{"id":"https://openalex.org/W4387831768","doi":"https://doi.org/10.1109/tcsi.2023.3322633","title":"Matrix-Based Digital Calibration Technique for High-Performance SAR and Pipeline ADCs","display_name":"Matrix-Based Digital Calibration Technique for High-Performance SAR and Pipeline ADCs","publication_year":2023,"publication_date":"2023-10-20","ids":{"openalex":"https://openalex.org/W4387831768","doi":"https://doi.org/10.1109/tcsi.2023.3322633"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3322633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3322633","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102931769","display_name":"Amr W. Hassan","orcid":"https://orcid.org/0000-0003-1356-4254"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Amr W. Hassan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057203782","display_name":"Dadian Zhou","orcid":"https://orcid.org/0000-0001-9068-890X"},"institutions":[{"id":"https://openalex.org/I4210154351","display_name":"Marvell (United States)","ror":"https://ror.org/04wmff902","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dadian Zhou","raw_affiliation_strings":["Marvell Semiconductors, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Marvell Semiconductors, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210154351"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024571753","display_name":"Jos\u00e9 Silva-Mart\u00ednez","orcid":"https://orcid.org/0000-0002-7960-0177"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jose Silva-Martinez","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102931769"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":1.7523,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.83865069,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"71","issue":"1","first_page":"20","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9692557454109192},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.6794111728668213},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6215375065803528},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5778155326843262},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5469442009925842},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5428614020347595},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5227158665657043},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.511555016040802},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5112550258636475},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.478402704000473},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.4057885706424713},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39080798625946045},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2639998197555542},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19627559185028076},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17568472027778625},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09584909677505493},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08244487643241882}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9692557454109192},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.6794111728668213},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6215375065803528},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5778155326843262},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5469442009925842},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5428614020347595},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5227158665657043},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.511555016040802},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5112550258636475},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.478402704000473},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.4057885706424713},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39080798625946045},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2639998197555542},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19627559185028076},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17568472027778625},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09584909677505493},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08244487643241882},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2023.3322633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3322633","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"},{"id":"https://openalex.org/F4320322589","display_name":"Taiwan Semiconductor Manufacturing Company","ror":"https://ror.org/02wx79d08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1585065018","https://openalex.org/W1994123466","https://openalex.org/W2050932080","https://openalex.org/W2056161289","https://openalex.org/W2064938289","https://openalex.org/W2076566235","https://openalex.org/W2101004723","https://openalex.org/W2144216554","https://openalex.org/W2165299997","https://openalex.org/W2239008325","https://openalex.org/W2289098659","https://openalex.org/W2469737602","https://openalex.org/W2760532619","https://openalex.org/W2951768070","https://openalex.org/W2957282149","https://openalex.org/W2966844378","https://openalex.org/W3019516388","https://openalex.org/W3043637203","https://openalex.org/W4226432265"],"related_works":["https://openalex.org/W2739351926","https://openalex.org/W2054018984","https://openalex.org/W2542593952","https://openalex.org/W2747582581","https://openalex.org/W1980428113","https://openalex.org/W3116897448","https://openalex.org/W1543240300","https://openalex.org/W2565946164","https://openalex.org/W4307567705","https://openalex.org/W2311845547"],"abstract_inverted_index":{"A":[0,28],"foreground":[1,35],"matrix-based":[2],"digital":[3,50],"calibration":[4,36,97,129],"technique":[5,53,130],"is":[6,32,54,131],"proposed":[7,96,128],"for":[8,153],"high-performance":[9],"Nyquist":[10],"analog-to-digital":[11],"converters":[12],"(ADCs)":[13],"to":[14,20,43,103,133],"reduce":[15],"the":[16,45,83,95,161],"performance":[17],"loss":[18],"due":[19],"transistor":[21],"limitations":[22],"and":[23,37,65,123,149],"unavoidable":[24],"converter":[25],"component":[26],"mismatches.":[27],"set":[29],"of":[30,82],"patterns":[31],"obtained":[33],"during":[34,40],"then":[38],"used":[39],"normal":[41],"operation":[42],"correct":[44],"ADC":[46,60,84,139,162],"output":[47],"using":[48],"conventional":[49],"circuitry.":[51],"This":[52],"validated":[55],"through":[56],"a":[57,66,115,135],"12-bit":[58],"SAR":[59],"running":[61],"at":[62,70,142,158],"350":[63],"MS/s":[64],"test":[67],"sinusoidal":[68],"tone":[69],"10":[71],"MHz":[72],"that":[73,140],"can":[74],"be":[75],"efficiently":[76],"generated":[77],"on-chip.":[78],"The":[79,127,168],"simulation":[80],"results":[81],"including":[85],"2%":[86],"random":[87],"capacitive":[88],"DAC":[89],"(CDAC)":[90],"array":[91],"elements":[92],"mismatch,":[93],"employing":[94],"methods":[98],"show":[99],"16.4/14.6":[100],"dB":[101,148,151,165],"signal":[102],"distortion":[104],"ratio":[105],"(SNDR)/":[106],"spurious":[107],"free":[108],"dynamic":[109],"range":[110],"(SFDR)":[111],"improvement,":[112],"respectively.":[113,167],"Besides,":[114],"significant":[116],"improvement":[117],"in":[118,172],"both":[119],"differential":[120],"non-linearity":[121,125],"(DNL)":[122],"integral":[124],"(INL).":[126],"adopted":[132],"calibrate":[134],"fabricated":[136],"13-bit":[137],"Pipeline":[138],"operates":[141],"260":[143],"MS/s,":[144],"which":[145],"achieves":[146,163],"68.23":[147],"85.82":[150],"SNDR/SFDR":[152],"low":[154],"frequencies.":[155],"When":[156],"measured":[157],"123.129":[159],"MHz,":[160],"65.9/80":[164],"SNDR/SFDR,":[166],"chip":[169],"was":[170],"manufactured":[171],"TSMC":[173],"40-nm":[174],"CMOS":[175],"process.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":5}],"updated_date":"2026-04-02T15:55:50.835912","created_date":"2025-10-10T00:00:00"}