{"id":"https://openalex.org/W1675066755","doi":"https://doi.org/10.1109/test.1999.805767","title":"Interconnect delay fault testing with IEEE 1149.1","display_name":"Interconnect delay fault testing with IEEE 1149.1","publication_year":1999,"publication_date":"1999-01-01","ids":{"openalex":"https://openalex.org/W1675066755","doi":"https://doi.org/10.1109/test.1999.805767","mag":"1675066755"},"language":"en","primary_location":{"id":"doi:10.1109/test.1999.805767","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1999.805767","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102072375","display_name":"Yuejian Wu","orcid":"https://orcid.org/0009-0007-8127-6437"},"institutions":[{"id":"https://openalex.org/I153908563","display_name":"Nortel (Canada)","ror":"https://ror.org/03rz4pm90","country_code":"CA","type":"company","lineage":["https://openalex.org/I153908563"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Yuejian Wu","raw_affiliation_strings":["Nortel Networks Limited, Ottawa, ONT, Canada","Nortel Networks, Ottawa, Ont., Canada"],"affiliations":[{"raw_affiliation_string":"Nortel Networks Limited, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153908563"]},{"raw_affiliation_string":"Nortel Networks, Ottawa, Ont., Canada","institution_ids":["https://openalex.org/I153908563"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002789896","display_name":"P. Soong","orcid":null},"institutions":[{"id":"https://openalex.org/I153908563","display_name":"Nortel (Canada)","ror":"https://ror.org/03rz4pm90","country_code":"CA","type":"company","lineage":["https://openalex.org/I153908563"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Paul Soong","raw_affiliation_strings":["Nortel Networks Limited, Ottawa, ONT, Canada","[Nortel Networks]"],"affiliations":[{"raw_affiliation_string":"Nortel Networks Limited, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I153908563"]},{"raw_affiliation_string":"[Nortel Networks]","institution_ids":["https://openalex.org/I153908563"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102072375"],"corresponding_institution_ids":["https://openalex.org/I153908563"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.08715596,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"34","issue":null,"first_page":"449","last_page":"457"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.7609975337982178},{"id":"https://openalex.org/keywords/backplane","display_name":"Backplane","score":0.679376482963562},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6627082228660583},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.5519044399261475},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5461805462837219},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5459583401679993},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5004339218139648},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.48785924911499023},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4673759341239929},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4338664412498474},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3761957883834839},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3420717120170593},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.22556817531585693},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.19158366322517395},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.17463308572769165},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12573286890983582},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08233925700187683}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.7609975337982178},{"id":"https://openalex.org/C134256836","wikidata":"https://www.wikidata.org/wiki/Q545913","display_name":"Backplane","level":2,"score":0.679376482963562},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6627082228660583},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.5519044399261475},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5461805462837219},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5459583401679993},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5004339218139648},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.48785924911499023},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4673759341239929},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4338664412498474},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3761957883834839},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3420717120170593},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.22556817531585693},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.19158366322517395},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.17463308572769165},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12573286890983582},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08233925700187683},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.1999.805767","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.1999.805767","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1874606348","https://openalex.org/W2005319125","https://openalex.org/W2077913405","https://openalex.org/W2140018907","https://openalex.org/W2166053532","https://openalex.org/W2265498760","https://openalex.org/W6680460963"],"related_works":["https://openalex.org/W1748066428","https://openalex.org/W2166004767","https://openalex.org/W2135743693","https://openalex.org/W2108518148","https://openalex.org/W1991035950","https://openalex.org/W2016245341","https://openalex.org/W2145891343","https://openalex.org/W2110406241","https://openalex.org/W3149206619","https://openalex.org/W2150046587"],"abstract_inverted_index":{"In":[0],"high":[1],"speed":[2],"systems,":[3],"the":[4,47,105,124],"AC":[5],"performance":[6],"of":[7,49,91,104,123],"interconnects":[8],"on":[9,19,46],"boards":[10],"and":[11,52,96],"backplanes":[12],"are":[13,43],"critical.":[14],"Today,":[15],"most":[16],"companies":[17],"rely":[18],"functional":[20],"test":[21,67],"vectors":[22],"to":[23,61,84],"conduct":[24,62],"interconnect":[25,64],"delay":[26,65],"fault":[27,31,66],"tests.":[28],"Besides":[29],"poor":[30],"coverage,":[32],"this":[33,55],"approach":[34],"does":[35,78,86],"not":[36,79,87],"provide":[37],"much":[38],"diagnostic":[39],"information":[40],"when":[41],"faults":[42],"detected.":[44],"Based":[45],"concept":[48],"early":[50],"capture":[51],"late":[53],"update,":[54],"paper":[56],"proposes":[57],"a":[58,69,98,110,117],"novel":[59],"technique":[60,77,107],"board":[63],"using":[68],"IEEE":[70],"1149.1":[71],"standard":[72,92,99,125],"TAP":[73,100,118,126],"controller.":[74,101],"The":[75,102],"proposed":[76,106],"require":[80,88],"any":[81,89],"extra":[82],"pin":[83],"ASICs,":[85],"modification":[90,122],"boundary":[93],"scan":[94],"cells":[95],"uses":[97],"costs":[103],"include":[108],"only":[109],"few":[111],"flip-flops":[112],"plus":[113],"some":[114],"gates":[115],"in":[116],"controller":[119,127],"wrapper":[120],"without":[121],"itself.":[128]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}