display_name":"Molly Paulson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M. Paulson","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110077950","display_name":"M. Reja","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M. Reja","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055236645","display_name":"Lin Fu","orcid":"https://orcid.org/0000-0001-8979-8415"},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"L. Fu","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108532683","display_name":"B. Bai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"B. Bai","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091198697","display_name":"E. Reid","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"E. Reid","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005756068","display_name":"I.M. Filanovsky","orcid":"https://orcid.org/0000-0002-2665-5211"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"I. Filanovsky","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada","Dept. of Electrical and Computer Engineering, University of Alberta, Edmonton, T6G 2V4, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada","institution_ids":["https://openalex.org/I154425047"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, University of Alberta, Edmonton, T6G 2V4, Canada","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011945276","display_name":"S. Slupsky","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092272","display_name":"Scanimetrics (Canada)","ror":"https://ror.org/00e6d8m49","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210092272"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S. Slupsky","raw_affiliation_strings":["RTF, Scanimetrics, Inc., Edmonton, AB, Canada","Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada"],"affiliations":[{"raw_affiliation_string":"RTF, Scanimetrics, Inc., Edmonton, AB, Canada","institution_ids":["https://openalex.org/I4210092272"]},{"raw_affiliation_string":"Scanimetrics Inc. RTF, 8308 - 114 Street, Edmonton, Alberta, T6G 2E1, Canada","institution_ids":["https://openalex.org/I4210092272"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5110255845"],"corresponding_institution_ids":["https://openalex.org/I4210092272"],"apc_list":null,"apc_paid":null,"fwci":3.8637,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.93353927,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"2","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.7772648334503174},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.6289238929748535},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5638484954833984},{"id":"https://openalex.org/keywords/system-in-package","display_name":"System in package","score":0.5503867268562317},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.48445677757263184},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.46730777621269226},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.46673664450645447},{"id":"https://openalex.org/keywords/wafer-testing","display_name":"Wafer testing","score":0.466718852519989},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4460224509239197},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4457568824291229},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4274606704711914},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4206688702106476},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41278234124183655},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.39888978004455566},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3701055645942688},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1904849410057068},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.11400821805000305}],"concepts":[{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.7772648334503174},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.6289238929748535},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5638484954833984},{"id":"https://openalex.org/C146667757","wikidata":"https://www.wikidata.org/wiki/Q1457198","display_name":"System in package","level":3,"score":0.5503867268562317},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.48445677757263184},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46730777621269226},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.46673664450645447},{"id":"https://openalex.org/C44445679","wikidata":"https://www.wikidata.org/wiki/Q2538844","display_name":"Wafer testing","level":3,"score":0.466718852519989},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4460224509239197},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4457568824291229},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4274606704711914},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4206688702106476},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41278234124183655},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.39888978004455566},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3701055645942688},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1904849410057068},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.11400821805000305}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2007.4437595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1519771134","https://openalex.org/W1576925215","https://openalex.org/W1595368737","https://openalex.org/W2049329577","https://openalex.org/W2075390235","https://openalex.org/W2104522423","https://openalex.org/W2111530597","https://openalex.org/W2114081084","https://openalex.org/W2125887454","https://openalex.org/W2146047176","https://openalex.org/W2149364102","https://openalex.org/W2151751223","https://openalex.org/W2162342991","https://openalex.org/W6635424516","https://openalex.org/W6681412785"],"related_works":["https://openalex.org/W2054845823","https://openalex.org/W2540312267","https://openalex.org/W2367528910","https://openalex.org/W2156694894","https://openalex.org/W2031579205","https://openalex.org/W2070188681","https://openalex.org/W4229506424","https://openalex.org/W2593225652","https://openalex.org/W4211068164","https://openalex.org/W2591846699"],"abstract_inverted_index":{"A":[0],"non-contact":[1,35,122],"method":[2],"for":[3,15],"parallel":[4,121],"testing":[5,17,123],"of":[6,18,29,91,116,124,132],"system-in-package":[7],"(SiP)":[8],"assemblies":[9],"is":[10,58,128],"presented.":[11],"This":[12],"technology":[13,33],"allows":[14],"JTAG":[16,95],"partially":[19],"or":[20,54],"fully":[21,110],"populated":[22],"SiPs":[23,125],"in":[24,27],"wafer":[25],"form,":[26],"advance":[28],"final":[30],"packaging.":[31],"The":[32,56,71],"utilizes":[34],"GHz":[36],"short-range,":[37],"near":[38],"field":[39],"communications":[40],"to":[41,45,65,81],"transfer":[42],"bi-directional":[43],"data":[44],"SiP":[46,117],"substrates;":[47],"creating":[48],"a":[49,61,129],"wireless":[50,69,72],"test":[51],"access":[52],"port":[53],"WTAP.":[55],"system":[57],"integrated":[59],"with":[60],"standard":[62,82,92],"probe":[63],"card":[64],"deliver":[66],"power":[67],"and":[68,87,94,106],"signals.":[70],"probes":[73],"convert":[74],"high":[75],"frequency":[76],"RF":[77],"(GHz)":[78],"transceiver":[79],"signals":[80],"tester":[83],"ATE":[84],"logic":[85],"levels":[86],"allow":[88],"the":[89,114],"use":[90,103],"probers":[93],"testers.":[96],"In":[97],"addition,":[98],"all":[99],"transceivers":[100],"(DUTand":[101],"probe)":[102],"antenna":[104],"structures":[105],"electronics":[107],"that":[108],"are":[109],"CMOS":[111],"compliant.":[112],"Enhancing":[113],"economics":[115],"manufacture":[118],"by":[119],"enabling":[120],"before":[126],"packaging":[127],"key":[130],"benefit":[131],"this":[133],"technology.":[134]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}