{"id":"https://openalex.org/W3041678444","doi":"https://doi.org/10.1109/meco49872.2020.9134279","title":"Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects","display_name":"Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3041678444","doi":"https://doi.org/10.1109/meco49872.2020.9134279","mag":"3041678444"},"language":"en","primary_location":{"id":"doi:10.1109/meco49872.2020.9134279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco49872.2020.9134279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 9th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2104.01908","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036496605","display_name":"Aneesh Balakrishnan","orcid":"https://orcid.org/0000-0002-0944-7867"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"Aneesh Balakrishnan","raw_affiliation_strings":["Department of Computer Systems, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Systems, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082174246","display_name":"Thomas Lange","orcid":"https://orcid.org/0000-0002-5002-3679"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Thomas Lange","raw_affiliation_strings":["Dipartimento di Informatica e Automatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica e Automatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049671972","display_name":"Maximilien Glorieux","orcid":"https://orcid.org/0000-0002-6731-0455"},"institutions":[{"id":"https://openalex.org/I4210094065","display_name":"Amplitude Technologies (France)","ror":"https://ror.org/00m4kzh57","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210094065"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Maximilien Glorieux","raw_affiliation_strings":["iRoC Technologies, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"iRoC Technologies, Grenoble, France","institution_ids":["https://openalex.org/I4210094065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010087541","display_name":"Dan Alexandrescu","orcid":"https://orcid.org/0000-0002-8294-7534"},"institutions":[{"id":"https://openalex.org/I4210094065","display_name":"Amplitude Technologies (France)","ror":"https://ror.org/00m4kzh57","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210094065"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Dan Alexandrescu","raw_affiliation_strings":["iRoC Technologies, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"iRoC Technologies, Grenoble, France","institution_ids":["https://openalex.org/I4210094065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Department of Computer Systems, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Systems, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5036496605"],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.9353,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.7472702,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8183960318565369},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.7617881298065186},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7286636233329773},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6267704367637634},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.5529374480247498},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4859734773635864},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4295915365219116},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39023005962371826},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3492095470428467},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3206046223640442},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2738878130912781},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2589374780654907},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.19375434517860413},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16359740495681763}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8183960318565369},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.7617881298065186},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7286636233329773},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6267704367637634},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.5529374480247498},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4859734773635864},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4295915365219116},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39023005962371826},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3492095470428467},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3206046223640442},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2738878130912781},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2589374780654907},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.19375434517860413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16359740495681763},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/meco49872.2020.9134279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco49872.2020.9134279","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 9th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2104.01908","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2104.01908","pdf_url":"https://arxiv.org/pdf/2104.01908","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2104.01908","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2104.01908","pdf_url":"https://arxiv.org/pdf/2104.01908","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W1992531681","https://openalex.org/W2046716673","https://openalex.org/W2070655964","https://openalex.org/W2099569658","https://openalex.org/W2962756421","https://openalex.org/W2962767366","https://openalex.org/W2964015378","https://openalex.org/W2968345245","https://openalex.org/W2990393443","https://openalex.org/W3149410719","https://openalex.org/W4294558607","https://openalex.org/W4297571622","https://openalex.org/W6726873649","https://openalex.org/W6738964360"],"related_works":["https://openalex.org/W1506159315","https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W2297417762","https://openalex.org/W1530804449","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297"],"abstract_inverted_index":{"Rapidly":[0],"shrinking":[1],"technology":[2],"node":[3],"and":[4,54,72,84,114,142],"voltage":[5],"scaling":[6],"increase":[7],"the":[8,22,63,87,97,126,161,188,198,203],"susceptibility":[9],"of":[10,36,57,89,99,130,160,193,202],"Soft":[11,16],"Errors":[12,17],"in":[13,96,136],"digital":[14],"circuits.":[15],"are":[18],"radiation-induced":[19],"effects":[20,61,135],"while":[21],"radiation":[23],"particles":[24],"such":[25],"as":[26,70],"Alpha,":[27],"Neutrons":[28],"or":[29,47,174],"Heavy":[30],"Ions,":[31],"interact":[32],"with":[33],"sensitive":[34],"regions":[35],"microelectronic":[37],"devices/circuits.":[38],"The":[39,123],"particle":[40],"hit":[41],"could":[42],"be":[43],"a":[44,48,105,137,165,170],"glancing":[45],"blow":[46],"penetrating":[49],"strike.":[50],"A":[51,140],"well":[52],"apprehended":[53],"characterized":[55],"way":[56],"analyzing":[58],"soft":[59,133],"error":[60,134],"is":[62],"fault-injection":[64],"campaign,":[65],"but":[66],"that":[67,108],"typically":[68],"acknowledged":[69],"time":[71],"resource-consuming":[73],"simulation":[74],"strategy.":[75],"As":[76],"an":[77],"alternative":[78],"to":[79,85,112,168],"traditional":[80],"fault":[81,181,190,196],"injection-based":[82],"methodologies":[83],"explore":[86],"applicability":[88],"modern":[90],"graph":[91],"based":[92],"neural":[93],"network":[94],"algorithms":[95],"field":[98],"reliability":[100],"modeling,":[101],"this":[102],"paper":[103],"proposes":[104],"systematic":[106],"framework":[107,124],"explores":[109],"gate-level":[110,162,199],"abstractions":[111],"extract":[113],"exploit":[115],"relevant":[116],"feature":[117],"representations":[118],"at":[119,179],"low-dimensional":[120],"vector":[121],"space.":[122],"allows":[125],"extensive":[127],"prediction":[128],"analysis":[129],"SEU":[131,194],"type":[132,144,195],"given":[138],"circuit.":[139,210],"scalable":[141],"inductive":[143],"representation":[145],"learning":[146,173,176],"algorithm":[147,177],"on":[148],"graphs":[149],"called":[150],"GraphSAGE":[151],"has":[152],"been":[153],"utilized":[154],"for":[155],"efficiently":[156],"extracting":[157],"structural":[158],"features":[159],"netlist,":[163],"providing":[164],"valuable":[166],"database":[167],"exercise":[169],"downstream":[171],"machine":[172],"deep":[175],"aiming":[178],"predicting":[180],"propagation":[182],"metrics.":[183],"Functional":[184],"Failure":[185],"Rate":[186],"(FFR):":[187],"predicted":[189],"propagating":[191],"metric":[192],"within":[197],"circuit":[200],"abstraction":[201],"10-Gigabit":[204],"Ethernet":[205],"MAC":[206],"(IEEE":[207],"802.3)":[208],"standard":[209]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3}],"updated_date":"2026-04-02T13:48:15.688549","created_date":"2020-07-16T00:00:00"}