{"id":"https://openalex.org/W4378192035","doi":"https://doi.org/10.1109/syscon53073.2023.10131138","title":"Ensemble Method For Fault Detection & Classification in Transmission Lines Using ML","display_name":"Ensemble Method For Fault Detection & Classification in Transmission Lines Using ML","publication_year":2023,"publication_date":"2023-04-17","ids":{"openalex":"https://openalex.org/W4378192035","doi":"https://doi.org/10.1109/syscon53073.2023.10131138"},"language":"en","primary_location":{"id":"doi:10.1109/syscon53073.2023.10131138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon53073.2023.10131138","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Systems Conference (SysCon)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064702911","display_name":"Muhammad Hayyan Bin Shahid","orcid":null},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"University of Ontario Institute of Technology","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Muhammad Hayyan Bin Shahid","raw_affiliation_strings":["Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada","Dept. Of Electrical, Computer, and Software Engineering, Ontario Tech University, Ontario, Canada"],"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada","institution_ids":["https://openalex.org/I39470171"]},{"raw_affiliation_string":"Dept. Of Electrical, Computer, and Software Engineering, Ontario Tech University, Ontario, Canada","institution_ids":["https://openalex.org/I39470171"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053938324","display_name":"Akramul Azim","orcid":"https://orcid.org/0000-0002-6292-6939"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"University of Ontario Institute of Technology","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Akramul Azim","raw_affiliation_strings":["Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada","Dept. Of Electrical, Computer, and Software Engineering, Ontario Tech University, Ontario, Canada"],"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada","institution_ids":["https://openalex.org/I39470171"]},{"raw_affiliation_string":"Dept. Of Electrical, Computer, and Software Engineering, Ontario Tech University, Ontario, Canada","institution_ids":["https://openalex.org/I39470171"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5064702911"],"corresponding_institution_ids":["https://openalex.org/I39470171"],"apc_list":null,"apc_paid":null,"fwci":1.0811,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76631947,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9610999822616577,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7365061044692993},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.7080008387565613},{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.6310669183731079},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5948172211647034},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.591232180595398},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5709725022315979},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5601664185523987},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5600827932357788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5420007705688477},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5206915140151978},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4738093912601471},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4733999967575073},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4056828022003174},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3958859145641327},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28729718923568726},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2712228298187256},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11918476223945618},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10432273149490356},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08523082733154297},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.05899542570114136}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7365061044692993},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.7080008387565613},{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.6310669183731079},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5948172211647034},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.591232180595398},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5709725022315979},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5601664185523987},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5600827932357788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5420007705688477},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5206915140151978},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4738093912601471},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4733999967575073},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4056828022003174},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3958859145641327},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28729718923568726},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2712228298187256},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11918476223945618},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10432273149490356},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08523082733154297},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.05899542570114136},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/syscon53073.2023.10131138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon53073.2023.10131138","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Systems Conference (SysCon)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1845384547","https://openalex.org/W1996093480","https://openalex.org/W2024496749","https://openalex.org/W2039629833","https://openalex.org/W2040160862","https://openalex.org/W2058307714","https://openalex.org/W2133047736","https://openalex.org/W2163463221","https://openalex.org/W2174290408","https://openalex.org/W2312446965","https://openalex.org/W2337881469","https://openalex.org/W2536593812","https://openalex.org/W2775009151","https://openalex.org/W2898402467","https://openalex.org/W2930650313","https://openalex.org/W3147446521","https://openalex.org/W3199777019","https://openalex.org/W4232348976","https://openalex.org/W6656553989","https://openalex.org/W6801713919"],"related_works":["https://openalex.org/W3148663848","https://openalex.org/W3186790058","https://openalex.org/W2024194466","https://openalex.org/W2051500795","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W1974225921","https://openalex.org/W2390533148","https://openalex.org/W2386936363"],"abstract_inverted_index":{"Faults":[0],"in":[1,23,31,38,78,144,177],"a":[2,36,69,74],"transmission":[3,80,146,179],"line":[4,102,107,110],"(TL)":[5],"are":[6,20],"the":[7,53,55,79,95,99,126,130,137,142,145,166,169,178],"most":[8],"common":[9],"faults":[10,19,143,176],"faced":[11],"by":[12],"almost":[13],"every":[14],"power":[15,41],"station.":[16],"Suppose":[17],"these":[18],"not":[21],"detected":[22,77],"time.":[24],"In":[25,49],"that":[26,125],"case,":[27],"they":[28],"can":[29],"result":[30],"multiple":[32,154],"losses,":[33],"such":[34],"as":[35,86,88],"loss":[37],"an":[39,59],"estimated":[40],"generation":[42],"w.r.t":[43],"predicted":[44],"time":[45],"and":[46,119,140,152,183,190,192,195],"financial":[47],"losses.":[48],"order":[50],"to":[51,64,157],"investigate":[52],"fault,":[54,103,105,108,111,113,116,118],"systematic":[56],"approach":[57],"of":[58],"engineer":[60],"would":[61,93],"be":[62,84],"first":[63],"detect":[65,139],"whether":[66],"there":[67],"is":[68,76],"fault":[70,75,100,185],"or":[71],"not.":[72],"If":[73],"line,":[81],"it":[82],"should":[83],"classified":[85],"soon":[87],"possible.":[89],"The":[90,148,161],"following":[91],"classifications":[92],"help":[94,136,165],"maintenance":[96],"team":[97],"identify":[98],"type:":[101],"line-to-line":[104],"double":[106,114],"triple":[109],"single-line-to-ground":[112],"line-to-ground":[115],"three-phase":[117],"no":[120],"fault.":[121],"This":[122],"paper":[123],"proposes":[124],"ensemble":[127],"method,":[128],"using":[129],"Machine":[131],"Learning":[132],"(ML)":[133],"technique,":[134],"will":[135,164,187],"engineers":[138],"classify":[141],"line.":[147,180],"investigation":[149],"also":[150],"trained":[151],"tested":[153],"ML":[155,172],"classifiers":[156],"inform":[158],"better":[159],"recommendations.":[160],"shared":[162],"research":[163],"user":[167],"find":[168],"best":[170],"possible":[171],"results":[173],"for":[174],"predicting":[175],"Hence":[181],"early":[182],"accurate":[184],"detection":[186],"enhance":[188],"safety":[189],"reliability":[191],"reduce":[193],"interruption":[194],"downtime.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}