{"id":"https://openalex.org/W1999638666","doi":"https://doi.org/10.1109/test.2006.297682","title":"Seamless Integration of SER in Rewiring-Based Design Space Exploration","display_name":"Seamless Integration of SER in Rewiring-Based Design Space Exploration","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W1999638666","doi":"https://doi.org/10.1109/test.2006.297682","mag":"1999638666"},"language":"en","primary_location":{"id":"doi:10.1109/test.2006.297682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297682","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067901099","display_name":"Sobeeh Almukhaizim","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sobeeh Almukhaizim","raw_affiliation_strings":["Electrical Engineering Department, Yale University, New Heaven, CT, USA","Electrical Engineering Department, Yale University, New Haven, CT 06520, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Haven, CT 06520, USA#TAB#","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiorgos Makris","raw_affiliation_strings":["Electrical Engineering Department, Yale University, New Heaven, CT, USA","Electrical Engineering Department, Yale University, New Haven, CT 06520, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Electrical Engineering Department, Yale University, New Haven, CT 06520, USA#TAB#","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104114138","display_name":"Yu-Shen Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yu-shen Yang","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Toronto, Toronto, ONT, Canada","Electrical and Computer Engineering Department, University of Toronto, Toronto, Ontario, M5S 3G4, Canada"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Toronto, Toronto, ONT, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Toronto, Toronto, Ontario, M5S 3G4, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009841786","display_name":"Andreas Veneris","orcid":"https://orcid.org/0000-0002-6309-8821"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Andreas Veneris","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Toronto, Toronto, ONT, Canada","Electrical and Computer Engineering Department, University of Toronto, Toronto, Ontario, M5S 3G4, Canada"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Toronto, Toronto, ONT, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Toronto, Toronto, Ontario, M5S 3G4, Canada","institution_ids":["https://openalex.org/I185261750"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5067901099"],"corresponding_institution_ids":["https://openalex.org/I32971472"],"apc_list":null,"apc_paid":null,"fwci":6.8956,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.96894726,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7580660581588745},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7207655310630798},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6947991251945496},{"id":"https://openalex.org/keywords/design-space-exploration","display_name":"Design space exploration","score":0.49187612533569336},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.48520568013191223},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4719982147216797},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4379822015762329},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.4213699698448181},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.41658246517181396},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.4119776487350464},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.37436443567276},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3472631871700287},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34320777654647827},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.21065625548362732},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1526487171649933},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1501985490322113}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7580660581588745},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7207655310630798},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6947991251945496},{"id":"https://openalex.org/C2776221188","wikidata":"https://www.wikidata.org/wiki/Q21072556","display_name":"Design space exploration","level":2,"score":0.49187612533569336},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.48520568013191223},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4719982147216797},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4379822015762329},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.4213699698448181},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.41658246517181396},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.4119776487350464},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.37436443567276},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3472631871700287},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34320777654647827},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.21065625548362732},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1526487171649933},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1501985490322113},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2006.297682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297682","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.70.1968","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.70.1968","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eecg.utoronto.ca/~veneris/itc06.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1511688816","https://openalex.org/W1519198589","https://openalex.org/W1519746349","https://openalex.org/W1524791468","https://openalex.org/W2073418890","https://openalex.org/W2096541971","https://openalex.org/W2104122494","https://openalex.org/W2109932036","https://openalex.org/W2112770269","https://openalex.org/W2115559389","https://openalex.org/W2115931082","https://openalex.org/W2117115814","https://openalex.org/W2124956691","https://openalex.org/W2126833106","https://openalex.org/W2127735256","https://openalex.org/W2130715017","https://openalex.org/W2140388451","https://openalex.org/W2140831103","https://openalex.org/W2142732755","https://openalex.org/W2144038574","https://openalex.org/W2144881658","https://openalex.org/W2148596540","https://openalex.org/W2151806592","https://openalex.org/W2153125146","https://openalex.org/W2156056597","https://openalex.org/W2162318113","https://openalex.org/W2168242454","https://openalex.org/W2169213530","https://openalex.org/W2170227286","https://openalex.org/W4231440808","https://openalex.org/W4232345699","https://openalex.org/W4238068369","https://openalex.org/W4249381521","https://openalex.org/W6630623413","https://openalex.org/W6678515679"],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2118697956","https://openalex.org/W4249526199","https://openalex.org/W2168652618","https://openalex.org/W2166402441"],"abstract_inverted_index":{"Rewiring":[0],"has":[1],"been":[2],"used":[3,30,114],"extensively":[4],"for":[5,31,67,130],"optimizing":[6],"the":[7,9,12,15,33,69,75,78,88,117],"area,":[8,133],"power":[10,134],"consumption,":[11,135],"delay,":[13,136],"and":[14,103,138],"testability":[16],"of":[17,50,71,77,97,119],"a":[18,51,72,81,94,120,126],"circuit.":[19],"In":[20],"this":[21],"work,":[22],"we":[23],"demonstrate":[24],"how":[25],"rewiring":[26,42,60,109],"can":[27,110],"also":[28],"be":[29,112],"reducing":[32],"soft":[34],"error":[35],"rate":[36],"(SER).":[37],"We":[38],"employ":[39],"an":[40,64],"ATPG-based":[41],"method":[43,66],"to":[44,92,115],"generate":[45],"functionally-equivalent":[46],"yet":[47],"structurally-different":[48],"implementations":[49],"logic":[52],"circuit":[53,121],"based":[54],"on":[55,101],"simple":[56],"transformation":[57],"rules.":[58],"This":[59],"capability,":[61],"along":[62],"with":[63],"off-the-shelf":[65],"assessing":[68],"SER":[70,79,118,139],"circuit,":[73],"enable":[74],"integration":[76],"in":[80,90],"unified":[82],"search":[83],"algorithm":[84],"that":[85,108],"iteratively":[86],"evolves":[87],"design":[89],"order":[91],"satisfy":[93],"given":[95],"set":[96],"objectives.":[98],"Experimental":[99],"results":[100],"ISCAS'89":[102],"ITC'99":[104],"benchmark":[105],"circuits":[106],"verify":[107],"indeed":[111],"successfully":[113],"reduce":[116],"and,":[122],"thus,":[123],"it":[124],"facilitates":[125],"design-space":[127],"exploration":[128],"framework":[129],"trading":[131],"off":[132],"testability,":[137]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}