{"id":"https://openalex.org/W2058787708","doi":"https://doi.org/10.1109/test.2006.297649","title":"Optimizing the Cost of Test at Intel Using per Device Data","display_name":"Optimizing the Cost of Test at Intel Using per Device Data","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W2058787708","doi":"https://doi.org/10.1109/test.2006.297649","mag":"2058787708"},"language":"en","primary_location":{"id":"doi:10.1109/test.2006.297649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297649","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050401948","display_name":"Robert Edmondson","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Robert Edmondson","raw_affiliation_strings":["Intel Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061631704","display_name":"Gregory Iovino","orcid":null},"institutions":[{"id":"https://openalex.org/I4210158342","display_name":"Intel (United Kingdom)","ror":"https://ror.org/058cxws58","country_code":"GB","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210158342"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Gregory Iovino","raw_affiliation_strings":["Intel Corporation"],"affiliations":[{"raw_affiliation_string":"Intel Corporation","institution_ids":["https://openalex.org/I4210158342"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034192745","display_name":"Richard Kacprowicz","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Richard Kacprowicz","raw_affiliation_strings":["Intel Corporation, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5050401948"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":0.5575,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.65109628,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"9","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9689000248908997,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9689000248908997,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10715","display_name":"Distributed and Parallel Computing Systems","score":0.9678999781608582,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7463979721069336},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.652559757232666},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5868399143218994},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5270609855651855},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.5222576260566711},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.5220099091529846},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.45693886280059814},{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.43015530705451965},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3919619917869568},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3275325894355774},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3130273222923279},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2096153199672699},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16774019598960876},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.10914117097854614}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7463979721069336},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.652559757232666},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5868399143218994},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5270609855651855},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.5222576260566711},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.5220099091529846},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.45693886280059814},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.43015530705451965},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3919619917869568},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3275325894355774},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3130273222923279},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2096153199672699},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16774019598960876},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.10914117097854614},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C70410870","wikidata":"https://www.wikidata.org/wiki/Q199906","display_name":"Clinical psychology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2006.297649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297649","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1657391569","https://openalex.org/W2048097978","https://openalex.org/W2102789560"],"related_works":["https://openalex.org/W1987412493","https://openalex.org/W2367632954","https://openalex.org/W2406780792","https://openalex.org/W2183270069","https://openalex.org/W2360009419","https://openalex.org/W2350690961","https://openalex.org/W2601970970","https://openalex.org/W1967634894","https://openalex.org/W1628247813","https://openalex.org/W2484991267"],"abstract_inverted_index":{"The":[0],"optimization":[1,36,49],"of":[2,13],"Intel":[3],"Corporation's":[4],"test":[5,8,17,41,47,52,77],"process":[6],"and":[7,19,27,43,66],"cost":[9],"by":[10],"the":[11,73,83],"utilization":[12],"data":[14,68,75],"from":[15],"previous":[16],"steps":[18],"devices":[20],"in":[21,58],"order":[22],"to":[23,39,79],"make":[24],"flow":[25],"level":[26,29],"unit":[28],"testing":[30,85],"decisions,":[31],"including":[32],"adaptive":[33,84],"testing..":[34],"This":[35],"is":[37],"external":[38],"traditional":[40],"flows":[42],"enables":[44],"per":[45],"device":[46],"content":[48],"at":[50],"one":[51],"socket":[53],"or":[54],"between":[55,76],"multiple":[56],"sockets":[57,78],"a":[59],"high":[60],"volume":[61],"manufacturing":[62],"environment":[63],"using":[64],"online":[65],"offline":[67],"transfer":[69],"systems,":[70],"which":[71],"manage":[72],"critical":[74],"be":[80],"used":[81],"for":[82],"algorithms":[86],"themselves.":[87]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}