{"id":"https://openalex.org/W3037085797","doi":"https://doi.org/10.1109/mdat.2020.2989094","title":"Guest Editors\u2019 Introduction: SBCCI 2018","display_name":"Guest Editors\u2019 Introduction: SBCCI 2018","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3037085797","doi":"https://doi.org/10.1109/mdat.2020.2989094","mag":"3037085797"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2020.2989094","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.2989094","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123813.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123813.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108437484","display_name":"Michael H\u00fcbner","orcid":"https://orcid.org/0000-0002-1790-3869"},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Hubner","raw_affiliation_strings":["Brandenburg University of Technology, Cottbus, Germany"],"raw_orcid":"https://orcid.org/0000-0002-1790-3869","affiliations":[{"raw_affiliation_string":"Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045089951","display_name":"Jos\u00e9 Lu\u00eds G\u00fcntzel","orcid":"https://orcid.org/0000-0002-7712-869X"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jose Luis Guntzel","raw_affiliation_strings":["Federal University of Santa Catarina"],"raw_orcid":"https://orcid.org/0000-0002-7712-869X","affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina","institution_ids":["https://openalex.org/I4104125"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":"3","first_page":"5","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.5060999989509583,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.5060999989509583,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.44110000133514404,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/library-science","display_name":"Library science","score":0.5163697004318237},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43732428550720215}],"concepts":[{"id":"https://openalex.org/C161191863","wikidata":"https://www.wikidata.org/wiki/Q199655","display_name":"Library science","level":1,"score":0.5163697004318237},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43732428550720215}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2020.2989094","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.2989094","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123813.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mdat.2020.2989094","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2020.2989094","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/9123747/09123813.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.47999998927116394,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3037085797.pdf","grobid_xml":"https://content.openalex.org/works/W3037085797.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655","https://openalex.org/W2359140296"],"abstract_inverted_index":{"In":[0],"this":[1],"specialissue,":[2],"the":[3,26,30],"combination":[4],"of":[5,29],"image":[6],"processing":[7],"and":[8,12,36],"corresponding":[9],"hardware":[10],"architectures":[11],"EDA":[13],"tools":[14],"was":[15,40],"presented":[16],"in":[17,42],"six":[18],"manuscripts.":[19],"The":[20],"articles":[21,28],"have":[22],"been":[23],"selected":[24],"as":[25],"best":[27],"31st":[31],"Symposium":[32],"on":[33,50],"Integrated":[34],"Circuits":[35],"Systems":[37],"Design":[38],"which":[39],"held":[41],"Bento":[43],"Gon\u00e7alves,":[44],"Rio":[45],"Grande":[46],"do":[47],"Sul,":[48],"Brazil,":[49],"August":[51],"27\u201331,":[52],"2018.":[53]},"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}