{"id":"https://openalex.org/W1953724919","doi":"https://doi.org/10.1109/test.2002.1041754","title":"Test point insertion that facilitates ATPG in reducing test time and data volume","display_name":"Test point insertion that facilitates ATPG in reducing test time and data volume","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1953724919","doi":"https://doi.org/10.1109/test.2002.1041754","mag":"1953724919"},"language":"en","primary_location":{"id":"doi:10.1109/test.2002.1041754","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041754","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077754100","display_name":"M.J. Geuzebroek","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"M.J. Geuzebroek","raw_affiliation_strings":["Department of Electrical Engineering Testing Laboratory, Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Testing Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103337327","display_name":"J.T. van der Linden","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J.T. van der Linden","raw_affiliation_strings":["Scientificial, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Scientificial, Delft, Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109858422","display_name":"A.J. van de Goor","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A.J. van de Goor","raw_affiliation_strings":["Department of Electrical Engineering Testing Laboratory, Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Testing Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077754100"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":1.238,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":{"value":0.79681946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"138","last_page":"147"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9319047927856445},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8137757778167725},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7427529692649841},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.704716682434082},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.6208205223083496},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6137100458145142},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5053125023841858},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.499025821685791},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.48567235469818115},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4702410101890564},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.46972477436065674},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46551916003227234},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.46498531103134155},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4595555067062378},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4191962778568268},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40023693442344666},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2737159729003906},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2615739703178406},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22466686367988586},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19930434226989746},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.13799363374710083},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11654806137084961},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06960657238960266},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06092032790184021}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9319047927856445},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8137757778167725},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7427529692649841},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.704716682434082},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.6208205223083496},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6137100458145142},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5053125023841858},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.499025821685791},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.48567235469818115},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4702410101890564},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.46972477436065674},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46551916003227234},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.46498531103134155},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4595555067062378},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4191962778568268},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40023693442344666},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2737159729003906},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2615739703178406},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22466686367988586},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19930434226989746},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.13799363374710083},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11654806137084961},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06960657238960266},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06092032790184021},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2002.1041754","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2002.1041754","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.7.5786","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.7.5786","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://ce.et.tudelft.nl/~mjgeuze/papers/tpi_atpg02.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W1959966107","https://openalex.org/W1977294468","https://openalex.org/W2021645550","https://openalex.org/W2025145240","https://openalex.org/W2117394347","https://openalex.org/W2118133071","https://openalex.org/W2134427430","https://openalex.org/W2150787880","https://openalex.org/W2152406824","https://openalex.org/W2162874773","https://openalex.org/W2167639389","https://openalex.org/W3099971795","https://openalex.org/W4247119135","https://openalex.org/W6600530048","https://openalex.org/W6785118881"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W2118697956"],"abstract_inverted_index":{"Efficient":[0],"production":[1],"testing":[2],"is":[3],"frequently":[4],"hampered":[5],"because":[6,56],"current":[7],"digital":[8],"circuits":[9],"require":[10],"test":[11,18,27,52,100,110,121,136,148],"sets":[12,19,111],"which":[13],"are":[14],"too":[15],"large.":[16],"These":[17],"can":[20,104],"be":[21,105,114],"reduced":[22],"significantly":[23],"by":[24],"means":[25],"of":[26,131],"point":[28],"insertion":[29],"(TPI).":[30],"The":[31],"state-of-the-art":[32],"TPI":[33,70,80,132,142],"methods":[34,72],"only":[35],"focus":[36,58,84],"on":[37,59,85,133],"solving":[38],"one":[39],"or":[40],"two":[41,69],"possible":[42],"testability":[43,62,87],"problems,":[44],"and":[45,77],"sometimes":[46],"even":[47,115],"fail":[48],"to":[49,113],"result":[50],"in":[51,145],"set":[53,101,149],"size":[54,102,150],"reduction":[55,151],"they":[57],"the":[60,75,79,86,129],"wrong":[61],"problem.":[63],"In":[64,123],"this":[65,124],"paper,":[66],"we":[67,126],"propose":[68],"pre-process":[71],"that":[73,82,89,95,141],"analyze":[74],"circuit":[76],"select":[78],"method":[81],"will":[83],"problems":[88],"really":[90],"exist.":[91],"Experimental":[92,138],"results":[93,139,144],"indicate":[94,140],"with":[96],"these":[97],"pre-processes,":[98],"better":[99],"reductions":[103],"achieved.":[106],"Gate-delay":[107],"fault":[108,119,135,154],"ATPG":[109,120],"tend":[112],"larger":[116],"than":[117],"stuck-at":[118],"sets.":[122,137],"paper":[125],"have":[127],"evaluated":[128],"impact":[130],"gate-delay":[134,153],"also":[143],"a":[146],"significant":[147],"for":[152],"ATPG.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}